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Items: 3

1.

Microscopic study of electrical properties of CrSi2 nanocrystals in silicon.

Dózsa L, Lányi S, Raineri V, Giannazzo F, Galkin NG.

Nanoscale Res Lett. 2011 Mar 9;6(1):209. doi: 10.1186/1556-276X-6-209.

2.

Scanning tip measurement for identification of point defects.

Dózsa L, Molnár G, Raineri V, Giannazzo F, Ferencz J, Lányi S.

Nanoscale Res Lett. 2011 Feb 14;6(1):140. doi: 10.1186/1556-276X-6-140.

3.

Advanced materials nanocharacterization.

Giannazzo F, Eyben P, Baranowski J, Camassel J, Lányi S.

Nanoscale Res Lett. 2011 Jan 31;6(1):107. doi: 10.1186/1556-276X-6-107.

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