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Links from PubMed

Items: 3

1.

Laser damage study of nodules in electron-beam-evaporated HfO2/SiO2 high reflectors.

Cheng X, Shen Z, Jiao H, Zhang J, Ma B, Ding T, Lu J, Wang X, Wang Z.

Appl Opt. 2011 Mar 20;50(9):C357-63. doi: 10.1364/AO.50.00C357.

PMID:
21460963
2.

Cross-sectional sample preparation by focused ion beam: a review of ion-sample interaction.

Ishitani T, Yaguchi T.

Microsc Res Tech. 1996 Nov 1;35(4):320-33. Review.

PMID:
8987026
3.

Reducing focused ion beam damage to transmission electron microscopy samples.

Kato NI.

J Electron Microsc (Tokyo). 2004;53(5):451-8. Review.

PMID:
15582946

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