Format
Sort by
Items per page

Send to

Choose Destination

Links from PubMed

Items: 1 to 20 of 128

1.

Application of spectroscopic ellipsometry and Mueller ellipsometry to optical characterization.

Garcia-Caurel E, De Martino A, Gaston JP, Yan L.

Appl Spectrosc. 2013 Jan;67(1):1-21. doi: 10.1366/12-06883.

PMID:
23317664
2.

Characterization of depolarizing optical media by means of the entropy factor: application to biological tissues.

Pereda Cubián D, Arce Diego JL, Rentmeesters R.

Appl Opt. 2005 Jan 20;44(3):358-65.

PMID:
15717825
3.

Combined Stokes vector and Mueller matrix polarimetry for materials characterization.

Hall SA, Hoyle MA, Post JS, Hore DK.

Anal Chem. 2013 Aug 6;85(15):7613-9. doi: 10.1021/ac401864g. Epub 2013 Jul 23.

PMID:
23834365
4.

Characterization of bidimensional gratings by spectroscopic ellipsometry and angle-resolved Mueller polarimetry.

Kaplan B, Novikova T, De Martino A, Drévillon B.

Appl Opt. 2004 Feb 20;43(6):1233-40.

PMID:
15008524
5.

Real-time in situ Mueller matrix ellipsometry of GaSb nanopillars: observation of anisotropic local alignment.

Nerbø IS, Le Roy S, Foldyna M, Søndergård E, Kildemo M.

Opt Express. 2011 Jun 20;19(13):12551-61. doi: 10.1364/OE.19.012551.

PMID:
21716496
6.

Retrieval of a non-depolarizing component of experimentally determined depolarizing Mueller matrices.

Foldyna M, Garcia-Caurel E, Ossikovski R, De Martino A, Gil JJ.

Opt Express. 2009 Jul 20;17(15):12794-806.

PMID:
19654685
7.

Anisotropic incoherent reflection model for spectroscopic ellipsometry of a thick semitransparent anisotropic substrate.

Ossikovski R, Kildemo M, Stchakovsky M, Mooney M.

Appl Opt. 2000 May 1;39(13):2071-7.

PMID:
18345108
8.

Characterization of nanostructured GaSb: comparison between large-area optical and local direct microscopic techniques.

Nerbø IS, Kildemo M, Le Roy S, Simonsen I, Søndergård E, Holt L, Walmsley JC.

Appl Opt. 2008 Oct 1;47(28):5130-9.

PMID:
18830302
9.

Stokes-vector and Mueller-matrix polarimetry [Invited].

Azzam RM.

J Opt Soc Am A Opt Image Sci Vis. 2016 Jul 1;33(7):1396-408. doi: 10.1364/JOSAA.33.001396.

PMID:
27409699
10.

Spectroscopic ellipsometry and polarimetry for materials and systems analysis at the nanometer scale: state-of-the-art, potential, and perspectives.

Losurdo M, Bergmair M, Bruno G, Cattelan D, Cobet C, de Martino A, Fleischer K, Dohcevic-Mitrovic Z, Esser N, Galliet M, Gajic R, Hemzal D, Hingerl K, Humlicek J, Ossikovski R, Popovic ZV, Saxl O.

J Nanopart Res. 2009 Oct;11(7):1521-1554. Epub 2009 Jun 12.

11.

Mueller polarimetric imaging for surgical and diagnostic applications: a review.

Qi J, Elson DS.

J Biophotonics. 2017 May 2. doi: 10.1002/jbio.201600152. [Epub ahead of print] Review.

PMID:
28464464
12.

Mueller Matrix of Specular Reflection Using an Aluminum Grating Surface with Oxide Nanofilm.

Qiu J, Ran D, Liu L, Hsu PF.

Appl Spectrosc. 2016 Jun;70(6):1009-17. doi: 10.1177/0003702816641268. Epub 2016 Apr 29.

PMID:
27129364
13.

Accurate characterization of nanoimprinted resist patterns using Mueller matrix ellipsometry.

Chen X, Liu S, Zhang C, Jiang H, Ma Z, Sun T, Xu Z.

Opt Express. 2014 Jun 16;22(12):15165-77. doi: 10.1364/OE.22.015165.

PMID:
24977609
14.

Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films.

Rodenhausen KB, Schmidt D, Kasputis T, Pannier AK, Schubert E, Schubert M.

Opt Express. 2012 Feb 27;20(5):5419-28. doi: 10.1364/OE.20.005419.

PMID:
22418349
15.

Application of Mueller polarimetry in conical diffraction for critical dimension measurements in microelectronics.

Novikova T, De Martino A, Ben Hatit S, Drévillon B.

Appl Opt. 2006 Jun 1;45(16):3688-97.

PMID:
16724124
16.

Anisotropic plasmonic Cu nanoparticles in sol-gel oxide nanopillars studied by spectroscopic Mueller matrix ellipsometry.

Ghadyani Z, Kildemo M, Aas LM, Cohin Y, Søndergård E.

Opt Express. 2013 Dec 16;21(25):30796-811. doi: 10.1364/OE.21.030796.

PMID:
24514655
17.

Systematic errors for a Mueller matrix dual rotating compensator ellipsometer.

Broch L, En Naciri A, Johann L.

Opt Express. 2008 Jun 9;16(12):8814-24.

PMID:
18545594
18.

Mueller-matrix ellipsometry using the division-of-amplitude photopolarimeter: a study of depolarization effects.

Krishnan S, Nordine PC.

Appl Opt. 1994 Jul 1;33(19):4184-92. doi: 10.1364/AO.33.004184.

PMID:
20935772
19.

Characterization of the accretion of material by microparticles using resonant ellipsometry.

Folan LM.

Appl Opt. 1992 Apr 20;31(12):2066-71. doi: 10.1364/AO.31.002066.

PMID:
20720860
20.

Polarized light imaging in biomedicine: emerging Mueller matrix methodologies for bulk tissue assessment.

Alali S, Vitkin A.

J Biomed Opt. 2015 Jun;20(6):61104. doi: 10.1117/1.JBO.20.6.061104. Review.

PMID:
25793658

Supplemental Content

Support Center