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Items: 1 to 20 of 107

1.

Ellipsometry with polarisation analysis at cryogenic temperatures inside a vacuum chamber.

Bauer S, Grees B, Spitzer D, Beck M, Bottesch R, Ortjohann HW, Ostrick B, Schäfer T, Telle HH, Wegmann A, Zbořil M, Weinheimer C.

Rev Sci Instrum. 2013 Dec;84(12):123103. doi: 10.1063/1.4838555.

PMID:
24387416
2.
3.

Automatic null ellipsometry with an interferometer.

Watkins LR.

Appl Opt. 2009 Nov 10;48(32):6277-80. doi: 10.1364/AO.48.006277.

PMID:
19904328
4.

Optimizing null ellipsometry for oxidized silicon.

Bu-Abbud GH, Bashara NM.

Appl Opt. 1981 Aug 15;20(16):2815-8. doi: 10.1364/AO.20.002815.

PMID:
20333046
5.

Optimization of off-null ellipsometry for air/solid interfaces.

Chen Y, Meng Y, Jin G.

Appl Opt. 2007 Dec 10;46(35):8475-81.

PMID:
18071378
6.

Spectroscopic null ellipsometer using a variable retarder.

Watkins LR, Shamailov SS.

Appl Opt. 2011 Jan 1;50(1):50-2. doi: 10.1364/AO.50.000050.

PMID:
21221159
7.
8.

Determining thickness of films on a curved substrate by use of ellipsometric measurements.

Han CY, Lee ZY, Chao YF.

Appl Opt. 2009 Jun 10;48(17):3139-43.

PMID:
19516348
9.

Measurement of thermal properties of thin films up to high temperatures--pulsed photothermal radiometry system and Si-B-C-N films.

Martan J, Čapek J, Chalhoub EA.

Rev Sci Instrum. 2010 Dec;81(12):124902. doi: 10.1063/1.3506638.

PMID:
21198042
10.

Ellipsometric and neutron diffraction study of pentane physisorbed on graphite.

Kruchten F, Knorr K, Volkmann UG, Taub H, Hansen FY, Matthies B, Herwig KW.

Langmuir. 2005 Aug 2;21(16):7507-12.

PMID:
16042486
11.
13.

The properties of free polymer surfaces and their influence on the glass transition temperature of thin polystyrene films.

Sharp JS, Teichroeb JH, Forrest JA.

Eur Phys J E Soft Matter. 2004 Dec;15(4):473-87. Epub 2004 Dec 15.

PMID:
15599788
14.

Method for azimuthal alignment in fixed-angle ellipsometry.

Stagg BJ, Charalampopoulos TT.

Appl Opt. 1992 Feb 1;31(4):479-84. doi: 10.1364/AO.31.000479.

PMID:
20720639
15.
16.

Vacuum ellipsometry as a method for probing glass transition in thin polymer films.

Efremov MY, Soofi SS, Kiyanova AV, Munoz CJ, Burgardt P, Cerrina F, Nealey PF.

Rev Sci Instrum. 2008 Apr;79(4):043903. doi: 10.1063/1.2901601.

PMID:
18447531
17.

Production of extended single-layer graphene.

Xu M, Fujita D, Sagisaka K, Watanabe E, Hanagata N.

ACS Nano. 2011 Feb 22;5(2):1522-8. doi: 10.1021/nn103428k. Epub 2011 Jan 12.

PMID:
21226512
18.

Development of a new laser heating system for thin film growth by chemical vapor deposition.

Fujimoto E, Sumiya M, Ohnishi T, Lippmaa M, Takeguchi M, Koinuma H, Matsumoto Y.

Rev Sci Instrum. 2012 Sep;83(9):094701.

PMID:
23020398
19.

Dynamic ellipsometry study on curved thin films at pendent droplet surfaces.

Zhang Y.

Rev Sci Instrum. 2010 Aug;81(8):085101. doi: 10.1063/1.3465314.

PMID:
20815622
20.

Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer.

Chen LY, Feng XW, Su Y, Ma HZ, Qian YH.

Appl Opt. 1994 Mar 1;33(7):1299-305. doi: 10.1364/AO.33.001299.

PMID:
20862155

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