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Items: 1 to 20 of 96

1.

Investigation of tunneling current and local contact potential difference on the TiO2(110) surface by AFM/KPFM at 78 K.

Wen HF, Li YJ, Arima E, Naitoh Y, Sugawara Y, Xu R, Cheng ZH.

Nanotechnology. 2017 Mar 10;28(10):105704. doi: 10.1088/1361-6528/aa5aef. Epub 2017 Feb 6.

PMID:
28164861
2.

Investigation of the surface potential of TiO2 (110) by frequency-modulation Kelvin probe force microscopy.

Kou L, Li YJ, Kamijyo T, Naitoh Y, Sugawara Y.

Nanotechnology. 2016 Dec 16;27(50):505704. Epub 2016 Nov 18.

PMID:
27861162
3.

KPFM/AFM imaging on TiO2(110) surface in O2 gas.

Arima E, Wen HF, Naitoh Y, Li YJ, Sugawara Y.

Nanotechnology. 2018 Mar 9;29(10):105504. doi: 10.1088/1361-6528/aaa62c.

PMID:
29313525
4.

New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors.

Sadewasser S, Jelinek P, Fang CK, Custance O, Yamada Y, Sugimoto Y, Abe M, Morita S.

Phys Rev Lett. 2009 Dec 31;103(26):266103. Epub 2009 Dec 28.

PMID:
20366324
5.

Measurement and Manipulation of the Charge State of an Adsorbed Oxygen Adatom on the Rutile TiO2(110)-1×1 Surface by nc-AFM and KPFM.

Zhang Q, Li YJ, Wen HF, Adachi Y, Miyazaki M, Sugawara Y, Xu R, Cheng ZH, Brndiar J, Kantorovich L, Štich I.

J Am Chem Soc. 2018 Nov 21;140(46):15668-15674. doi: 10.1021/jacs.8b07745. Epub 2018 Nov 7.

PMID:
30403344
6.

The local electronic properties of individual Pt atoms adsorbed on TiO2(110) studied by Kelvin probe force microscopy and first-principles simulations.

Yurtsever A, Fernández-Torre D, Onoda J, Abe M, Morita S, Sugimoto Y, Pérez R.

Nanoscale. 2017 May 11;9(18):5812-5821. doi: 10.1039/c6nr07550a.

PMID:
28225121
7.

Noncontact Atomic Force Microscopy: An Emerging Tool for Fundamental Catalysis Research.

Altman EI, Baykara MZ, Schwarz UD.

Acc Chem Res. 2015 Sep 15;48(9):2640-8. doi: 10.1021/acs.accounts.5b00166. Epub 2015 Aug 24.

PMID:
26301490
9.

Probe microscope observation of platinum atoms deposited on the TiO2(110)-(1 x 1) surface.

Sasahara A, Pang CL, Onishi H.

J Phys Chem B. 2006 Jul 13;110(27):13453-7.

PMID:
16821870
10.

The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modes.

Ma ZM, Kou L, Naitoh Y, Li YJ, Sugawara Y.

Nanotechnology. 2013 Jun 7;24(22):225701. doi: 10.1088/0957-4484/24/22/225701. Epub 2013 Apr 30.

PMID:
23633495
11.

Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite.

Hembacher S, Giessibl FJ, Mannhart J, Quate CF.

Phys Rev Lett. 2005 Feb 11;94(5):056101. Epub 2005 Feb 9.

PMID:
15783662
12.

Orbital Selectivity in Scanning Tunneling Microscopy: Distance-Dependent Tunneling Process Observed in Iron Nitride.

Takahashi Y, Miyamachi T, Ienaga K, Kawamura N, Ernst A, Komori F.

Phys Rev Lett. 2016 Feb 5;116(5):056802. doi: 10.1103/PhysRevLett.116.056802. Epub 2016 Feb 5.

PMID:
26894727
13.

Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications.

Morawski I, Spiegelberg R, Korte S, Voigtländer B.

Rev Sci Instrum. 2015 Dec;86(12):123703. doi: 10.1063/1.4936975.

PMID:
26724038
14.

Atomic-scale geometry and electronic structure of catalytically important pd/au alloys.

Baber AE, Tierney HL, Sykes EC.

ACS Nano. 2010 Mar 23;4(3):1637-45. doi: 10.1021/nn901390y.

PMID:
20146438
15.

High-Resolution Kelvin Probe Force Microscopy Imaging of Interface Dipoles and Photogenerated Charges in Organic Donor-Acceptor Photovoltaic Blends.

Fuchs F, Caffy F, Demadrille R, Mélin T, Grévin B.

ACS Nano. 2016 Jan 26;10(1):739-46. doi: 10.1021/acsnano.5b05810. Epub 2016 Jan 13.

PMID:
26750993
16.

Contrast formation in Kelvin probe force microscopy of single π-conjugated molecules.

Schuler B, Liu SX, Geng Y, Decurtins S, Meyer G, Gross L.

Nano Lett. 2014 Jun 11;14(6):3342-6. doi: 10.1021/nl500805x. Epub 2014 May 28.

PMID:
24849457
17.

NC-AFM imaging of the TiO(2)(110)-(1 x 1) surface at low temperature.

Yurtsever A, Sugimoto Y, Abe M, Morita S.

Nanotechnology. 2010 Apr 23;21(16):165702. doi: 10.1088/0957-4484/21/16/165702. Epub 2010 Mar 26.

PMID:
20348596
18.

Characterization of individual molecular adsorption geometries by atomic force microscopy: Cu-TCPP on rutile TiO2 (110).

Jöhr R, Hinaut A, Pawlak R, Sadeghi A, Saha S, Goedecker S, Such B, Szymonski M, Meyer E, Glatzel T.

J Chem Phys. 2015 Sep 7;143(9):094202. doi: 10.1063/1.4929608.

PMID:
26342363
19.

On the relevance of the atomic-scale contact potential difference by amplitude-modulation and frequency-modulation Kelvin probe force microscopy.

Nony L, Bocquet F, Loppacher C, Glatzel T.

Nanotechnology. 2009 Jul 1;20(26):264014. doi: 10.1088/0957-4484/20/26/264014. Epub 2009 Jun 10.

PMID:
19509441
20.

'All-inclusive' imaging of the rutile TiO(2)(110) surface using NC-AFM.

Bechstein R, González C, Schütte J, Jelínek P, Pérez R, Kühnle A.

Nanotechnology. 2009 Dec 16;20(50):505703. doi: 10.1088/0957-4484/20/50/505703. Epub 2009 Nov 19.

PMID:
19923656

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