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Items: 1 to 20 of 160

1.

A new approach to the determination of concentration profiles in atom probe tomography.

Felfer PJ, Gault B, Sha G, Stephenson L, Ringer SP, Cairney JM.

Microsc Microanal. 2012 Apr;18(2):359-64. doi: 10.1017/S1431927611012530. Epub 2012 Feb 3.

PMID:
22300727
2.

Lattice rectification in atom probe tomography: toward true three-dimensional atomic microscopy.

Moody MP, Gault B, Stephenson LT, Marceau RK, Powles RC, Ceguerra AV, Breen AJ, Ringer SP.

Microsc Microanal. 2011 Apr;17(2):226-39. doi: 10.1017/S1431927610094535. Epub 2011 Mar 8.

PMID:
21382222
3.

Some aspects of the field evaporation behaviour of GaSb.

Müller M, Saxey DW, Smith GD, Gault B.

Ultramicroscopy. 2011 May;111(6):487-92. doi: 10.1016/j.ultramic.2010.11.019. Epub 2010 Nov 20.

PMID:
21159438
4.

Probing the crystallography of ordered Phases by coupling of orientation microscopy with atom probe tomography.

Meher S, Nandwana P, Rojhirunsakool T, Tiley J, Banerjee R.

Ultramicroscopy. 2015 Jan;148:67-74. doi: 10.1016/j.ultramic.2014.09.001. Epub 2014 Sep 30.

PMID:
25314625
5.

Mapping energetics of atom probe evaporation events through first principles calculations.

Peralta J, Broderick SR, Rajan K.

Ultramicroscopy. 2013 Sep;132:143-51. doi: 10.1016/j.ultramic.2013.02.007. Epub 2013 Feb 28.

PMID:
23537885
6.

Determination of matrix composition based on solute-solute nearest-neighbor distances in atom probe tomography.

De Geuser F, Lefebvre W.

Microsc Res Tech. 2011 Mar;74(3):257-63. doi: 10.1002/jemt.20899.

PMID:
20623755
7.

Atom probe tomography characterization of solute segregation to dislocations.

Miller MK.

Microsc Res Tech. 2006 May;69(5):359-65. Review.

PMID:
16646009
8.

Understanding Atom Probe Tomography of Oxide-Supported Metal Nanoparticles by Correlation with Atomic-Resolution Electron Microscopy and Field Evaporation Simulation.

Devaraj A, Colby R, Vurpillot F, Thevuthasan S.

J Phys Chem Lett. 2014 Apr 17;5(8):1361-7. doi: 10.1021/jz500259c. Epub 2014 Mar 31.

PMID:
26269980
9.

On the use of simulated field-evaporated specimen apex shapes in atom probe tomography data reconstruction.

Larson DJ, Geiser BP, Prosa TJ, Kelly TF.

Microsc Microanal. 2012 Oct;18(5):953-63. doi: 10.1017/S1431927612001523. Epub 2012 Oct 12.

PMID:
23058657
10.

Imaging of radiation damage using complementary field ion microscopy and atom probe tomography.

Dagan M, Hanna LR, Xu A, Roberts SG, Smith GD, Gault B, Edmondson PD, Bagot PA, Moody MP.

Ultramicroscopy. 2015 Dec;159 Pt 2:387-94. doi: 10.1016/j.ultramic.2015.02.017. Epub 2015 Mar 2.

PMID:
25794822
11.

A new approach to the interpretation of atom probe field-ion microscopy images.

Vurpillot F, Bostel A, Blavette D.

Ultramicroscopy. 2001 Oct;89(1-3):137-44.

PMID:
11770739
12.

Short-range order in multicomponent materials.

Ceguerra AV, Moody MP, Powles RC, Petersen TC, Marceau RK, Ringer SP.

Acta Crystallogr A. 2012 Sep;68(Pt 5):547-60. doi: 10.1107/S0108767312025706. Epub 2012 Jul 20.

PMID:
22893238
13.

Comparison of the quantitative analysis performance between pulsed voltage atom probe and pulsed laser atom probe.

Takahashi J, Kawakami K, Raabe D.

Ultramicroscopy. 2017 Apr;175:105-110. doi: 10.1016/j.ultramic.2017.01.015. Epub 2017 Jan 31.

PMID:
28183005
14.

Elemental Distribution in Multilayer Systems by Laser-Assisted Atom Probe Tomography with Various Analysis Directions.

Kubota M, Takamizawa H, Shimizu Y, Nozawa Y, Ebisawa N, Toyama T, Ishida Y, Yanagiuchi K, Inoue K, Nagai Y.

Microsc Microanal. 2015 Dec;21(6):1373-1378. Epub 2015 Sep 16.

PMID:
26373477
15.

Clustering and local magnification effects in atom probe tomography: a statistical approach.

Philippe T, Gruber M, Vurpillot F, Blavette D.

Microsc Microanal. 2010 Oct;16(5):643-8. doi: 10.1017/S1431927610000449. Epub 2010 Sep 20.

PMID:
20849680
16.

Application of Delaunay tessellation for the characterization of solute-rich clusters in atom probe tomography.

Lefebvre W, Philippe T, Vurpillot F.

Ultramicroscopy. 2011 Feb;111(3):200-6. doi: 10.1016/j.ultramic.2010.11.034. Epub 2010 Nov 30.

PMID:
21333857
17.

On the field evaporation behavior of dielectric materials in three-dimensional atom probe: a numeric simulation.

Oberdorfer C, Schmitz G.

Microsc Microanal. 2011 Feb;17(1):15-25. doi: 10.1017/S1431927610093888. Epub 2010 Oct 1.

PMID:
20883599
18.

Overcoming challenges in the study of nitrided microalloyed steels using atom probe.

Xie KY, Breen AJ, Yao L, Moody MP, Gault B, Cairney JM, Ringer SP.

Ultramicroscopy. 2012 Jan;112(1):32-8. doi: 10.1016/j.ultramic.2011.10.003. Epub 2011 Oct 25.

PMID:
22094413
19.

Atomic insight into Ge₁₋xSnx using atom probe tomography.

Kumar A, Komalan MP, Lenka H, Kambham AK, Gilbert M, Gencarelli F, Vincent B, Vandervorst W.

Ultramicroscopy. 2013 Sep;132:171-8. doi: 10.1016/j.ultramic.2013.02.009. Epub 2013 Feb 21.

PMID:
23498554
20.

Level set methods for modelling field evaporation in atom probe.

Haley D, Moody MP, Smith GD.

Microsc Microanal. 2013 Dec;19(6):1709-17. doi: 10.1017/S1431927613013299. Epub 2013 Aug 28.

PMID:
23985174

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