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Items: 1 to 20 of 150

1.

Quartz tuning fork-based frequency modulation atomic force spectroscopy and microscopy with all digital phase-locked loop.

An S, Hong MH, Kim J, Kwon S, Lee K, Lee M, Jhe W.

Rev Sci Instrum. 2012 Nov;83(11):113705. doi: 10.1063/1.4765702.

PMID:
23206069
2.

Enhanced formation of a confined nano-water meniscus using a 780 nm laser with a quartz tuning fork-atomic force microscope.

An S, Lee K, Moon G, Bak W, Kim G, Jhe W.

J Nanosci Nanotechnol. 2012 Jul;12(7):5754-8.

PMID:
22966648
3.

Nanopipette combined with quartz tuning fork-atomic force microscope for force spectroscopy/microscopy and liquid delivery-based nanofabrication.

An S, Lee K, Kim B, Noh H, Kim J, Kwon S, Lee M, Hong MH, Jhe W.

Rev Sci Instrum. 2014 Mar;85(3):033702. doi: 10.1063/1.4866656.

PMID:
24689587
4.

Wideband phase-locked loop circuit with real-time phase correction for frequency modulation atomic force microscopy.

Fukuma T, Yoshioka S, Asakawa H.

Rev Sci Instrum. 2011 Jul;82(7):073707. doi: 10.1063/1.3608447.

PMID:
21806189
5.

Nanoscale lithography with frequency-modulation atomic force microscopy.

Hamada M, Eguchi T, Akiyama K, Hasegawa Y.

Rev Sci Instrum. 2008 Dec;79(12):123706. doi: 10.1063/1.3043435.

PMID:
19123568
6.

Wideband digital frequency detector with subtraction-based phase comparator for frequency modulation atomic force microscopy.

Mitani Y, Kubo M, Muramoto K, Fukuma T.

Rev Sci Instrum. 2009 Aug;80(8):083705. doi: 10.1063/1.3212670.

PMID:
19725660
7.

Study of a nanoscale water cluster by atomic force microscopy.

Lee M, Sung B, Hashemi N, Jhe W.

Faraday Discuss. 2009;141:415-21; discussion 443-65.

PMID:
19227368
8.

Quartz tuning fork studies on the surface properties of Pseudomonas aeruginosa during early stages of biofilm formation.

Otero J, Baños R, González L, Torrents E, Juárez A, Puig-Vidal M.

Colloids Surf B Biointerfaces. 2013 Feb 1;102:117-23. doi: 10.1016/j.colsurfb.2012.08.013. Epub 2012 Aug 19.

PMID:
23018019
9.

Angled long tip to tuning fork probes for atomic force microscopy in various environments.

Higuchi S, Kuramochi H, Kubo O, Masuda S, Shingaya Y, Aono M, Nakayama T.

Rev Sci Instrum. 2011 Apr;82(4):043701. doi: 10.1063/1.3569765.

PMID:
21529007
10.

Effective stiffness of qPlus sensor and quartz tuning fork.

Kim J, Won D, Sung B, An S, Jhe W.

Ultramicroscopy. 2014 Jun;141:56-62. doi: 10.1016/j.ultramic.2014.03.009. Epub 2014 Mar 21.

PMID:
24727200
11.

Scanning hall probe microscopy (SHPM) using quartz crystal AFM feedback.

Dede M, Urkmen K, Girişen O, Atabak M, Oral A, Farrer I, Ritchie D.

J Nanosci Nanotechnol. 2008 Feb;8(2):619-22.

PMID:
18464380
12.

Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy.

Akiyama T, de Rooij NF, Staufer U, Detterbeck M, Braendlin D, Waldmeier S, Scheidiger M.

Rev Sci Instrum. 2010 Jun;81(6):063706. doi: 10.1063/1.3455219.

PMID:
20590245
13.

Mechanically stable tuning fork sensor with high quality factor for the atomic force microscope.

Kim K, Park JY, Kim KB, Lee N, Seo Y.

Scanning. 2014 Nov-Dec;36(6):632-9. doi: 10.1002/sca.21169. Epub 2014 Sep 17.

PMID:
25229367
14.
15.

Force-gradient-induced mechanical dissipation of quartz tuning fork force sensors used in atomic force microscopy.

Castellanos-Gomez A, Agraït N, Rubio-Bollinger G.

Ultramicroscopy. 2011 Feb;111(3):186-90. doi: 10.1016/j.ultramic.2010.11.032. Epub 2010 Nov 30.

PMID:
21333855
16.

Low-volume liquid delivery and nanolithography using a nanopipette combined with a quartz tuning fork-atomic force microscope.

An S, Stambaugh C, Kim G, Lee M, Kim Y, Lee K, Jhe W.

Nanoscale. 2012 Oct 21;4(20):6493-500.

PMID:
22960993
17.

Frequency modulation atomic force microscopy in ambient environments utilizing robust feedback tuning.

Kilpatrick JI, Gannepalli A, Cleveland JP, Jarvis SP.

Rev Sci Instrum. 2009 Feb;80(2):023701. doi: 10.1063/1.3073964.

PMID:
19256647
18.

FM-AFM constant height imaging and force curves: high resolution study of DNA-tip interactions.

Cerreta A, Vobornik D, Di Santo G, Tobenas S, Alonso-Sarduy L, Adamcik J, Dietler G.

J Mol Recognit. 2012 Sep;25(9):486-93. doi: 10.1002/jmr.2212.

PMID:
22899592
19.

Spatial horizons in amplitude and frequency modulation atomic force microscopy.

Font J, Santos S, Barcons V, Thomson NH, Verdaguer A, Chiesa M.

Nanoscale. 2012 Apr 7;4(7):2463-9. doi: 10.1039/c2nr12012g. Epub 2012 Feb 28.

PMID:
22374226
20.

Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy.

Kobayashi K, Yamada H, Matsushige K.

Rev Sci Instrum. 2011 Mar;82(3):033702. doi: 10.1063/1.3557416.

PMID:
21456746

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