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Nanoscale Res Lett. 2012 Feb 14;7(1):121. doi: 10.1186/1556-276X-7-121.

Scan speed control for tapping mode SPM.

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Faculty of Automation and Electronics of the National Nuclear Research University (MEPhI), Moscow, 115409, Russia.


In order to increase the imaging speed of a scanning probe microscope in tapping mode, we propose to use a dynamic controller on 'parachuting' regions. Furthermore, we propose to use variable scan speed on 'upward step' regions, with the speed determined by the error signal of the closed-loop control. We offer line traces obtained on a calibration grating with 25-nm step height, using both standard scanning and our scanning method, as experimental evidence.

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