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Items: 1 to 20 of 146

1.

Insight into the compositional and structural nano features of AlN/GaN DBRs by EELS-HAADF.

Eljarrat A, López-Conesa L, Magén C, Gačević Z, Fernández-Garrido S, Calleja E, Estradé S, Peiró F.

Microsc Microanal. 2013 Jun;19(3):698-705. doi: 10.1017/S1431927613000512. Epub 2013 May 9.

2.

Optoelectronic properties of InAlN/GaN distributed bragg reflector heterostructure examined by valence electron energy loss spectroscopy.

Eljarrat A, Estradé S, Gačević Z, Fernández-Garrido S, Calleja E, Magén C, Peiró F.

Microsc Microanal. 2012 Oct;18(5):1143-54. doi: 10.1017/S1431927612001328. Epub 2012 Oct 12.

3.

Structural and compositional properties of Er-doped silicon nanoclusters/oxides for multilayered photonic devices studied by STEM-EELS.

Eljarrat A, López-Conesa L, Rebled JM, Berencén Y, Ramírez JM, Garrido B, Magén C, Estradé S, Peiró F.

Nanoscale. 2013 Oct 21;5(20):9963-70. doi: 10.1039/c3nr02754f.

PMID:
23989957
4.

Four-dimensional STEM-EELS: enabling nano-scale chemical tomography.

Jarausch K, Thomas P, Leonard DN, Twesten R, Booth CR.

Ultramicroscopy. 2009 Mar;109(4):326-37. doi: 10.1016/j.ultramic.2008.12.012. Epub 2009 Jan 6.

PMID:
19246157
5.
6.

Quantitative parameters for the examination of InGaN QW multilayers by low-loss EELS.

Eljarrat A, López-Conesa L, Magén C, García-Lepetit N, Gačević Ž, Calleja E, Peiró F, Estradé S.

Phys Chem Chem Phys. 2016 Aug 17;18(33):23264-76. doi: 10.1039/c6cp04493j.

PMID:
27499340
7.

Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images.

Bosman M, Watanabe M, Alexander DT, Keast VJ.

Ultramicroscopy. 2006 Oct-Nov;106(11-12):1024-32. Epub 2006 Jul 5.

PMID:
16876322
8.

Study of atomic resolved plasmon-loss image by spherical aberration-corrected STEM-EELS method.

Yamazaki T, Kotaka Y, Tsukada M, Kataoka Y.

Ultramicroscopy. 2010 Aug;110(9):1161-5. doi: 10.1016/j.ultramic.2010.04.011. Epub 2010 Apr 24.

PMID:
20451326
9.

Electron energy loss spectroscopy on semiconductor heterostructures for optoelectronics and photonics applications.

Eljarrat A, López-Conesa L, Estradé S, Peiró F.

J Microsc. 2016 May;262(2):142-50. doi: 10.1111/jmi.12298. Epub 2015 Sep 14.

PMID:
26366876
10.

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G.

Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27.

PMID:
19525069
11.

Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field images.

Rosenauer A, Gries K, Müller K, Pretorius A, Schowalter M, Avramescu A, Engl K, Lutgen S.

Ultramicroscopy. 2009 Aug;109(9):1171-82. doi: 10.1016/j.ultramic.2009.05.003. Epub 2009 May 14.

PMID:
19497670
12.

Elemental electron energy loss mapping of a precipitate in a multi-component aluminium alloy.

Mørtsell EA, Wenner S, Longo P, Andersen SJ, Marioara CD, Holmestad R.

Micron. 2016 Jul;86:22-9. doi: 10.1016/j.micron.2016.03.006. Epub 2016 Apr 13.

PMID:
27124585
14.

Density changes in shear bands of a metallic glass determined by correlative analytical transmission electron microscopy.

Rösner H, Peterlechner M, Kübel C, Schmidt V, Wilde G.

Ultramicroscopy. 2014 Jul;142:1-9. doi: 10.1016/j.ultramic.2014.03.006. Epub 2014 Mar 24.

PMID:
24713360
15.

Low-energy electron scattering in carbon-based materials analyzed by scanning transmission electron microscopy and its application to sample thickness determination.

Pfaff M, Müller E, Klein MF, Colsmann A, Lemmer U, Krzyzanek V, Reichelt R, Gerthsen D.

J Microsc. 2011 Jul;243(1):31-9. doi: 10.1111/j.1365-2818.2010.03475.x. Epub 2010 Dec 13.

16.

Electron energy loss spectroscopy investigation through a nano ablated uranium dioxide sample.

Degueldre C, Schaeublin R, Krbanjevic J, Minikus E.

Talanta. 2013 Mar 15;106:408-13. doi: 10.1016/j.talanta.2013.01.023. Epub 2013 Feb 14.

PMID:
23598145
17.

Analysis of contacts and V-defects in GaN device structures by transmission electron microscopy.

Bright AN, Sharma N, Humphreys CJ.

J Electron Microsc (Tokyo). 2001;50(6):489-95.

PMID:
11918415
18.

Density Functional Theory Modeling of Low-Loss Electron Energy-Loss Spectroscopy in Wurtzite III-Nitride Ternary Alloys.

Eljarrat A, Sastre X, Peiró F, Estradé S.

Microsc Microanal. 2016 Jun;22(3):706-16. doi: 10.1017/S1431927616000106. Epub 2016 Feb 12.

PMID:
26868876
19.

Influence of static atomic displacements on composition quantification of AlGaN/GaN heterostructures from HAADF-STEM images.

Schowalter M, Stoffers I, Krause FF, Mehrtens T, Müller K, Fandrich M, Aschenbrenner T, Hommel D, Rosenauer A.

Microsc Microanal. 2014 Oct;20(5):1463-70. doi: 10.1017/S1431927614012732. Epub 2014 Jul 10.

PMID:
25010567
20.

Configuration of microbially synthesized Pd-Au nanoparticles studied by STEM-based techniques.

Tran DT, Jones IP, Preece JA, Johnston RL, Deplanche K, Macaskie LE.

Nanotechnology. 2012 Feb 10;23(5):055701. doi: 10.1088/0957-4484/23/5/055701. Epub 2012 Jan 11.

PMID:
22236722

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