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Items: 1 to 20 of 143

1.
2.

Optical properties of Zitex in the infrared to submillimeter.

Benford DJ, Gaidis MC, Kooi JW.

Appl Opt. 2003 Sep 1;42(25):5118-22.

PMID:
12962390
3.
4.

Structural, optical, and dielectric properties of Bi(1.5-x)Zn(0.92-y)Nb(1.5)O(6.92-δ) thin films grown by PLD on R-plane sapphire and LaAlO3 substrates.

Le Febvrier A, Galca AC, Corredores Y, Députier S, Bouquet V, Demange V, Castel X, Sauleau R, Lefort R, Zhang LY, Tanné G, Pintilie L, Guilloux-Viry M.

ACS Appl Mater Interfaces. 2012 Oct 24;4(10):5227-33. doi: 10.1021/am301152r.

PMID:
22994246
5.
6.

Linearity and temperature dependence of large-area processed high-q barium strontium titanate thin-film varactors.

Subramanyam G, Patterson M, Leedy K, Neidhard R, Varanasi C, Zhang C, Steinhauer G.

IEEE Trans Ultrason Ferroelectr Freq Control. 2010 Jul;57(7):1692-5. doi: 10.1109/TUFFC.2010.1599.

PMID:
20639162
7.

Millimeter-wave dielectric properties of single-crystal ferroelectric and dielectric materials.

McCloy JS, Korolev KA, Li Z, Afsar MN, Sundaram SK.

IEEE Trans Ultrason Ferroelectr Freq Control. 2011 Jan;58(1):18-29. doi: 10.1109/TUFFC.2011.1770.

PMID:
21244971
8.

Gaussian-beam mode analysis of reflection and transmission in multilayer dielectrics.

Finn TJ, Trappe NA, Murphy JA.

J Opt Soc Am A Opt Image Sci Vis. 2008 Jan;25(1):80-9.

PMID:
18157214
9.

Highly conducting phosphorous doped Nc-Si:H thin films deposited at high deposition rate by hot-wire chemical vapor deposition method.

Waman VS, Kamble MM, Ghosh SS, Mayabadi A, Sathe VG, Amalnekar DP, Pathan HM, Jadkar SR.

J Nanosci Nanotechnol. 2012 Nov;12(11):8459-66.

PMID:
23421231
10.

N-type crystalline silicon films free of amorphous silicon deposited on glass by HCl addition using hot wire chemical vapour deposition.

Chung YB, Park HK, Lee SH, Song JH, Hwang NM.

J Nanosci Nanotechnol. 2011 Sep;11(9):8242-5.

PMID:
22097562
11.

Long-wave infrared tunable thin-film perfect absorber utilizing highly doped silicon-on-sapphire.

Cleary JW, Soref R, Hendrickson JR.

Opt Express. 2013 Aug 12;21(16):19363-74. doi: 10.1364/OE.21.019363.

PMID:
23938852
12.

Glass transitions and dynamics in thin polymer films: dielectric relaxation of thin films of polystyrene

Fukao K, Miyamoto Y.

Phys Rev E Stat Phys Plasmas Fluids Relat Interdiscip Topics. 2000 Feb;61(2):1743-54.

PMID:
11046459
13.

Refractive-index dispersion of phosphosilicate glass, thermal oxide, and silicon nitride films on silicon.

Lee HJ, Henry CH, Orlowsky KJ, Kazarinov RF, Kometani TY.

Appl Opt. 1988 Oct 1;27(19):4104-9. doi: 10.1364/AO.27.004104.

PMID:
20539522
14.

Influence of substrate absorption on the optical and geometrical characterization of thin dielectric films.

González-Leal JM, Prieto-Alcón R, Angel JA, Minkov DA, Márquez E.

Appl Opt. 2002 Dec 1;41(34):7300-8.

PMID:
12477122
15.

Effect of microstructure on thermal conductivity of Cu, Ag thin films.

Ryu S, Juhng W, Kim Y.

J Nanosci Nanotechnol. 2010 May;10(5):3406-11.

PMID:
20358967
16.

Effect of dielectric constant tuning on a photonic cavity frequency and Q-factor.

Shlafman M, Bayn I, Salzman J.

Opt Express. 2010 Jul 19;18(15):15907-16. doi: 10.1364/OE.18.015907.

PMID:
20720974
17.

Soft-mode hardening in SrTiO3 thin films

Sirenko AA, Bernhard C, Golnik A, Clark AM, Hao J, Si W, Xi XX.

Nature. 2000 Mar 23;404(6776):373-6.

PMID:
10746720
18.

General expressions for the coupling coefficient, quality and filling factors for a cavity with an insert using energy coupled mode theory.

Elnaggar SY, Tervo R, Mattar SM.

J Magn Reson. 2014 May;242:57-66. doi: 10.1016/j.jmr.2014.01.018.

PMID:
24607823
19.

Large-aperture wide-bandwidth antireflection-coated silicon lenses for millimeter wavelengths.

Datta R, Munson CD, Niemack MD, McMahon JJ, Britton J, Wollack EJ, Beall J, Devlin MJ, Fowler J, Gallardo P, Hubmayr J, Irwin K, Newburgh L, Nibarger JP, Page L, Quijada MA, Schmitt BL, Staggs ST, Thornton R, Zhang L.

Appl Opt. 2013 Dec 20;52(36):8747-58. doi: 10.1364/AO.52.008747.

PMID:
24513939
20.

Simulated vibrational sum frequency generation from a multilayer thin film system with two active interfaces.

O'Brien DB, Massari AM.

J Chem Phys. 2013 Apr 21;138(15):154708. doi: 10.1063/1.4799921.

PMID:
23614437
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