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Items: 1 to 20 of 88

1.

SiOx/SiNy multilayers for photovoltaic and photonic applications.

Nalini RP, Khomenkova L, Debieu O, Cardin J, Dufour C, Carrada M, Gourbilleau F.

Nanoscale Res Lett. 2012 Feb 14;7:124. doi: 10.1186/1556-276X-7-124.

2.
3.

Structural and emission properties of Tb3+-doped nitrogen-rich silicon oxynitride films.

Labbé C, An YT, Zatryb G, Portier X, Podhorodecki A, Marie P, Frilay C, Cardin J, Gourbilleau F.

Nanotechnology. 2017 Mar 17;28(11):115710. doi: 10.1088/1361-6528/aa5ca0. Epub 2017 Jan 31.

PMID:
28140358
4.

Phase transformation in SiOx/SiO₂ multilayers for optoelectronics and microelectronics applications.

Roussel M, Talbot E, Pratibha Nalini R, Gourbilleau F, Pareige P.

Ultramicroscopy. 2013 Sep;132:290-4. doi: 10.1016/j.ultramic.2012.10.013. Epub 2012 Nov 12.

PMID:
23286962
5.

New Si-based multilayers for solar cell applications.

Nalini RP, Dufour C, Cardin J, Gourbilleau F.

Nanoscale Res Lett. 2011 Feb 18;6(1):156. doi: 10.1186/1556-276X-6-156.

6.

Evolution of vibrational modes of SiO2 during the formation of Ge and Si nanocrystals by ion implantation and magnetron sputtering.

Imer AG, Yerci S, Alagoz AS, Kulakci M, Serincan U, Finstad TG, Turan R.

J Nanosci Nanotechnol. 2010 Jan;10(1):525-31.

PMID:
20352887
7.

Structural and optical properties of silicon nanocrystals grown by plasma-enhanced chemical vapor deposition.

Prakash GV, Daldosso N, Degoli E, Iacona F, Cazzanelli M, Gaburro Z, Pucker G, Dalba P, Rocca F, Ceretta Moreira E, Franzò G, Pacifici D, Priolo F, Arcangeli C, Filonov AB, Ossicini S, Pavesi L.

J Nanosci Nanotechnol. 2001 Jun;1(2):159-68.

PMID:
12914047
8.

Structural and compositional properties of Er-doped silicon nanoclusters/oxides for multilayered photonic devices studied by STEM-EELS.

Eljarrat A, López-Conesa L, Rebled JM, Berencén Y, Ramírez JM, Garrido B, Magén C, Estradé S, Peiró F.

Nanoscale. 2013 Oct 21;5(20):9963-70. doi: 10.1039/c3nr02754f.

PMID:
23989957
9.

Stacked Ge nanocrystals with ultrathin SiO₂ separation layers.

Zschintzsch M, von Borany J, Jeutter NM, Mücklich A.

Nanotechnology. 2011 Nov 18;22(46):465302. doi: 10.1088/0957-4484/22/46/465302. Epub 2011 Oct 27.

PMID:
22032974
10.

Size confinement of Si nanocrystals in multinanolayer structures.

Limpens R, Lesage A, Fujii M, Gregorkiewicz T.

Sci Rep. 2015 Nov 25;5:17289. doi: 10.1038/srep17289.

12.

a-Si:H/SiO2 multilayer films fabricated by radio-frequency magnetron sputtering for optical filters.

Yoda H, Shiraishi K, Hiratani Y, Hanaizumi O.

Appl Opt. 2004 Jun 10;43(17):3548-54.

PMID:
15219039
13.

Electrical behavior of MIS devices based on Si nanoclusters embedded in SiOxNy and SiO2 films.

Jacques E, Pichon L, Debieu O, Gourbilleau F.

Nanoscale Res Lett. 2011 Feb 24;6(1):170. doi: 10.1186/1556-276X-6-170.

14.

a-SiOx<Er> active photonic crystal resonator membrane fabricated by focused Ga+ ion beam.

Figueira DS, Barea LA, Vallini F, Jarschel PF, Lang R, Frateschi NC.

Opt Express. 2012 Aug 13;20(17):18772-83. doi: 10.1364/OE.20.018772.

PMID:
23038517
15.

Structural Investigation of AlN/SiOx Nanocomposite Hard Coatings Fabricated by Differential Pumping Cosputtering.

Kawasaki M, Nose M, Onishi I, Shiojiri M.

Microsc Microanal. 2016 Jun;22(3):673-8. doi: 10.1017/S1431927616000611. Epub 2016 Apr 12.

PMID:
27070831
16.

Intense ultraviolet-blue photoluminescence from SiO2 embedded ge nanocrystals prepared by different techniques.

Giri PK, Bhattacharyya S, Kesavamoorthy R, Panigrahi BK, Nair KG.

J Nanosci Nanotechnol. 2009 Sep;9(9):5389-95.

PMID:
19928230
17.

Correlation between matrix structural order and compressive stress exerted on silicon nanocrystals embedded in silicon-rich silicon oxide.

Zatryb G, Podhorodecki A, Misiewicz J, Cardin J, Gourbilleau F.

Nanoscale Res Lett. 2013 Jan 21;8(1):40. doi: 10.1186/1556-276X-8-40.

18.

Ge-Si-O phase separation and Ge nanocrystal growth in Ge:SiO(x)/SiO(2) multilayers--a new dc magnetron approach.

Zschintzsch M, Sahle CJ, Borany Jv, Sternemann C, Mücklich A, Nyrow A, Schwamberger A, Tolan M.

Nanotechnology. 2011 Dec 2;22(48):485303. doi: 10.1088/0957-4484/22/48/485303. Epub 2011 Nov 9.

PMID:
22071321
19.

Novel alignment mechanism of liquid crystal on a hydrogenated amorphous silicon oxide.

Kim KC, Ahn HJ, Kim JB, Hwang BH, Baik HK.

Langmuir. 2005 Nov 22;21(24):11079-84.

PMID:
16285774
20.

Investigation of bonding characteristics between Si quantum dots and a SiO2 matrix.

Park Y, Kim S, Moon J, Lee JC, Kim Y.

J Nanosci Nanotechnol. 2012 Feb;12(2):1444-7.

PMID:
22629975

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