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Items: 1 to 20 of 145

1.

Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry.

Matsuyama S, Yokoyama H, Fukui R, Kohmura Y, Tamasaku K, Yabashi M, Yashiro W, Momose A, Ishikawa T, Yamauchi K.

Opt Express. 2012 Oct 22;20(22):24977-86. doi: 10.1364/OE.20.024977.

PMID:
23187264
2.

Wavefield characterization of nearly diffraction-limited focused hard x-ray beam with size less than 10 nm.

Kimura T, Mimura H, Handa S, Yumoto H, Yokoyama H, Imai S, Matsuyama S, Sano Y, Tamasaku K, Komura Y, Nishino Y, Yabashi M, Ishikawa T, Yamauchi K.

Rev Sci Instrum. 2010 Dec;81(12):123704. doi: 10.1063/1.3509384.

PMID:
21198029
3.

Single-nanometer focusing of hard x-rays by Kirkpatrick-Baez mirrors.

Yamauchi K, Mimura H, Kimura T, Yumoto H, Handa S, Matsuyama S, Arima K, Sano Y, Yamamura K, Inagaki K, Nakamori H, Kim J, Tamasaku K, Nishino Y, Yabashi M, Ishikawa T.

J Phys Condens Matter. 2011 Oct 5;23(39):394206. doi: 10.1088/0953-8984/23/39/394206.

PMID:
21921317
4.

X-ray grating interferometer for in situ and at-wavelength wavefront metrology.

Kayser Y, David C, Flechsig U, Krempasky J, Schlott V, Abela R.

J Synchrotron Radiat. 2017 Jan 1;24(Pt 1):150-162. doi: 10.1107/S1600577516017562.

PMID:
28009554
5.

Wavefront metrology measurements at SACLA by means of X-ray grating interferometry.

Kayser Y, Rutishauser S, Katayama T, Ohashi H, Kameshima T, Flechsig U, Yabashi M, David C.

Opt Express. 2014 Apr 21;22(8):9004-15. doi: 10.1364/OE.22.009004.

PMID:
24787789
6.

Hard X-ray nanofocusing using adaptive focusing optics based on piezoelectric deformable mirrors.

Goto T, Nakamori H, Kimura T, Sano Y, Kohmura Y, Tamasaku K, Yabashi M, Ishikawa T, Yamauchi K, Matsuyama S.

Rev Sci Instrum. 2015 Apr;86(4):043102. doi: 10.1063/1.4916617.

PMID:
25933836
7.

Heat bump on a monochromator crystal measured with X-ray grating interferometry.

Rutishauser S, Rack A, Weitkamp T, Kayser Y, David C, Macrander AT.

J Synchrotron Radiat. 2013 Mar;20(Pt 2):300-5. doi: 10.1107/S0909049513001817.

PMID:
23412487
8.

Wave-optical evaluation of interference fringes and wavefront phase in a hard-x-ray beam totally reflected by mirror optics.

Yamauchi K, Yamamura K, Mimura H, Sano Y, Saito A, Endo K, Souvorov A, Yabashi M, Tamasaku K, Ishikawa T, Mori Y.

Appl Opt. 2005 Nov 10;44(32):6927-32.

PMID:
16294968
9.

On the origin of visibility contrast in x-ray Talbot interferometry.

Yashiro W, Terui Y, Kawabata K, Momose A.

Opt Express. 2010 Aug 2;18(16):16890-901. doi: 10.1364/OE.18.016890.

PMID:
20721081
10.

Wave-optical simulation of hard-x-ray nanofocusing by precisely figured elliptical mirrors.

Kewish CM, Assoufid L, Macrander AT, Qian J.

Appl Opt. 2007 Apr 10;46(11):2010-21.

PMID:
17384715
11.

Nearly diffraction-limited line focusing of a hard-X-ray beam with an elliptically figured mirror.

Yamauchi K, Yamamura K, Mimura H, Sano Y, Saito A, Souvorov A, Yabashi M, Tamasaku K, Ishikawa T, Mori Y.

J Synchrotron Radiat. 2002 Sep 1;9(Pt 5):313-6.

PMID:
12200576
12.

Efficiency of capturing a phase image using cone-beam x-ray Talbot interferometry.

Yashiro W, Takeda Y, Momose A.

J Opt Soc Am A Opt Image Sci Vis. 2008 Aug;25(8):2025-39.

PMID:
18677365
13.

Partially coherent nano-focused x-ray radiation characterized by Talbot interferometry.

Salditt T, Kalbfleisch S, Osterhoff M, Krüger SP, Bartels M, Giewekemeyer K, Neubauer H, Sprung M.

Opt Express. 2011 May 9;19(10):9656-75. doi: 10.1364/OE.19.009656.

PMID:
21643224
14.

Image quality improvement in a hard X-ray projection microscope using total reflection mirror optics.

Mimura H, Yamauchi K, Yamamura K, Kubota A, Matsuyama S, Sano Y, Ueno K, Endo K, Nishino Y, Tamasaku K, Yabashi M, Ishikawa T, Mori Y.

J Synchrotron Radiat. 2004 Jul 1;11(Pt 4):343-6.

PMID:
15211041
15.

Generation of hard X-rays using an ultrafast fiber laser system.

Liao KH, Mordovanakis AG, Hou B, Chang G, Rever M, Mourou GA, Nees J, Galvanauskas A.

Opt Express. 2007 Oct 17;15(21):13942-8.

PMID:
19550667
16.

Fast optimization of a bimorph mirror using x-ray grating interferometry.

Wang H, Sawhney K, Berujon S, Sutter J, Alcock SG, Wagner U, Rau C.

Opt Lett. 2014 Apr 15;39(8):2518-21. doi: 10.1364/OL.39.002518.

PMID:
24979033
17.

The second-order differential phase contrast and its retrieval for imaging with x-ray Talbot interferometry.

Yang Y, Tang X.

Med Phys. 2012 Dec;39(12):7237-53. doi: 10.1118/1.4764901.

PMID:
23231275
18.

Partially coherent X-ray wavefront propagation simulations including grazing-incidence focusing optics.

Canestrari N, Chubar O, Reininger R.

J Synchrotron Radiat. 2014 Sep;21(Pt 5):1110-21. doi: 10.1107/S1600577514013058.

PMID:
25178000
19.

Reconstruction of an astigmatic hard X-ray beam and alignment of K-B mirrors from ptychographic coherent diffraction data.

Kewish CM, Guizar-Sicairos M, Liu C, Qian J, Shi B, Benson C, Khounsary AM, Vila-Comamala J, Bunk O, Fienup JR, Macrander AT, Assoufid L.

Opt Express. 2010 Oct 25;18(22):23420-7. doi: 10.1364/OE.18.023420.

PMID:
21164684
20.

Wavefront metrology for coherent hard X-rays by scanning a microsphere.

Skjønsfjell ET, Chushkin Y, Zontone F, Patil N, Gibaud A, Breiby DW.

Opt Express. 2016 May 16;24(10):10710-22. doi: 10.1364/OE.24.010710.

PMID:
27409892
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