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Items: 1 to 20 of 79

1.

Chain-length dependent growth dynamics of n-alkanes on silica investigated by energy-dispersive x-ray reflectivity in situ and in real-time.

Weber C, Frank C, Bommel S, Rukat T, Leitenberger W, Schäfer P, Schreiber F, Kowarik S.

J Chem Phys. 2012 May 28;136(20):204709. doi: 10.1063/1.4719530.

PMID:
22667583
2.

The thermotropic phase behaviour and phase structure of a homologous series of racemic beta-D-galactosyl dialkylglycerols studied by differential scanning calorimetry and X-ray diffraction.

Mannock DA, Collins MD, Kreichbaum M, Harper PE, Gruner SM, McElhaney RN.

Chem Phys Lipids. 2007 Jul;148(1):26-50. Epub 2007 Apr 19.

PMID:
17524381
3.

Structure and growth of vapor-deposited n-dotriacontane films studied by X-ray reflectivity.

del Campo V, Cisternas E, Taub H, Vergara I, Corrales T, Soza P, Volkmann UG, Bai M, Wang SK, Hansen FY, Mo H, Ehrlich SN.

Langmuir. 2009 Nov 17;25(22):12962-7. doi: 10.1021/la901808t.

PMID:
19583228
4.

Temperature dependence of the structure of Langmuir films of normal-alkanes on liquid mercury.

Kraack H, Ocko BM, Pershan PS, Tamam L, Deutsch M.

J Chem Phys. 2004 Oct 22;121(16):8003-9.

PMID:
15485263
5.

Comparative X-ray standing wave analysis of metal-phosphonate multilayer films of dodecane and porphyrin molecular square.

Libera JA, Gurney RW, Schwartz C, Jin H, Lee TL, Nguyen ST, Hupp JT, Bedzyk MJ.

J Phys Chem B. 2005 Feb 3;109(4):1441-50.

PMID:
16851115
6.

In-situ X-ray reflectivity study of alkane films grown from the vapor phase.

Basu S, Satija SK.

Langmuir. 2007 Jul 31;23(16):8331-5. Epub 2007 Jun 30.

PMID:
17602677
7.

Structural rearrangements during the initial growth stages of organic thin films of F16CuPc on SiO2.

de Oteyza DG, Barrena E, Sellner S, Ossó JO, Dosch H.

J Phys Chem B. 2006 Aug 24;110(33):16618-23.

PMID:
16913797
8.

Solid-solid phase transition of n-alkanes in multiple nanoscale confinement.

Jiang K, Xie B, Fu D, Luo F, Liu G, Su Y, Wang D.

J Phys Chem B. 2010 Jan 28;114(3):1388-92. doi: 10.1021/jp9111475.

PMID:
20025209
9.
10.

Effect of chain length and substrate temperature on the growth and morphology of n-alkane thin films.

Fu J, Urquhart SG.

Langmuir. 2007 Feb 27;23(5):2615-22. Epub 2007 Feb 1.

PMID:
17266340
11.
12.

Molecular ordering and phase transitions in alkanol monolayers at the water-hexane interface.

Tikhonov AM, Pingali SV, Schlossman ML.

J Chem Phys. 2004 Jun 22;120(24):11822-38.

PMID:
15268217
13.

Temperature- and time-resolved X-ray scattering at thin organic films.

Bodenthin Y, Grenzer J, Lauter R, Pietsch U, Lehmann P, Kurth DG, Möhwald H.

J Synchrotron Radiat. 2002 Jul 1;9(Pt 4):206-9. Epub 2002 Jun 30.

PMID:
12091727
14.

Linear dichroism in the X-ray absorption spectra of linear n-alkanes.

Fu J, Urquhart SG.

J Phys Chem A. 2005 Dec 29;109(51):11724-32.

PMID:
16366622
15.

Multiscale modeling of self-assembled monolayers of thiophenes on electronic material surfaces.

Haran M, Goose JE, Clote NP, Clancy P.

Langmuir. 2007 Apr 24;23(9):4897-909. Epub 2007 Mar 31.

PMID:
17397195
16.

Effect of the molecular structure on the hierarchical self-assembly of semifluorinated alkanes at the air/water interface.

de Viguerie L, Keller R, Jonas U, Berger R, Clark CG Jr, Klein CO, Geue T, Müllen K, Butt HJ, Vlassopoulos D.

Langmuir. 2011 Jul 19;27(14):8776-86. doi: 10.1021/la201377f. Epub 2011 Jun 14.

PMID:
21671602
18.

Structure and phase transitions of monolayers of intermediate-length n-alkanes on graphite studied by neutron diffraction and molecular dynamics simulation.

Diama A, Matthies B, Herwig KW, Hansen FY, Criswell L, Mo H, Bai M, Taub H.

J Chem Phys. 2009 Aug 28;131(8):084707. doi: 10.1063/1.3212095.

PMID:
19725621
19.

n-Alkane adsorption to polar silica surfaces.

Brindza MR, Ding F, Fourkas JT, Walker RA.

J Chem Phys. 2010 Mar 21;132(11):114701. doi: 10.1063/1.3336727.

PMID:
20331310
20.

Rate constants for OH with selected large alkanes: shock-tube measurements and an improved group scheme.

Sivaramakrishnan R, Michael JV.

J Phys Chem A. 2009 Apr 30;113(17):5047-60. doi: 10.1021/jp810987u.

PMID:
19348456

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