Format
Sort by
Items per page

Send to

Choose Destination

Links from PubMed

Items: 1 to 20 of 86

1.

A versatile apparatus for on-line emission channeling experiments.

Silva MR, Wahl U, Correia JG, Amorim LM, Pereira LM.

Rev Sci Instrum. 2013 Jul;84(7):073506. doi: 10.1063/1.4813266.

PMID:
23902062
2.

Development of fast heating electron beam annealing setup for ultra high vacuum chamber.

Das SC, Majumdar A, Katiyal S, Shripathi T, Hippler R.

Rev Sci Instrum. 2014 Feb;85(2):025107. doi: 10.1063/1.4865458.

PMID:
24593396
3.

Setup for in situ x-ray diffraction study of swift heavy ion irradiated materials.

Kulriya PK, Singh F, Tripathi A, Ahuja R, Kothari A, Dutt RN, Mishra YK, Kumar A, Avasthi DK.

Rev Sci Instrum. 2007 Nov;78(11):113901.

PMID:
18052482
4.

An ultrahigh-vacuum goniometer for in situ soft X-ray standing-wave analysis of semiconductor surfaces.

Sugiyama M, Maeyama S.

J Synchrotron Radiat. 1998 May 1;5(Pt 3):1029-31. Epub 1998 May 1.

PMID:
15263734
5.

An apparatus for pulsed ESR and DNP experiments using optically excited triplet states down to liquid helium temperatures.

Eichhorn TR, Haag M, van den Brandt B, Hautle P, Wenckebach WT, Jannin S, van der Klink JJ, Comment A.

J Magn Reson. 2013 Sep;234:58-66. doi: 10.1016/j.jmr.2013.06.009. Epub 2013 Jun 22.

PMID:
23838526
6.

A new highly automated sputter equipment for in situ investigation of deposition processes with synchrotron radiation.

Döhrmann R, Botta S, Buffet A, Santoro G, Schlage K, Schwartzkopf M, Bommel S, Risch JF, Mannweiler R, Brunner S, Metwalli E, Müller-Buschbaum P, Roth SV.

Rev Sci Instrum. 2013 Apr;84(4):043901. doi: 10.1063/1.4798544.

PMID:
23635203
7.

Development of an in situ polarization-dependent total-reflection fluorescence XAFS measurement system.

Chun WJ, Tanizawa Y, Shido T, Iwasawa Y, Nomura M, Asakura K.

J Synchrotron Radiat. 2001 Mar 1;8(Pt 2):168-72.

PMID:
11512718
8.

Multi-use high/low-temperature and pressure compatible portable chamber for in situ grazing-incidence X-ray scattering studies.

Ferrer P, Rubio-Zuazo J, Heyman C, Esteban-Betegón F, Castro GR.

J Synchrotron Radiat. 2013 May;20(Pt 3):474-81. doi: 10.1107/S0909049513002598. Epub 2013 Mar 1.

PMID:
23592627
9.

Note: development of fast heating inert gas annealing apparatus operated at atmospheric pressure.

Das SC, Majumdar A, Shripathi T, Hippler R.

Rev Sci Instrum. 2012 Apr;83(4):046109. doi: 10.1063/1.4704836.

PMID:
22559595
10.

Lattice location and stability of ion implanted Cu in Si

Wahl U, Vantomme A, Langouche G, Correia JG.

Phys Rev Lett. 2000 Feb 14;84(7):1495-8.

PMID:
11017551
11.

A new route toward semiconductor nanospintronics: highly Mn-doped GaAs nanowires realized by ion-implantation under dynamic annealing conditions.

Borschel C, Messing ME, Borgström MT, Paschoal W, Wallentin J, Kumar S, Mergenthaler K, Deppert K, Canali CM, Pettersson H, Samuelson L, Ronning C.

Nano Lett. 2011 Sep 14;11(9):3935-40. doi: 10.1021/nl2021653. Epub 2011 Aug 22.

PMID:
21848314
12.

New beam line for time-of-flight medium energy ion scattering with large area position sensitive detector.

Linnarsson MK, Hallén A, Åström J, Primetzhofer D, Legendre S, Possnert G.

Rev Sci Instrum. 2012 Sep;83(9):095107.

PMID:
23020419
13.

A 1800 K furnace designed for in situ synchrotron microtomography.

Grupp R, Henkel F, Nöthe M, Banhart J, Kieback B, Haibel A.

J Synchrotron Radiat. 2009 Jul;16(Pt 4):524-7. doi: 10.1107/S0909049509020937. Epub 2009 Jun 6.

PMID:
19535867
14.

A furnace to 1200 K for in situ heating x-ray diffraction, small angle x-ray scattering, and x-ray absorption fine structure experiments.

Cai Q, Wang Q, Wang W, Mo G, Zhang K, Cheng W, Xing X, Chen Z, Wu Z.

Rev Sci Instrum. 2008 Dec;79(12):126101. doi: 10.1063/1.3021473.

PMID:
19123592
15.

Comparison of epitaxial graphene on Si-face and C-face 4H SiC formed by ultrahigh vacuum and RF furnace production.

Jernigan GG, VanMil BL, Tedesco JL, Tischler JG, Glaser ER, Davidson A 3rd, Campbell PM, Gaskill DK.

Nano Lett. 2009 Jul;9(7):2605-9. doi: 10.1021/nl900803z.

PMID:
19583281
16.

Development of a new in-laboratory XAFS apparatus based on new concept.

Taguchi T, Harada J, Kiku A, Tohji K, Shinoda K.

J Synchrotron Radiat. 2001 Mar 1;8(Pt 2):363-5.

PMID:
11512781
17.

An apparatus for immersing trapped ions into an ultracold gas of neutral atoms.

Schmid S, Härter A, Frisch A, Hoinka S, Denschlag JH.

Rev Sci Instrum. 2012 May;83(5):053108. doi: 10.1063/1.4718356.

PMID:
22667603
18.

High temperature Seebeck coefficient and resistance measurement system for thermoelectric materials in the thin disk geometry.

Böttger PH, Flage-Larsen E, Karlsen OB, Finstad TG.

Rev Sci Instrum. 2012 Feb;83(2):025101. doi: 10.1063/1.3673474.

PMID:
22380119
19.

Development of a laser-based heating system for in situ synchrotron-based X-ray tomographic microscopy.

Fife JL, Rappaz M, Pistone M, Celcer T, Mikuljan G, Stampanoni M.

J Synchrotron Radiat. 2012 May;19(Pt 3):352-8. doi: 10.1107/S0909049512003287. Epub 2012 Mar 16.

20.

An ice lithography instrument.

Han A, Chervinsky J, Branton D, Golovchenko JA.

Rev Sci Instrum. 2011 Jun;82(6):065110. doi: 10.1063/1.3601005.

Supplemental Content

Support Center