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Items: 1 to 20 of 114

1.
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Two-dimensional refractive index and stresses profiles of a homogenous bent optical fiber.

Ramadan WA, Wahba HH, Shams El-Din MA.

Appl Opt. 2014 Nov 1;53(31):7462-9. doi: 10.1364/AO.53.007462.

PMID:
25402912
5.

High-accuracy self-correction of refractive index of air using two-color interferometry of optical frequency combs.

Minoshima K, Arai K, Inaba H.

Opt Express. 2011 Dec 19;19(27):26095-105. doi: 10.1364/OE.19.026095.

PMID:
22274198
6.

Experimental and Simulated Investigations of Thin Polymer Substrates with an Indium Tin Oxide Coating under Fatigue Bending Loadings.

Hsu JS, Lee CC, Wen BJ, Huang PC, Xie CK.

Materials (Basel). 2016 Aug 24;9(9). pii: E720. doi: 10.3390/ma9090720.

7.

Flexible organic light-emitting diodes with a polymeric nanocomposite anode.

Wang GF, Tao XM, Wang RX.

Nanotechnology. 2008 Apr 9;19(14):145201. doi: 10.1088/0957-4484/19/14/145201. Epub 2008 Mar 4.

PMID:
21817753
8.

Digital three-color holographic interferometry for flow analysis.

Desse JM, Picart P, Tankam P.

Opt Express. 2008 Apr 14;16(8):5471-80.

PMID:
18542650
9.

Direct measurement of refractive-index dispersion of transparent media by white-light interferometry.

Galli M, Marabelli F, Guizzetti G.

Appl Opt. 2003 Jul 1;42(19):3910-4.

PMID:
12868830
10.

Measurement of residual stress for ITO/PET substrates by the double beam shadow moiré interferometer.

Chen HC, Huang KT, Lo YM.

Appl Opt. 2012 Apr 1;51(10):1566-71. doi: 10.1364/AO.51.001566.

PMID:
22505076
12.

Separation algorithm for a 2D refractive index distribution and thickness profile of a phase object by laser diode-based multiwavelength interferometry.

Lee K, Ryu SY, Kwak YK, Kim S, Lee YW.

Rev Sci Instrum. 2009 May;80(5):053114. doi: 10.1063/1.3142482.

PMID:
19485499
13.

Direct deflection radius measurement of flexible PET substrates by using an optical interferometry.

Hsu JS, Li PW.

Appl Opt. 2015 Jun 10;54(17):5469-74. doi: 10.1364/AO.54.005469.

PMID:
26192849
14.

Measurement of the changes in air refractive index and distance by means of a two-color interferometer.

Matsumoto H, Zhu Y, Iwasaki S, O'ishi T.

Appl Opt. 1992 Aug 1;31(22):4522-6. doi: 10.1364/AO.31.004522.

PMID:
20725453
15.

Refractive index and dispersion variation in precision optical glass molding by computed tomography.

Zhao W, Chen Y, Shen L, Yi AY.

Appl Opt. 2009 Jul 1;48(19):3588-95.

PMID:
19571913
16.

Continuous, highly flexible, and transparent graphene films by chemical vapor deposition for organic photovoltaics.

Gomez De Arco L, Zhang Y, Schlenker CW, Ryu K, Thompson ME, Zhou C.

ACS Nano. 2010 May 25;4(5):2865-73. doi: 10.1021/nn901587x.

PMID:
20394355
17.

Measuring residual stress of anisotropic thin film by fast Fourier transform.

Tien CL, Zeng HD.

Opt Express. 2010 Aug 2;18(16):16594-600. doi: 10.1364/OE.18.016594.

PMID:
20721050
18.

New technique for measuring the refractive index of gases near 10 microm.

Thomas JG.

Appl Opt. 1989 May 15;28(10):1830-3. doi: 10.1364/AO.28.001830.

PMID:
20548751
19.

Interferometric sensing platform with dielectric nanostructured thin films.

Celo D, Post E, Summers M, Smy T, Brett MJ, Albert J.

Opt Express. 2009 Apr 13;17(8):6655-64.

PMID:
19365492
20.

Fabrication and characterization of thin films of single-walled carbon nanotube bundles on flexible plastic substrates.

Saran N, Parikh K, Suh DS, Muñoz E, Kolla H, Manohar SK.

J Am Chem Soc. 2004 Apr 14;126(14):4462-3.

PMID:
15070332

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