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Items: 1 to 20 of 105

1.

Torsional resonance mode atomic force microscopy in liquid with Lorentz force actuation.

Yang CW, Ding RF, Lai SH, Liao HS, Lai WC, Huang KY, Chang CS, Hwang IS.

Nanotechnology. 2013 Aug 2;24(30):305702. doi: 10.1088/0957-4484/24/30/305702. Epub 2013 Jun 27.

PMID:
23807471
2.

Imaging soft matters in water with torsional mode atomic force microscopy.

Hwang IS, Yang CW, Su PH, Hwu ET, Liao HS.

Ultramicroscopy. 2013 Dec;135:121-5. doi: 10.1016/j.ultramic.2012.07.001. Epub 2012 Jul 31.

PMID:
22939703
3.

Soft-contact imaging in liquid with frequency-modulation torsion resonance mode atomic force microscopy.

Yang CW, Hwang IS.

Nanotechnology. 2010 Feb 10;21(6):065710. doi: 10.1088/0957-4484/21/6/065710. Epub 2010 Jan 8.

PMID:
20057020
4.

Multifunctional atomic force microscope cantilevers with Lorentz force actuation and self-heating capability.

Somnath S, Liu JO, Bakir M, Prater CB, King WP.

Nanotechnology. 2014 Oct 3;25(39):395501. doi: 10.1088/0957-4484/25/39/395501. Epub 2014 Sep 5.

PMID:
25189800
5.

Atomic-resolution imaging in liquid by frequency modulation atomic force microscopy using small cantilevers with megahertz-order resonance frequencies.

Fukuma T, Onishi K, Kobayashi N, Matsuki A, Asakawa H.

Nanotechnology. 2012 Apr 6;23(13):135706. doi: 10.1088/0957-4484/23/13/135706. Epub 2012 Mar 16.

PMID:
22421199
6.

Visualization of hydration layers on muscovite mica in aqueous solution by frequency-modulation atomic force microscopy.

Kobayashi K, Oyabu N, Kimura K, Ido S, Suzuki K, Imai T, Tagami K, Tsukada M, Yamada H.

J Chem Phys. 2013 May 14;138(18):184704. doi: 10.1063/1.4803742.

PMID:
23676061
7.

Mapping of lateral vibration of the tip in atomic force microscopy at the torsional resonance of the cantilever.

Kawagishi T, Kato A, Hoshi Y, Kawakatsu H.

Ultramicroscopy. 2002 May;91(1-4):37-48.

PMID:
12211482
8.

Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers.

Long CJ, Cannara RJ.

Rev Sci Instrum. 2015 Jul;86(7):073703. doi: 10.1063/1.4926431.

PMID:
26233392
9.

High-sensitivity imaging with lateral resonance mode atomic force microscopy.

Ding RF, Yang CW, Huang KY, Hwang IS.

Nanoscale. 2016 Nov 3;8(43):18421-18427.

PMID:
27775132
10.

Lorentz force actuation of a heated atomic force microscope cantilever.

Lee B, Prater CB, King WP.

Nanotechnology. 2012 Feb 10;23(5):055709. doi: 10.1088/0957-4484/23/5/055709. Epub 2012 Jan 11.

PMID:
22237044
11.

Photothermal excitation and laser Doppler velocimetry of higher cantilever vibration modes for dynamic atomic force microscopy in liquid.

Nishida S, Kobayashi D, Sakurada T, Nakazawa T, Hoshi Y, Kawakatsu H.

Rev Sci Instrum. 2008 Dec;79(12):123703. doi: 10.1063/1.3040500.

PMID:
19123565
12.

Improving tapping mode atomic force microscopy with piezoelectric cantilevers.

Rogers B, Manning L, Sulchek T, Adams JD.

Ultramicroscopy. 2004 Aug;100(3-4):267-76. Erratum in: Ultramicroscopy. 2005 Jun;103(3):251-2.

PMID:
15231319
13.

Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface.

Yurtsever A, Gigler AM, Stark RW.

Ultramicroscopy. 2009 Feb;109(3):275-9. doi: 10.1016/j.ultramic.2008.11.016. Epub 2008 Dec 6.

PMID:
19131169
14.

Potential of interferometric cantilever detection and its application for SFM/AFM in liquids.

Hoogenboom BW, Frederix PL, Fotiadis D, Hug HJ, Engel A.

Nanotechnology. 2008 Sep 24;19(38):384019. doi: 10.1088/0957-4484/19/38/384019. Epub 2008 Aug 12.

PMID:
21832578
15.
16.
17.

An ultra-low noise optical head for liquid environment atomic force microscopy.

Schlesinger I, Kuchuk K, Sivan U.

Rev Sci Instrum. 2015 Aug;86(8):083705. doi: 10.1063/1.4928497.

PMID:
26329201
18.

Wideband phase-locked loop circuit with real-time phase correction for frequency modulation atomic force microscopy.

Fukuma T, Yoshioka S, Asakawa H.

Rev Sci Instrum. 2011 Jul;82(7):073707. doi: 10.1063/1.3608447.

PMID:
21806189
19.

A torsional resonance mode AFM for in-plane tip surface interactions.

Huang L, Su C.

Ultramicroscopy. 2004 Aug;100(3-4):277-85.

PMID:
15231320
20.

Atom-resolved analysis of an ionic KBr(001) crystal surface covered with a thin water layer by frequency modulation atomic force microscopy.

Arai T, Koshioka M, Abe K, Tomitori M, Kokawa R, Ohta M, Yamada H, Kobayashi K, Oyabu N.

Langmuir. 2015 Apr 7;31(13):3876-83. doi: 10.1021/acs.langmuir.5b00087. Epub 2015 Mar 30.

PMID:
25790119

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