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Items: 1 to 20 of 115

1.

Crystallographic plane-orientation dependent atomic force microscopy-based local oxidation of silicon carbide.

Ahn JJ, Jo YD, Kim SC, Lee JH, Koo SM.

Nanoscale Res Lett. 2011 Mar 18;6(1):235. doi: 10.1186/1556-276X-6-235.

2.

Characterization of Thermal Oxides on 4H Silicon Carbide (4H-SiC) Epitaxial Substrate Using Fourier Transform Infrared Spectroscopy.

Yoshikawa M, Seki H, Inoue K, Kobayashi T, Kimoto T.

Appl Spectrosc. 2015 Sep 1. [Epub ahead of print]

PMID:
26337495
3.

Nano-structure fabrication of GaAs using AFM tip-induced local oxidation method: different doping types and plane orientations.

Ahn JJ, Moon KS, Koo SM.

Nanoscale Res Lett. 2011 Oct 6;6(1):550. doi: 10.1186/1556-276X-6-550.

4.

Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: an atomic force microscopy investigation.

Xie XN, Chung HJ, Xu H, Xu X, Sow CH, Wee AT.

J Am Chem Soc. 2004 Jun 23;126(24):7665-75.

PMID:
15198614
5.

An in situ dissolution study of aspirin crystal planes (100) and (001) by atomic force microscopy.

Danesh A, Connell SD, Davies MC, Roberts CJ, Tendler SJ, Williams PM, Wilkins MJ.

Pharm Res. 2001 Mar;18(3):299-303.

PMID:
11442268
6.

Synthesis of beta-SiC/SiO2 core-sheath nanowires by CVD technique using Ni as catalyst.

Panda SK, Sengupta J, Jacob C.

J Nanosci Nanotechnol. 2010 May;10(5):3046-52.

PMID:
20358897
7.

Nanoscale electro-structural characterisation of ohmic contacts formed on p-type implanted 4H-SiC.

Frazzetto A, Giannazzo F, Lo Nigro R, Di Franco S, Bongiorno C, Saggio M, Zanetti E, Raineri V, Roccaforte F.

Nanoscale Res Lett. 2011 Feb 21;6(1):158. doi: 10.1186/1556-276X-6-158.

8.

Size Dependence of Nanoscale Wear of Silicon Carbide.

Tangpatjaroen C, Grierson D, Shannon S, Jakes JE, Szlufarska I.

ACS Appl Mater Interfaces. 2017 Jan 18;9(2):1929-1940. doi: 10.1021/acsami.6b13283. Epub 2017 Jan 6.

PMID:
27997110
9.

Sputter deposition of nanocrystalline beta-SiC films and molecular dynamics simulations of the sputter process.

Ziebert C, Ye J, Ulrich S, Prskalo AP, Schmauder S.

J Nanosci Nanotechnol. 2010 Feb;10(2):1120-8.

PMID:
20352766
10.

Growth of carbon nanotubes on silicon carbide fabric as reinforcement for SiC/C composites.

Manocha LM, Pande R.

J Nanosci Nanotechnol. 2010 Jun;10(6):3822-7.

PMID:
20355374
11.

Comparative analysis of oxidation methods of reaction-sintered silicon carbide for optimization of oxidation-assisted polishing.

Shen X, Dai Y, Deng H, Guan C, Yamamura K.

Opt Express. 2013 Nov 4;21(22):26123-35. doi: 10.1364/OE.21.026123.

PMID:
24216836
12.

Structure refinement of the silicon carbide polytypes 4H and 6H: unambiguous determination of the refinement parameters.

Bauer A, Reischauer P, Kräusslich J, Schell N, Matz W, Goetz K.

Acta Crystallogr A. 2001 Jan;57(Pt 1):60-7.

PMID:
11124504
13.

Study the formation mechanism of silicon carbide polytype by silicon carbide nanobelts sintered under high pressure.

Wei G, Zhang G, Gao F, Zheng J, Qin Y, Han W, Qin W, Yang W.

J Nanosci Nanotechnol. 2011 Nov;11(11):9752-6.

PMID:
22413287
14.

Characterization of silicon dioxide films on a 4H-SiC Si(0001) face by fourier transform infrared (FT-IR) spectroscopy and cathodoluminescence spectroscopy.

Yoshikawa M, Seki H, Inoue K, Matsuda K, Tanahashi Y, Sako H, Nanen Y, Kato M, Kimoto T.

Appl Spectrosc. 2011 May;65(5):543-8. doi: 10.1366/10-06186.

PMID:
21513598
15.

A look underneath the SiO2/4H-SiC interface after N2O thermal treatments.

Fiorenza P, Giannazzo F, Swanson LK, Frazzetto A, Lorenti S, Alessandrino MS, Roccaforte F.

Beilstein J Nanotechnol. 2013 Apr 8;4:249-54. doi: 10.3762/bjnano.4.26. Print 2013.

16.
17.

Nanoscale structural characterization of epitaxial graphene grown on off-axis 4H-SiC (0001).

Vecchio C, Sonde S, Bongiorno C, Rambach M, Yakimova R, Raineri V, Giannazzo F.

Nanoscale Res Lett. 2011 Mar 29;6(1):269. doi: 10.1186/1556-276X-6-269.

18.

Subsurface damage of single crystalline silicon carbide in nanoindentation tests.

Yan J, Gai X, Harada H.

J Nanosci Nanotechnol. 2010 Nov;10(11):7808-11.

PMID:
21138038
19.

Crystalline silicon carbide nanoparticles encapsulated in branched wavelike carbon nanotubes: synthesis and optical properties.

Xi G, Yu S, Zhang R, Zhang M, Ma D, Qian Y.

J Phys Chem B. 2005 Jul 14;109(27):13200-4.

PMID:
16852645
20.

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