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Items: 1 to 20 of 92

1.

Fabrication of CoPt ultra-sharp single atom tips.

Fu TY, Chiang CL, Lin RJ, Hou JL, Hwang IS, Tsong TT.

J Nanosci Nanotechnol. 2011 Dec;11(12):10687-90.

PMID:
22408974
2.

Implementation of atomically defined field ion microscopy tips in scanning probe microscopy.

Paul W, Miyahara Y, Grütter P.

Nanotechnology. 2012 Aug 24;23(33):335702. doi: 10.1088/0957-4484/23/33/335702. Epub 2012 Aug 3.

PMID:
22863750
3.

Structure and stability of semiconductor tip apexes for atomic force microscopy.

Pou P, Ghasemi SA, Jelinek P, Lenosky T, Goedecker S, Perez R.

Nanotechnology. 2009 Jul 1;20(26):264015. doi: 10.1088/0957-4484/20/26/264015. Epub 2009 Jun 10.

PMID:
19509446
4.

Reproducible tip fabrication and cleaning for UHV STM.

Yu ZQ, Wang CM, Du Y, Thevuthasan S, Lyubinetsky I.

Ultramicroscopy. 2008 Aug;108(9):873-7. doi: 10.1016/j.ultramic.2008.02.010. Epub 2008 Mar 13.

PMID:
18439760
5.

A single-atom sharp iridium tip as an emitter of gas field ion sources.

Kuo HS, Hwang IS, Fu TY, Hwang YS, Lu YH, Lin CY, Hou JL, Tsong TT.

Nanotechnology. 2009 Aug 19;20(33):335701. doi: 10.1088/0957-4484/20/33/335701. Epub 2009 Jul 28.

PMID:
19636091
6.

Diamond-modified AFM probes: from diamond nanowires to atomic force microscopy-integrated boron-doped diamond electrodes.

Smirnov W, Kriele A, Hoffmann R, Sillero E, Hees J, Williams OA, Yang N, Kranz C, Nebel CE.

Anal Chem. 2011 Jun 15;83(12):4936-41. doi: 10.1021/ac200659e. Epub 2011 May 18.

PMID:
21534601
8.

Tungsten nanotip fabrication by spatially controlled field-assisted reaction with nitrogen.

Rezeq M, Pitters J, Wolkow R.

J Chem Phys. 2006 May 28;124(20):204716.

PMID:
16774373
9.

A density-functional theory study of tip electronic structures in scanning tunneling microscopy.

Choi H, Longo RC, Huang M, Randall JN, Wallace RM, Cho K.

Nanotechnology. 2013 Mar 15;24(10):105201. doi: 10.1088/0957-4484/24/10/105201. Epub 2013 Feb 15.

PMID:
23416430
10.

Reliable lateral and vertical manipulations of a single Cu adatom on a Cu(111) surface with multi-atom apex tip: semiempirical and first-principles simulations.

Xie Y, Liu Q, Zhang P, Zhang W, Wang S, Zhuang M, Li Y, Gan F, Zhuang J.

Nanotechnology. 2008 Aug 20;19(33):335710. doi: 10.1088/0957-4484/19/33/335710. Epub 2008 Jul 8.

PMID:
21730636
11.

Two-photon photopolymerized tips for adhesion-free scanning-probe microscopy.

Kim JM, Muramatsu H.

Nano Lett. 2005 Feb;5(2):309-14.

PMID:
15794617
12.

Fabrication of ball-shaped atomic force microscope tips by ion-beam-induced deposition of platinum on multiwall carbon nanotubes.

Kahng YH, Choi J, Jeong K, Park BC, Kim DH, Lyou J, Lee JJ, Lee H, Lee T, Ahn SJ.

Ultramicroscopy. 2009 Dec;110(1):82-8. doi: 10.1016/j.ultramic.2009.09.011. Epub 2009 Sep 30.

PMID:
19853998
13.

High-resolution noncontact atomic force microscopy.

Pérez R, García R, Schwarz U.

Nanotechnology. 2009 Jul 1;20(26):260201. doi: 10.1088/0957-4484/20/26/260201. Epub 2009 Jun 10.

PMID:
19531843
14.

Magnetic exchange force microscopy with atomic resolution.

Kaiser U, Schwarz A, Wiesendanger R.

Nature. 2007 Mar 29;446(7135):522-5.

PMID:
17392782
15.

Optimal ferromagnetically-coated carbon nanotube tips for ultra-high resolution magnetic force microscopy.

Lisunova Y, Heidler J, Levkivskyi I, Gaponenko I, Weber A, Caillier Ch, Heyderman LJ, Kläui M, Paruch P.

Nanotechnology. 2013 Mar 15;24(10):105705. doi: 10.1088/0957-4484/24/10/105705. Epub 2013 Feb 20.

PMID:
23426040
16.

Aspect-ratio and lateral-resolution enhancement in force microscopy by attaching nanoclusters generated by an ion cluster source at the end of a silicon tip.

Martínez L, Tello M, Díaz M, Román E, Garcia R, Huttel Y.

Rev Sci Instrum. 2011 Feb;82(2):023710. doi: 10.1063/1.3556788.

PMID:
21361604
17.

Simultaneous STM and UHV electron microscope observation of silicon nanowires extracted from Si(111) surface

Naitoh Y, Takayanagi K, Oshima Y, Hirayama H.

J Electron Microsc (Tokyo). 2000;49(2):211-6.

PMID:
11108043
18.

Fabrication of [001]-oriented tungsten tips for high resolution scanning tunneling microscopy.

Chaika AN, Orlova NN, Semenov VN, Postnova EY, Krasnikov SA, Lazarev MG, Chekmazov SV, Aristov VY, Glebovsky VG, Bozhko SI, Shvets IV.

Sci Rep. 2014 Jan 17;4:3742. doi: 10.1038/srep03742.

19.

Sharp high-aspect-ratio AFM tips fabricated by a combination of deep reactive ion etching and focused ion beam techniques.

Caballero D, Villanueva G, Plaza JA, Mills CA, Samitier J, Errachid A.

J Nanosci Nanotechnol. 2010 Jan;10(1):497-501.

PMID:
20352882
20.

The manufacturing of a metallic nano-cluster at a tip apex for field-sensitive microscopy applications.

Lin HM, Chang MN, Lin YS, Cheng CC.

J Nanosci Nanotechnol. 2010 Jul;10(7):4459-64.

PMID:
21128440

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