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Items: 1 to 20 of 130

1.

Low-voltage and high-performance buzzer-scanner based streamlined atomic force microscope system.

Wang WM, Huang KY, Huang HF, Hwang IS, Hwu ET.

Nanotechnology. 2013 Nov 15;24(45):455503. doi: 10.1088/0957-4484/24/45/455503. Epub 2013 Oct 18.

PMID:
24141269
2.

Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopy.

Han C, Chung CC.

Rev Sci Instrum. 2011 May;82(5):053709. doi: 10.1063/1.3590778.

PMID:
21639509
3.

Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscope.

Zhao J, Gong W, Cai W, Shang G.

Rev Sci Instrum. 2013 Aug;84(8):083706. doi: 10.1063/1.4818976.

PMID:
24007072
4.

Note: Design and development of an integrated three-dimensional scanner for atomic force microscopy.

Rashmi T, Dharsana G, Sriramshankar R, Sri Muthu Mrinalini R, Jayanth GR.

Rev Sci Instrum. 2013 Nov;84(11):116102. doi: 10.1063/1.4829715.

PMID:
24289443
5.

Cantilevered bimorph-based scanner for high speed atomic force microscopy with large scanning range.

Zhou Y, Shang G, Cai W, Yao JE.

Rev Sci Instrum. 2010 May;81(5):053708. doi: 10.1063/1.3428731.

PMID:
20515146
6.

High-speed atomic force microscope based on an astigmatic detection system.

Liao HS, Chen YH, Ding RF, Huang HF, Wang WM, Hwu ET, Huang KY, Chang CS, Hwang IS.

Rev Sci Instrum. 2014 Oct;85(10):103710. doi: 10.1063/1.4898019.

PMID:
25362406
7.

Anti-drift and auto-alignment mechanism for an astigmatic atomic force microscope system based on a digital versatile disk optical head.

Hwu ET, Illers H, Wang WM, Hwang IS, Jusko L, Danzebrink HU.

Rev Sci Instrum. 2012 Jan;83(1):013703. doi: 10.1063/1.3673001.

PMID:
22299958
8.

Design and control of multi-actuated atomic force microscope for large-range and high-speed imaging.

Soltani Bozchalooi I, Careaga Houck A, AlGhamdi JM, Youcef-Toumi K.

Ultramicroscopy. 2016 Jan;160:213-224. doi: 10.1016/j.ultramic.2015.10.016. Epub 2015 Oct 28.

PMID:
26547505
9.

Active Damping of a Piezoelectric Tube Scanner using Self-Sensing Piezo Actuation.

Kuiper S, Schitter G.

Mechatronics (Oxf). 2010 Sep;20(6):656-665.

10.

Atomic force microscopy with a 12-electrode piezoelectric tube scanner.

Yong YK, Ahmed B, Moheimani SO.

Rev Sci Instrum. 2010 Mar;81(3):033701. doi: 10.1063/1.3314901.

PMID:
20370179
11.

A control approach to cross-coupling compensation of piezotube scanners in tapping-mode atomic force microscope imaging.

Wu Y, Shi J, Su C, Zou Q.

Rev Sci Instrum. 2009 Apr;80(4):043709. doi: 10.1063/1.3124183.

PMID:
19405668
12.

Separate-type scanner and wideband high-voltage amplifier for atomic-resolution and high-speed atomic force microscopy.

Miyata K, Usho S, Yamada S, Furuya S, Yoshida K, Asakawa H, Fukuma T.

Rev Sci Instrum. 2013 Apr;84(4):043705. doi: 10.1063/1.4802262.

PMID:
23635201
13.

Real-time detection of linear and angular displacements with a modified DVD optical head.

Hwu ET, Hung SK, Yang CW, Huang KY, Hwang IS.

Nanotechnology. 2008 Mar 19;19(11):115501. doi: 10.1088/0957-4484/19/11/115501. Epub 2008 Feb 18.

PMID:
21730551
14.

A compact two-dimensional laser scanner based on piezoelectric actuators.

Wei C, Sihai C, Dong L, Guohua J.

Rev Sci Instrum. 2015 Jan;86(1):013102. doi: 10.1063/1.4904974.

PMID:
25638067
15.

An alternative flat scanner and micropositioning method for scanning probe microscope.

Cai W, Shang G, Zhou Y, Xu P, Yao J.

Rev Sci Instrum. 2010 Dec;81(12):123701. doi: 10.1063/1.3505781.

PMID:
21198026
16.

A compact vertical scanner for atomic force microscopes.

Park JH, Shim J, Lee DY.

Sensors (Basel). 2010;10(12):10673-82. doi: 10.3390/s101210673. Epub 2010 Nov 30.

17.

Components for high speed atomic force microscopy.

Fantner GE, Schitter G, Kindt JH, Ivanov T, Ivanova K, Patel R, Holten-Andersen N, Adams J, Thurner PJ, Rangelow IW, Hansma PK.

Ultramicroscopy. 2006 Jun-Jul;106(8-9):881-7. Epub 2006 Apr 27.

PMID:
16730410
18.

Improving the scanning speed of atomic force microscopy at the scanning range of several tens of micrometers.

Wang Y, Hu X, Xu L, Hu X.

Ultramicroscopy. 2013 Jan;124:102-7. doi: 10.1016/j.ultramic.2012.08.001. Epub 2012 Sep 3.

PMID:
23142751
19.

Note: A silicon-on-insulator microelectromechanical systems probe scanner for on-chip atomic force microscopy.

Fowler AG, Maroufi M, Moheimani SO.

Rev Sci Instrum. 2015 Apr;86(4):046107. doi: 10.1063/1.4918729.

PMID:
25933905
20.

Wide-area scanner for high-speed atomic force microscopy.

Watanabe H, Uchihashi T, Kobashi T, Shibata M, Nishiyama J, Yasuda R, Ando T.

Rev Sci Instrum. 2013 May;84(5):053702. doi: 10.1063/1.4803449.

PMID:
23742553

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