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Opt Express. 2009 Nov 9;17(23):20735-46. doi: 10.1364/OE.17.020735.

A generalized reference-plane-based calibration method in optical triangular profilometry.

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Institute of Optoelectronics Science and Engineering, Huazhong University of Science and Technology, 1037 Luoyu Road, Wuhan, 430074, China.


In this paper, a generalized reference-plane-based calibration method is proposed in optical triangular profilometry by exploring projection ray tracing method and image ray tracing method. The pin-hole camera model is used to model the camera and the projector, and parallel planes model is used to model the reference and test planes. The camera, projector, and planes can be in arbitrary positions and arbitrary directions. The reciprocal of the height and the reciprocal of the phase shift (or pixel position vertical distance) are in linear relationship. Experiments are conducted to verify the proposed method.

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