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Items: 1 to 20 of 108

1.

Theoretical and experimental study on two-stage-imaging microscopy using ellipsometric contrast for real-time visualization of molecularly thin films.

Kajihara Y, Fukuzawa K, Itoh S, Watanabe R, Zhang H.

Rev Sci Instrum. 2013 May;84(5):053704. doi: 10.1063/1.4804633.

PMID:
23742555
2.

Direct visualization of dewetting of molecularly thin liquid films on solid surfaces.

Fukuzawa K, Shimuta T, Yoshida T, Mitsuya Y, Zhang H.

Langmuir. 2006 Aug 1;22(16):6951-5.

PMID:
16863244
3.

Determining thickness of films on a curved substrate by use of ellipsometric measurements.

Han CY, Lee ZY, Chao YF.

Appl Opt. 2009 Jun 10;48(17):3139-43.

PMID:
19516348
4.

Deformation and dewetting of thin liquid films induced by moving gas jets.

Berendsen CW, Zeegers JC, Darhuber AA.

J Colloid Interface Sci. 2013 Oct 1;407:505-15. doi: 10.1016/j.jcis.2013.06.011. Epub 2013 Jun 26.

PMID:
23866198
5.

Microscopic thin film optical anisotropy imaging at the solid-liquid interface.

Miranda A, De Beule PA.

Rev Sci Instrum. 2016 Apr;87(4):043701. doi: 10.1063/1.4947258.

PMID:
27131681
6.

Surfactant solutions and porous substrates: spreading and imbibition.

Starov VM.

Adv Colloid Interface Sci. 2004 Nov 29;111(1-2):3-27.

PMID:
15571660
7.

In situ monitoring of atomic layer deposition in nanoporous thin films using ellipsometric porosimetry.

Dendooven J, Devloo-Casier K, Levrau E, Van Hove R, Sree SP, Baklanov MR, Martens JA, Detavernier C.

Langmuir. 2012 Feb 28;28(8):3852-9. doi: 10.1021/la300045z. Epub 2012 Feb 15.

PMID:
22304361
8.

Dynamics of a liquid film of arbitrary thickness perturbed by a nano-object.

Wędołowski K, Napiórkowski M.

Soft Matter. 2015 Apr 7;11(13):2639-54. doi: 10.1039/c4sm02565b.

PMID:
25687580
9.

Image sharpness and contrast transfer in coherent confocal microscopy.

Oldenbourg R, Terada H, Tiberio R, Inoué S.

J Microsc. 1993 Oct;172(Pt 1):31-9.

PMID:
8289226
10.

In situ, real time monitoring of surface transformation: ellipsometric microscopy imaging of electrografting at microstructured gold surfaces.

Munteanu S, Garraud N, Roger JP, Amiot F, Shi J, Chen Y, Combellas C, Kanoufi F.

Anal Chem. 2013 Feb 19;85(4):1965-71. doi: 10.1021/ac3034085. Epub 2013 Jan 31.

PMID:
23351088
11.

Measuring electro-mechanical properties of thin films on polymer substrates.

Cordill MJ, Glushko O, Kreith J, Marx VM, Kirchlechner C.

Microelectron Eng. 2015 Apr 2;137:96-100.

12.

Method for measuring thickness of dielectric films using microdielectric fringe-effect sensors.

Choi YH, Tathireddy P, Skliar M.

Anal Chem. 2006 May 15;78(10):3242-8.

PMID:
16689522
13.

An in-situ real-time optical fiber sensor based on surface plasmon resonance for monitoring the growth of TiO2 thin films.

Tsao YC, Tsai WH, Shih WC, Wu MS.

Sensors (Basel). 2013 Jul 23;13(7):9513-21. doi: 10.3390/s130709513.

15.

Quantitative phase amplitude microscopy IV: imaging thick specimens.

Bellair CJ, Curl CL, Allman BE, Harris PJ, Roberts A, Delbridge LM, Nugent KA.

J Microsc. 2004 Apr;214(Pt 1):62-9.

16.

A comprehensive study of the reaction parameters involved in the synthesis of silica thin films with well-ordered uni-directional mesopores.

Collard X, Van der Schueren B, Rooke JC, Aprile C, Su BL.

J Colloid Interface Sci. 2013 Jul 1;401:23-33. doi: 10.1016/j.jcis.2013.02.051. Epub 2013 Apr 6.

PMID:
23623411
17.

Performance of a PSPMT based detector for scintimammography.

Williams MB, Williams MB, Goode AR, Galbis-Reig V, Majewski S, Weisenberger AG, Wojcik R.

Phys Med Biol. 2000 Mar;45(3):781-800.

PMID:
10730971
18.

Disjoining pressure measurements using a microfabricated groove for a molecularly thin polymer liquid film on a solid surface.

Fukuzawa K, Kawamura J, Deguchi T, Zhang H, Mitsuya Y.

J Chem Phys. 2004 Sep 1;121(9):4358-63.

PMID:
15332987
20.

Extreme hardening of PDMS thin films due to high compressive strain and confined thickness.

Xu W, Chahine N, Sulchek T.

Langmuir. 2011 Jul 5;27(13):8470-7. doi: 10.1021/la201122e. Epub 2011 Jun 2.

PMID:
21634411
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