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Items: 1 to 20 of 88

1.

On-chip stress relaxation testing method for freestanding thin film materials.

Coulombier M, Guisbiers G, Colla MS, Vayrette R, Raskin JP, Pardoen T.

Rev Sci Instrum. 2012 Oct;83(10):105004. doi: 10.1063/1.4758288.

PMID:
23126797
2.

Measuring glassy and viscoelastic polymer flow in molecular-scale gaps using a flat punch mechanical probe.

Rowland HD, King WP, Cross GL, Pethica JB.

ACS Nano. 2008 Mar;2(3):419-28. doi: 10.1021/nn700211g.

PMID:
19206565
3.

Room temperature amorphous to nanocrystalline transformation in ultra-thin films under tensile stress: an in situ TEM study.

Manoharan MP, Kumar S, Haque MA, Rajagopalan R, Foley HC.

Nanotechnology. 2010 Dec 17;21(50):505707. doi: 10.1088/0957-4484/21/50/505707. Epub 2010 Nov 23.

PMID:
21098951
4.

Elastic modulus of a silicon thin film fabricated by nanotransfer printing.

Choi HJ, Kim JH, Jang B, Lee HJ, Kim DP.

J Nanosci Nanotechnol. 2011 Jul;11(7):5834-8.

PMID:
22121616
5.

Atomic layer deposition ultrathin film origami using focused ion beams.

Supekar OD, Brown JJ, Eigenfeld NT, Gertsch JC, Bright VM.

Nanotechnology. 2016 Dec 9;27(49):49LT02. Epub 2016 Nov 11.

PMID:
27834312
6.

Quasi-linear viscoelastic modeling of arterial wall for surgical simulation.

Yang T, Chui CK, Yu RQ, Qin J, Chang SK.

Int J Comput Assist Radiol Surg. 2011 Nov;6(6):829-38. doi: 10.1007/s11548-011-0560-x. Epub 2011 Apr 13.

PMID:
21487834
7.

Variable temperature thin film indentation with a flat punch.

Cross GL, O'Connell BS, Pethica JB, Rowland H, King WP.

Rev Sci Instrum. 2008 Jan;79(1):013904. doi: 10.1063/1.2830028.

PMID:
18248047
8.

In situ stress evolution during and after sputter deposition of Al thin films.

Pletea M, Koch R, Wendrock H, Kaltofen R, Schmidt OG.

J Phys Condens Matter. 2009 Jun 3;21(22):225008. doi: 10.1088/0953-8984/21/22/225008. Epub 2009 May 11.

PMID:
21715772
9.

Structure, stresses and stress relaxation of TiN/Ag nanocomposite films.

Köstenbauer H, Fontalvo GA, Mitterer C, Hlawacek G, Teichert C, Keckes J.

J Nanosci Nanotechnol. 2009 Jun;9(6):3606-10.

PMID:
19504889
10.

Residual stress in sputtered gold films on quartz measured by the cantilever beam deflection technique.

Thornell G, Ericson F, Hedlund C, Ohrmaim J, Schweitz JA, Portnoff G.

IEEE Trans Ultrason Ferroelectr Freq Control. 1999;46(4):981-92. doi: 10.1109/58.775665.

PMID:
18238503
11.

Note: A single specimen channel crack growth technique applied to brittle thin films on polymer substrates.

Kim K, Graham S, Pierron ON.

Rev Sci Instrum. 2017 Mar;88(3):036102. doi: 10.1063/1.4977473.

PMID:
28372385
12.

Dislocation-mediated relaxation in nanograined columnar palladium films revealed by on-chip time-resolved HRTEM testing.

Colla MS, Amin-Ahmadi B, Idrissi H, Malet L, Godet S, Raskin JP, Schryvers D, Pardoen T.

Nat Commun. 2015 Jan 5;6:5922. doi: 10.1038/ncomms6922.

13.

Measuring electro-mechanical properties of thin films on polymer substrates.

Cordill MJ, Glushko O, Kreith J, Marx VM, Kirchlechner C.

Microelectron Eng. 2015 Apr 2;137:96-100.

14.

In situ deformation of thin films on substrates.

Legros M, Cabié M, Gianola DS.

Microsc Res Tech. 2009 Mar;72(3):270-83. doi: 10.1002/jemt.20680.

PMID:
19189313
15.

Quantifying residual stress in nanoscale thin polymer films via surface wrinkling.

Chung JY, Chastek TQ, Fasolka MJ, Ro HW, Stafford CM.

ACS Nano. 2009 Apr 28;3(4):844-52. doi: 10.1021/nn800853y.

PMID:
19298053
16.

Structure analysis of sputter-coated and ion-beam sputter-coated films: a comparative study.

Kemmenoe BH, Bullock GR.

J Microsc. 1983 Nov;132(Pt 2):153-63.

PMID:
6358510
17.

Bone bonding strength of sputtered hydroxyapatite films subjected to a low temperature hydrothermal treatment.

Ozeki K, Mishima A, Yuhta T, Fukui Y, Aoki H.

Biomed Mater Eng. 2003;13(4):451-63.

PMID:
14646059
18.

The relation between collagen fibril kinematics and mechanical properties in the mitral valve anterior leaflet.

Liao J, Yang L, Grashow J, Sacks MS.

J Biomech Eng. 2007 Feb;129(1):78-87.

PMID:
17227101
19.

Mechanical characterization between room temperature and 1000 °C of SiC free-standing thin films by a novel high-temperature micro-tensile setup.

Leisen D, Rusanov R, Rohlfing F, Fuchs T, Eberl C, Riesch-Oppermann H, Kraft O.

Rev Sci Instrum. 2015 May;86(5):055104. doi: 10.1063/1.4919765.

PMID:
26026555
20.

Bandgap control using strained beam structures for Si photonic devices.

Yoshimoto K, Suzuki R, Ishikawa Y, Wada K.

Opt Express. 2010 Dec 6;18(25):26492-8. doi: 10.1364/OE.18.026492.

PMID:
21165000

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