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Items: 1 to 20 of 155

1.

Development of an environmental high-voltage electron microscope for reaction science.

Tanaka N, Usukura J, Kusunoki M, Saito Y, Sasaki K, Tanji T, Muto S, Arai S.

Microscopy (Oxf). 2013 Feb;62(1):205-15. doi: 10.1093/jmicro/dfs095. Epub 2013 Jan 16. Review.

PMID:
23329854
2.

Elemental mapping by electron energy loss spectroscopy in biology.

Aronova MA, Leapman RD.

Methods Mol Biol. 2013;950:209-26. doi: 10.1007/978-1-62703-137-0_13.

PMID:
23086878
3.

Low voltage transmission electron microscopy of graphene.

Bachmatiuk A, Zhao J, Gorantla SM, Martinez IG, Wiedermann J, Lee C, Eckert J, Rummeli MH.

Small. 2015 Feb 4;11(5):515-42. doi: 10.1002/smll.201401804. Epub 2014 Nov 18. Review. Erratum in: Small. 2016 Mar;12(10):1251.

PMID:
25408379
4.

From electron energy-loss spectroscopy to multi-dimensional and multi-signal electron microscopy.

Colliex C.

J Electron Microsc (Tokyo). 2011;60 Suppl 1:S161-71. doi: 10.1093/jmicro/dfr028. Review.

PMID:
21844587
5.

Toward atomic-scale bright-field electron tomography for the study of fullerene-like nanostructures.

Bar Sadan M, Houben L, Wolf SG, Enyashin A, Seifert G, Tenne R, Urban K.

Nano Lett. 2008 Mar;8(3):891-6. doi: 10.1021/nl073149i. Epub 2008 Feb 1.

PMID:
18237147
6.

Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy.

Vendelbo SB, Kooyman PJ, Creemer JF, Morana B, Mele L, Dona P, Nelissen BJ, Helveg S.

Ultramicroscopy. 2013 Oct;133:72-9. doi: 10.1016/j.ultramic.2013.04.004. Epub 2013 Apr 28.

PMID:
23831940
7.

A graphene oxide-carbon nanotube grid for high-resolution transmission electron microscopy of nanomaterials.

Zhang L, Zhang H, Zhou R, Chen Z, Li Q, Fan S, Ge G, Liu R, Jiang K.

Nanotechnology. 2011 Sep 23;22(38):385704. doi: 10.1088/0957-4484/22/38/385704. Epub 2011 Aug 31.

PMID:
21878720
8.

Practical spatial resolution of electron energy loss spectroscopy in aberration corrected scanning transmission electron microscopy.

Shah AB, Ramasse QM, Wen JG, Bhattacharya A, Zuo JM.

Micron. 2011 Aug;42(6):539-46. doi: 10.1016/j.micron.2010.12.008. Epub 2011 Feb 3.

PMID:
21376607
9.

Four-dimensional electron microscopy.

Zewail AH.

Science. 2010 Apr 9;328(5975):187-93. doi: 10.1126/science.1166135. Review.

PMID:
20378810
10.

Microscopy Hacks: development of various techniques to assist quantitative nanoanalysis and advanced electron microscopy.

Watanabe M.

Microscopy (Oxf). 2013 Apr;62(2):217-41. doi: 10.1093/jmicro/dfs085. Epub 2013 Mar 20. Review.

PMID:
23515525
11.

Whole-cell imaging of the budding yeast Saccharomyces cerevisiae by high-voltage scanning transmission electron tomography.

Murata K, Esaki M, Ogura T, Arai S, Yamamoto Y, Tanaka N.

Ultramicroscopy. 2014 Nov;146:39-45. doi: 10.1016/j.ultramic.2014.05.008. Epub 2014 Jun 2.

PMID:
24935612
12.

Probing structures of nanomaterials using advanced electron microscopy methods, including aberration-corrected electron microscopy at the Angstrom scale.

Gai PL, Yoshida K, Shute C, Jia X, Walsh M, Ward M, Dresselhaus MS, Weertman JR, Boyes ED.

Microsc Res Tech. 2011 Jul;74(7):664-70. doi: 10.1002/jemt.20933. Epub 2010 Oct 15.

PMID:
20954265
13.
14.

Laser-based in situ techniques: novel methods for generating extreme conditions in TEM samples.

Taheri ML, Lagrange T, Reed BW, Armstrong MR, Campbell GH, DeHope WJ, Kim JS, King WE, Masiel DJ, Browning ND.

Microsc Res Tech. 2009 Mar;72(3):122-30. doi: 10.1002/jemt.20664.

PMID:
19165740
15.

10-kV diffractive imaging using newly developed electron diffraction microscope.

Kamimura O, Dobashi T, Kawahara K, Abe T, Gohara K.

Ultramicroscopy. 2010 Jan;110(2):130-3. doi: 10.1016/j.ultramic.2009.10.010. Epub 2009 Oct 23.

PMID:
19926398
16.

Nanoparticle shape and configuration analysis by transmission electron tomography.

Ahrenkiel SP, Yu PR, Murphy JE, Nedeljković JM, Donohoe BS.

J Microsc. 2008 Jun;230(Pt 3):382-7. doi: 10.1111/j.1365-2818.2008.01996.x.

17.

Atomic resolution imaging of oxygen atoms close to heavy atoms by HRTEM and ED, using the superconductor SmFeAsO0.85F0.15 as an example.

Wang Y, Ge B, Che G.

Micron. 2015 Apr;71:32-8. doi: 10.1016/j.micron.2015.01.001. Epub 2015 Jan 14.

PMID:
25635603
18.

Ultra-structural observation of human enamel and dentin by ultra-high-voltage electron tomography and the focus ion beam technique.

Miura J, Kubo M, Nagashima T, Takeshige F.

J Electron Microsc (Tokyo). 2012;61(5):335-41. doi: 10.1093/jmicro/dfs056. Epub 2012 Aug 7.

PMID:
22872279
19.

Automated most-probable loss tomography of thick selectively stained biological specimens with quantitative measurement of resolution improvement.

Bouwer JC, Mackey MR, Lawrence A, Deerinck TJ, Jones YZ, Terada M, Martone ME, Peltier S, Ellisman MH.

J Struct Biol. 2004 Dec;148(3):297-306.

PMID:
15522778
20.

Electron holography study of magnetization behavior in the writer pole of a perpendicular magnetic recording head by a 1 MV transmission electron microscope.

Hirata K, Ishida Y, Akashi T, Shindo D, Tonomura A.

J Electron Microsc (Tokyo). 2012;61(5):305-8. doi: 10.1093/jmicro/dfs051. Epub 2012 Jun 26.

PMID:
22735923

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