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Nanoscale Res Lett. 2013 Jun 7;8(1):275. doi: 10.1186/1556-276X-8-275.

Absolute flatness measurements of silicon mirrors by a three-intersection method by near-infrared interferometry.

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1
Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan. morita@prec.eng.osaka-u.ac.jp.

Abstract

Absolute flatness of three silicon plane mirrors have been measured by a three-intersection method based on the three-flat method using a near-infrared interferometer. The interferometer was constructed using a near-infrared laser diode with a 1,310-nm wavelength light where the silicon plane mirror is transparent. The height differences at the coordinate values between the absolute line profiles by the three-intersection method have been evaluated. The height differences of the three flats were 4.5 nm or less. The three-intersection method using the near-infrared interferometer was useful for measuring the absolute flatness of the silicon plane mirrors.

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