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Items: 1 to 20 of 124

1.

Progress toward an aberration-corrected low energy electron microscope for DNA sequencing and surface analysis.

Mankos M, Shadman K, N'diaye AT, Schmid AK, Persson HH, Davis RW.

J Vac Sci Technol B Nanotechnol Microelectron. 2012 Nov;30(6):6F402. Epub 2012 Oct 26.

2.

A monochromatic, aberration-corrected, dual-beam low energy electron microscope.

Mankos M, Shadman K.

Ultramicroscopy. 2013 Jul;130:13-28. doi: 10.1016/j.ultramic.2013.02.018. Epub 2013 Mar 21.

3.

A novel low energy electron microscope for DNA sequencing and surface analysis.

Mankos M, Shadman K, Persson HH, N'Diaye AT, Schmid AK, Davis RW.

Ultramicroscopy. 2014 Oct;145:36-49. doi: 10.1016/j.ultramic.2014.01.007. Epub 2014 Jan 31.

4.

A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design.

Tromp RM, Hannon JB, Ellis AW, Wan W, Berghaus A, Schaff O.

Ultramicroscopy. 2010 Jun;110(7):852-61. doi: 10.1016/j.ultramic.2010.03.005. Epub 2010 Mar 31.

PMID:
20395048
5.
6.

A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results.

Tromp RM, Hannon JB, Wan W, Berghaus A, Schaff O.

Ultramicroscopy. 2013 Apr;127:25-39. doi: 10.1016/j.ultramic.2012.07.016. Epub 2012 Aug 7.

PMID:
22925736
7.

A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM.

Schramm SM, Pang AB, Altman MS, Tromp RM.

Ultramicroscopy. 2012 Apr;115:88-108. doi: 10.1016/j.ultramic.2011.11.005. Epub 2011 Nov 22.

PMID:
22209472
8.
9.

Catadioptric aberration correction in cathode lens microscopy.

Tromp RM.

Ultramicroscopy. 2015 Apr;151:191-8. doi: 10.1016/j.ultramic.2014.09.011. Epub 2014 Oct 16.

PMID:
25458190
10.

eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument.

Geelen D, Thete A, Schaff O, Kaiser A, van der Molen SJ, Tromp R.

Ultramicroscopy. 2015 Dec;159 Pt 3:482-7. doi: 10.1016/j.ultramic.2015.06.014. Epub 2015 Jun 26.

PMID:
26165485
11.

Aberrations of the cathode objective lens up to fifth order.

Tromp RM, Wan W, Schramm SM.

Ultramicroscopy. 2012 Aug;119:33-9. doi: 10.1016/j.ultramic.2011.09.011. Epub 2011 Sep 22.

PMID:
22188906
12.

Future trends in aberration-corrected electron microscopy.

Rose HH.

Philos Trans A Math Phys Eng Sci. 2009 Sep 28;367(1903):3809-23. doi: 10.1098/rsta.2009.0062.

13.

Current and future aberration correctors for the improvement of resolution in electron microscopy.

Haider M, Hartel P, Müller H, Uhlemann S, Zach J.

Philos Trans A Math Phys Eng Sci. 2009 Sep 28;367(1903):3665-82. doi: 10.1098/rsta.2009.0121.

14.

Double aberration correction in a low-energy electron microscope.

Schmidt T, Marchetto H, Lévesque PL, Groh U, Maier F, Preikszas D, Hartel P, Spehr R, Lilienkamp G, Engel W, Fink R, Bauer E, Rose H, Umbach E, Freund HJ.

Ultramicroscopy. 2010 Oct;110(11):1358-61. doi: 10.1016/j.ultramic.2010.07.007. Epub 2010 Jul 13.

PMID:
20692099
15.

Sub-ångstrom resolution using aberration corrected electron optics.

Batson PE, Dellby N, Krivanek OL.

Nature. 2002 Aug 8;418(6898):617-20.

PMID:
12167855
16.
17.

Choice of operating voltage for a transmission electron microscope.

Egerton RF.

Ultramicroscopy. 2014 Oct;145:85-93. doi: 10.1016/j.ultramic.2013.10.019. Epub 2014 Mar 12.

PMID:
24679438
18.

First experimental test of a new monochromated and aberration-corrected 200 kV field-emission scanning transmission electron microscope.

Walther T, Quandt E, Stegmann H, Thesen A, Benner G.

Ultramicroscopy. 2006 Oct-Nov;106(11-12):963-9. Epub 2006 Jul 5.

PMID:
16870338
19.

Adaptive aberration correction using a triode hyperbolic electron mirror.

Fitzgerald JP, Word RC, Könenkamp R.

Ultramicroscopy. 2011 Aug-Oct;111(9-10):1495-503. doi: 10.1016/j.ultramic.2011.06.004. Epub 2011 Jun 30.

PMID:
21930022
20.

4D electron microscopy: principles and applications.

Flannigan DJ, Zewail AH.

Acc Chem Res. 2012 Oct 16;45(10):1828-39. doi: 10.1021/ar3001684. Epub 2012 Sep 11.

PMID:
22967215
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