Format

Send to

Choose Destination

Links from PubMed

See comment in PubMed Commons below
Appl Opt. 2008 Dec 1;47(34):6334-9.

Nanodisplacement measurement using spectral shifts in a white-light interferometer.

Author information

1
School of Physics, University of Hyderabad, Hyderabad 500046, India.

Abstract

We report a novel experimental method to measure nanometer displacements using wavelength shifts of spectral peaks around spectral switch or singular phase points in the interference spectra due to temporal correlation in a Michelson interferometer illuminated by a broadband white-light source. Dramatic changes in the spectral characteristics are recorded as a function of path difference between the interfering beams around the spectral switch position. These are then compared with measurements far from it in order to demonstrate the higher sensitivities involved in the proposed method.

PMID:
19037359
PubMed Commons home

PubMed Commons

0 comments

    Supplemental Content

    Full text links

    Icon for Optical Society of America
    Loading ...
    Support Center