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Items: 1 to 20 of 106

1.

Electrically conducting, ultra-sharp, high aspect-ratio probes for AFM fabricated by electron-beam-induced deposition of platinum.

Brown J, Kocher P, Ramanujan CS, Sharp DN, Torimitsu K, Ryan JF.

Ultramicroscopy. 2013 Oct;133:62-6. doi: 10.1016/j.ultramic.2013.05.005. Epub 2013 May 20.

PMID:
23770730
2.

High aspect ratio AFM Probe processing by helium-ion-beam induced deposition.

Onishi K, Guo H, Nagano S, Fujita D.

Microscopy (Oxf). 2014 Nov;63 Suppl 1:i30. doi: 10.1093/jmicro/dfu075.

PMID:
25359832
3.

Batch fabrication of atomic force microscopy probes with recessed integrated ring microelectrodes at a wafer level.

Shin H, Hesketh PJ, Mizaikoff B, Kranz C.

Anal Chem. 2007 Jul 1;79(13):4769-77. Epub 2007 May 24.

PMID:
17521168
4.
5.

Diamond-modified AFM probes: from diamond nanowires to atomic force microscopy-integrated boron-doped diamond electrodes.

Smirnov W, Kriele A, Hoffmann R, Sillero E, Hees J, Williams OA, Yang N, Kranz C, Nebel CE.

Anal Chem. 2011 Jun 15;83(12):4936-41. doi: 10.1021/ac200659e. Epub 2011 May 18.

PMID:
21534601
6.
7.

Focused ion beam-assisted fabrication of soft high-aspect ratio silicon nanowire atomic force microscopy probes.

Knittel P, Hibst N, Mizaikoff B, Strehle S, Kranz C.

Ultramicroscopy. 2017 Aug;179:24-32. doi: 10.1016/j.ultramic.2017.03.031. Epub 2017 Mar 28.

PMID:
28384541
8.

Sharp high-aspect-ratio AFM tips fabricated by a combination of deep reactive ion etching and focused ion beam techniques.

Caballero D, Villanueva G, Plaza JA, Mills CA, Samitier J, Errachid A.

J Nanosci Nanotechnol. 2010 Jan;10(1):497-501.

PMID:
20352882
9.

Fabrication of platinum nanopillars on peptide-based soft structures using a focused ion beam.

Joshi KB, Singh P, Verma S.

Biofabrication. 2009 Jun;1(2):025002. doi: 10.1088/1758-5082/1/2/025002. Epub 2009 Jun 10.

PMID:
20811102
10.

Plasma-deposited fluorocarbon films: insulation material for microelectrodes and combined atomic force microscopy-scanning electrochemical microscopy probes.

Wiedemair J, Balu B, Moon JS, Hess DW, Mizaikoff B, Kranz C.

Anal Chem. 2008 Jul 1;80(13):5260-5. doi: 10.1021/ac800246q. Epub 2008 May 30.

PMID:
18510344
11.

Efficient attachment of carbon nanotubes to conventional and high-frequency AFM probes enhanced by electron beam processes.

Slattery AD, Blanch AJ, Quinton JS, Gibson CT.

Nanotechnology. 2013 Jun 14;24(23):235705. doi: 10.1088/0957-4484/24/23/235705. Epub 2013 May 13.

PMID:
23669234
12.

Gold nanocone near-field scanning optical microscopy probes.

Fleischer M, Weber-Bargioni A, Altoe MV, Schwartzberg AM, Schuck PJ, Cabrini S, Kern DP.

ACS Nano. 2011 Apr 26;5(4):2570-9. doi: 10.1021/nn102199u. Epub 2011 Mar 14.

PMID:
21401116
13.

Spider-silk-based fabrication of nanogaps and wires.

Morales P, Rapone B, Caruso M, Flammini D.

Nanotechnology. 2012 Jun 29;23(25):255304. doi: 10.1088/0957-4484/23/25/255304. Epub 2012 May 31.

PMID:
22652812
14.

Electron-beam-induced deposition of platinum from a liquid precursor.

Donev EU, Hastings JT.

Nano Lett. 2009 Jul;9(7):2715-8. doi: 10.1021/nl9012216.

PMID:
19583284
15.

Gold-coated conducting-atomic force microscopy probes.

John NS, Kulkarni GU.

J Nanosci Nanotechnol. 2005 Apr;5(4):587-91.

PMID:
16004123
16.

High aspect ratio nanoneedle probes with an integrated electrode at the tip apex.

Comstock DJ, Elam JW, Pellin MJ, Hersam MC.

Rev Sci Instrum. 2012 Nov;83(11):113704. doi: 10.1063/1.4767248.

PMID:
23206068
17.

Fabrication of ball-shaped atomic force microscope tips by ion-beam-induced deposition of platinum on multiwall carbon nanotubes.

Kahng YH, Choi J, Jeong K, Park BC, Kim DH, Lyou J, Lee JJ, Lee H, Lee T, Ahn SJ.

Ultramicroscopy. 2009 Dec;110(1):82-8. doi: 10.1016/j.ultramic.2009.09.011. Epub 2009 Sep 30.

PMID:
19853998
18.

Near-field imaging of surface plasmon on gold nano-dots fabricated by scanning probe lithography.

Kim J, Kim J, Song KI, Lee SQ, Kim EU, Choi SE, Lee Y, Park KH.

J Microsc. 2003 Mar;209(Pt 3):236-40.

19.

Micro-wilhelmy and related liquid property measurements using constant-diameter nanoneedle-tipped atomic force microscope probes.

Yazdanpanah MM, Hosseini M, Pabba S, Berry SM, Dobrokhotov VV, Safir A, Keynton RS, Cohn RW.

Langmuir. 2008 Dec 2;24(23):13753-64. doi: 10.1021/la802820u.

PMID:
18986184
20.

Structural and functional imaging with carbon nanotube AFM probes.

Hafner JH, Cheung CL, Woolley AT, Lieber CM.

Prog Biophys Mol Biol. 2001;77(1):73-110. Review.

PMID:
11473787

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