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Items: 1 to 20 of 162

1.

Flat ion milling: a powerful tool for preparation of cross-sections of lead-silver alloys.

Brodusch N, Boisvert S, Gauvin R.

Microscopy (Oxf). 2013 Jun;62(3):411-8. doi: 10.1093/jmicro/dfs077. Epub 2012 Nov 16.

PMID:
23160362
2.

Electron backscatter diffraction applied to lithium sheets prepared by broad ion beam milling.

Brodusch N, Zaghib K, Gauvin R.

Microsc Res Tech. 2015 Jan;78(1):30-9. doi: 10.1002/jemt.22441. Epub 2014 Oct 3.

PMID:
25280344
3.

Analysis of FIB-induced damage by electron channelling contrast imaging in the SEM.

Gutierrez-Urrutia I.

J Microsc. 2017 Jan;265(1):51-59. doi: 10.1111/jmi.12462. Epub 2016 Aug 22.

PMID:
27546033
4.
5.

Electron channeling contrast imaging of plastic deformation induced by indentation in polycrystalline nickel.

Kaboli S, Goldbaum D, Chromik RR, Gauvin R.

Microsc Microanal. 2013 Dec;19(6):1620-31. doi: 10.1017/S1431927613013469. Epub 2013 Oct 11.

PMID:
24119314
6.

Ion beam polishing for three-dimensional electron backscattered diffraction.

Saowadee N, Agersted K, Ubhi HS, Bowen JR.

J Microsc. 2013 Jan;249(1):36-40. doi: 10.1111/j.1365-2818.2012.03677.x. Epub 2012 Nov 5.

7.

Metallographic preparation of Zn-21Al-2Cu alloy for analysis by electron backscatter diffraction (EBSD).

Rodríguez-Hernández MG, Martínez-Flores EE, Torres-Villaseñor G, Escalera MD.

Microsc Microanal. 2014 Aug;20(4):1276-83. doi: 10.1017/S1431927614000397. Epub 2014 Mar 31.

PMID:
24685337
8.

Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling.

Eberg E, Monsen AF, Tybell T, van Helvoort AT, Holmestad R.

J Electron Microsc (Tokyo). 2008 Dec;57(6):175-9. doi: 10.1093/jmicro/dfn018. Epub 2008 Sep 24.

PMID:
18815212
9.

Effects of focused ion beam milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconia.

Saowadee N, Agersted K, Bowen JR.

J Microsc. 2012 Jun;246(3):279-86. doi: 10.1111/j.1365-2818.2012.03616.x.

10.

Dependence of the electron beam energy and types of surface to determine EBSD indexing reliability in yttria-stabilized zirconia.

Saraf LV.

Microsc Microanal. 2012 Apr;18(2):371-8. doi: 10.1017/S1431927611012815. Epub 2012 Feb 16.

PMID:
22336075
11.

Microstructural characterization of Ti-6Al-4V alloy subjected to the duplex SMAT/plasma nitriding.

Pi Y, Faure J, Agoda-Tandjawa G, Andreazza C, Potiron S, Levesque A, Demangel C, Retraint D, Benhayoune H.

Microsc Res Tech. 2013 Sep;76(9):897-903. doi: 10.1002/jemt.22245. Epub 2013 Jun 14.

PMID:
23766242
12.

Material sensitive scanning probe microscopy of subsurface semiconductor nanostructures via beam exit Ar ion polishing.

Kolosov OV, Grishin I, Jones R.

Nanotechnology. 2011 May 6;22(18):185702. doi: 10.1088/0957-4484/22/18/185702. Epub 2011 Mar 17.

PMID:
21415470
13.

Efficient cross-section preparation method for high-resolution imaging of hard polymer composites with a scanning electron microscope.

Brodusch N, Yourdkhani M, Hubert P, Gauvin R.

J Microsc. 2015 Nov;260(2):117-24. doi: 10.1111/jmi.12273. Epub 2015 Jun 22.

PMID:
26098996
14.

Preparation of metallic samples for electron backscatter diffraction and its influence on measured misorientation.

Koll L, Tsipouridis P, Werner EA.

J Microsc. 2011 Aug;243(2):206-19. doi: 10.1111/j.1365-2818.2011.03495.x. Epub 2011 Mar 28.

15.

Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope.

Brodusch N, Demers H, Gauvin R.

Ultramicroscopy. 2015 Jan;148:123-31. doi: 10.1016/j.ultramic.2014.09.005. Epub 2014 Oct 22.

PMID:
25461589
16.
17.

Evaluation of neon focused ion beam milling for TEM sample preparation.

Pekin TC, Allen FI, Minor AM.

J Microsc. 2016 Oct;264(1):59-63. doi: 10.1111/jmi.12416. Epub 2016 May 12.

PMID:
27172066
18.

The backscatter electron signal as an additional tool for phase segmentation in electron backscatter diffraction.

Payton EJ, Nolze G.

Microsc Microanal. 2013 Aug;19(4):929-41. doi: 10.1017/S1431927613000305. Epub 2013 Apr 10.

PMID:
23575349
19.

Optimization of the preparation of GaN-based specimens with low-energy ion milling for (S)TEM.

Mehrtens T, Bley S, Venkata Satyam P, Rosenauer A.

Micron. 2012 Aug;43(8):902-9. doi: 10.1016/j.micron.2012.03.008. Epub 2012 Mar 20.

PMID:
22475986
20.

Ultrathin specimen preparation by a low-energy Ar-ion milling method.

Mitome M.

Microscopy (Oxf). 2013 Apr;62(2):321-6. doi: 10.1093/jmicro/dfs073. Epub 2012 Nov 14.

PMID:
23155112

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