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Items: 1 to 20 of 76

1.

High-energy x-ray diffractometer for nondestructive strain depth profile measurement.

Al-Shorman MY, Jensen TC, Gray JN.

Rev Sci Instrum. 2013 Dec;84(12):123902. doi: 10.1063/1.4841895.

PMID:
24387441
2.

Depth-resolved strain measurements in polycrystalline materials by energy-variable X-ray diffraction.

Zolotoyabko E, Pokroy B, Quintana JP.

J Synchrotron Radiat. 2004 Jul 1;11(Pt 4):309-13.

PMID:
15211036
3.

A new nondestructive instrument for bulk residual stress measurement using tungsten kα1 X-ray.

Ma C, Dou ZY, Chen L, Li Y, Tan X, Dong P, Zhang J, Zheng L, Zhang PC.

Rev Sci Instrum. 2016 Nov;87(11):115101.

PMID:
27910403
4.
5.

Compact pnCCD-based X-ray camera with high spatial and energy resolution: a color X-ray camera.

Scharf O, Ihle S, Ordavo I, Arkadiev V, Bjeoumikhov A, Bjeoumikhova S, Buzanich G, Gubzhokov R, Günther A, Hartmann R, Kühbacher M, Lang M, Langhoff N, Liebel A, Radtke M, Reinholz U, Riesemeier H, Soltau H, Strüder L, Thünemann AF, Wedell R.

Anal Chem. 2011 Apr 1;83(7):2532-8. doi: 10.1021/ac102811p.

PMID:
21355541
6.

High resolution grazing-incidence in-plane x-ray diffraction for measuring the strain of a Si thin layer.

Omote K.

J Phys Condens Matter. 2010 Dec 1;22(47):474004. doi: 10.1088/0953-8984/22/47/474004.

PMID:
21386611
7.

X-ray diffractometer designed for industrial applications at SPring-8 BL24XU.

Yanase E, Zolotarev KV, Nishio K, Kusumi Y, Okado H, Arai K.

J Synchrotron Radiat. 2002 Sep 1;9(Pt 5):309-12.

PMID:
12200575
8.

A laboratory based system for laue micro x-ray diffraction.

Lynch PA, Stevenson AW, Liang D, Parry D, Wilkins S, Tamura N.

Rev Sci Instrum. 2007 Feb;78(2):023904.

PMID:
17578120
9.

Nondestructive elemental depth-profiling analysis by muonic X-ray measurement.

Ninomiya K, Kubo MK, Nagatomo T, Higemoto W, Ito TU, Kawamura N, Strasser P, Shimomura K, Miyake Y, Suzuki T, Kobayashi Y, Sakamoto S, Shinohara A, Saito T.

Anal Chem. 2015 May 5;87(9):4597-600. doi: 10.1021/acs.analchem.5b01169.

PMID:
25901421
10.

New high- and low-temperature apparatus for synchrotron polycrystalline X-ray diffraction.

Tang CC, Bushnell-Wye G, Cernik RJ.

J Synchrotron Radiat. 1998 May 1;5(Pt 3):929-31.

PMID:
15263700
11.

Strain measurement of pure titanium covered with soft tissue using X-ray diffraction.

Fujisaki K, Tadano S.

J Biomech Eng. 2010 Mar;132(3):031004. doi: 10.1115/1.4000935.

PMID:
20459192
12.

Direct measurement and modelling of internal strains in ion-implanted diamond.

Bosia F, Argiolas N, Bazzan M, Fairchild BA, Greentree AD, Lau DW, Olivero P, Picollo F, Rubanov S, Prawer S.

J Phys Condens Matter. 2013 Sep 25;25(38):385403. doi: 10.1088/0953-8984/25/38/385403.

PMID:
23988841
13.

Laser wakefield generated X-ray probe for femtosecond time-resolved measurements of ionization states of warm dense aluminum.

Mo MZ, Chen Z, Fourmaux S, Saraf A, Otani K, Kieffer JC, Tsui YY, Ng A, Fedosejevs R.

Rev Sci Instrum. 2013 Dec;84(12):123106. doi: 10.1063/1.4842237.

PMID:
24387419
14.
15.

Using measured 30-150 kVp polychromatic tungsten x-ray spectra to determine ion chamber calibration factors, Nx (Gy C(-1)).

Mercier JR, Kopp DT, McDavid WD, Dove SB, Lancaster JL, Tucker DM.

Health Phys. 2000 Oct;79(4):402-6.

PMID:
11007462
16.

Advantages of intermediate X-ray energies in Zernike phase contrast X-ray microscopy.

Wang Z, Gao K, Chen J, Hong Y, Ge X, Wang D, Pan Z, Zhu P, Yun W, Jacobsen C, Wu Z.

Biotechnol Adv. 2013 May-Jun;31(3):387-92. doi: 10.1016/j.biotechadv.2012.04.001.

PMID:
22521962
18.

A Seeman-Bohlin geometry for high-resolution nanosecond x-ray diffraction measurements from shocked polycrystalline and amorphous materials.

Milathianaki D, Hawreliak J, McNaney JM, El-Dasher BS, Saculla MD, Swift DC, Lorenzana HE, Ditmire T.

Rev Sci Instrum. 2009 Sep;80(9):093904. doi: 10.1063/1.3230647.

PMID:
19791950
19.

Measurements of absolute energy spectra for an industrial micro focal X-ray source under working conditions using a Compton scattering spectrometer.

Hammersberg P, Stenström M, Hedtjärn H, Mångård M.

J Xray Sci Technol. 1998 Jan 1;8(1):5-18.

PMID:
22388423

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