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Items: 1 to 20 of 418

1.

In-situ synchrotron X-ray scattering study of thin film growth by atomic layer deposition.

Park YJ, Lee DR, Lee HH, Lee HB, Kim H, Park GC, Rhee SW, Baik S.

J Nanosci Nanotechnol. 2011 Feb;11(2):1577-80.

PMID:
21456240
2.

Versatile vacuum chamber for in situ surface X-ray scattering studies.

Carbone D, Plantevin O, Gago R, Mocuta C, Bikondoa O, Alija A, Petit L, Djazuli H, Metzger TH.

J Synchrotron Radiat. 2008 Jul;15(Pt 4):414-9. doi: 10.1107/S0909049508003944. Epub 2008 May 8.

PMID:
18552436
3.

An atomic layer deposition chamber for in situ x-ray diffraction and scattering analysis.

Geyer SM, Methaapanon R, Johnson RW, Kim WH, Van Campen DG, Metha A, Bent SF.

Rev Sci Instrum. 2014 May;85(5):055116. doi: 10.1063/1.4876484.

PMID:
24880424
4.

Thermal evolution characterizatics of atomic layer deposition prepared TiO2 interfacial layer by synchrotron radiation X-ray scattering.

Park YJ, Na KJ, Park GC, Kim RS, Anderson TJ.

J Nanosci Nanotechnol. 2013 Jun;13(6):4207-10.

PMID:
23862474
5.

A compact UHV deposition system for in situ study of ultrathin films via hard x-ray scattering and spectroscopy.

Couet S, Diederich T, Schlage K, Röhlsberger R.

Rev Sci Instrum. 2008 Sep;79(9):093908. doi: 10.1063/1.2982059.

PMID:
19044429
6.

Growth and morphology of sputtered aluminum thin films on P3HT surfaces.

Kaune G, Metwalli E, Meier R, Körstgens V, Schlage K, Couet S, Röhlsberger R, Roth SV, Müller-Buschbaum P.

ACS Appl Mater Interfaces. 2011 Apr;3(4):1055-62. doi: 10.1021/am101195m. Epub 2011 Mar 8.

PMID:
21384828
7.

Thin film structure of tetraceno[2,3-b]thiophene characterized by grazing incidence X-ray scattering and near-edge X-ray absorption fine structure analysis.

Yuan Q, Mannsfeld SC, Tang ML, Toney MF, Lüning J, Bao Z.

J Am Chem Soc. 2008 Mar 19;130(11):3502-8. doi: 10.1021/ja0773002. Epub 2008 Feb 23.

PMID:
18293975
8.

Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle X-ray scattering.

Dendooven J, Devloo-Casier K, Ide M, Grandfield K, Kurttepeli M, Ludwig KF, Bals S, Van Der Voort P, Detavernier C.

Nanoscale. 2014 Dec 21;6(24):14991-8. doi: 10.1039/c4nr05049e. Epub 2014 Nov 3.

PMID:
25363826
9.

The power of in situ pulsed laser deposition synchrotron characterization for the detection of domain formation during growth of Ba0.5Sr0.5TiO3 on MgO.

Bauer S, Lazarev S, Molinari A, Breitenstein A, Leufke P, Kruk R, Hahn H, Baumbach T.

J Synchrotron Radiat. 2014 Mar;21(Pt 2):386-94. doi: 10.1107/S1600577513034358. Epub 2014 Jan 25.

PMID:
24562560
10.

A modular reactor design for in situ synchrotron x-ray investigation of atomic layer deposition processes.

Klug JA, Weimer MS, Emery JD, Yanguas-Gil A, Seifert S, Schlepütz CM, Martinson AB, Elam JW, Hock AS, Proslier T.

Rev Sci Instrum. 2015 Nov;86(11):113901. doi: 10.1063/1.4934807.

PMID:
26628145
11.

In-situ synchrotron radiation photoemission spectroscopy study of the initial atomic layer deposition of Al2O3 film on Si(001) substrate.

Kim SH, Lee BK, Baik J, Jeon C, Lee SS, Lee J, Hwang HN, Hwang CC, Park CY, An KS.

J Nanosci Nanotechnol. 2011 May;11(5):4328-32.

PMID:
21780451
12.

Reactive sputter magnetron reactor for preparation of thin films and simultaneous in situ structural study by X-ray diffraction.

Bürgi J, Neuenschwander R, Kellermann G, García Molleja J, Craievich AF, Feugeas J.

Rev Sci Instrum. 2013 Jan;84(1):015102. doi: 10.1063/1.4773002.

PMID:
23387690
13.

Structural rearrangements during the initial growth stages of organic thin films of F16CuPc on SiO2.

de Oteyza DG, Barrena E, Sellner S, Ossó JO, Dosch H.

J Phys Chem B. 2006 Aug 24;110(33):16618-23.

PMID:
16913797
14.

In situ x-ray reflectivity studies of dynamics and morphology during heteroepitaxial complex oxide thin film growth.

Dale D, Suzuki Y, Brock JD.

J Phys Condens Matter. 2008 Jul 2;20(26):264008. doi: 10.1088/0953-8984/20/26/264008. Epub 2008 Jun 9.

PMID:
21694342
15.

Review of the applications of x-ray refraction and the x-ray waveguide phenomenon to estimation of film structures.

Hayashi K.

J Phys Condens Matter. 2010 Dec 1;22(47):474006. doi: 10.1088/0953-8984/22/47/474006. Epub 2010 Nov 15. Review.

PMID:
21386613
16.
17.

Investigation of Structure and Growth of Self-Assembled Polyelectrolyte Layers by X-ray and Neutron Scattering under Grazing Angles.

Plech A, Salditt T, Münster C, Peisl J.

J Colloid Interface Sci. 2000 Mar 1;223(1):74-82.

PMID:
10684670
18.

In situ synchrotron X-ray studies of ferroelectric thin films.

Fong DD, Eastman JA, Stephenson GB, Fuoss PH, Streiffer SK, Thompson C, Auciello O.

J Synchrotron Radiat. 2005 Mar;12(Pt 2):163-7. Epub 2005 Feb 22.

PMID:
15728968
19.

Preliminary studies in the electrodeposition of PbSe/PbTe superlattice thin films via electrochemical atomic layer deposition (ALD).

Vaidyanathan R, Cox SM, Happek U, Banga D, Mathe MK, Stickney JL.

Langmuir. 2006 Dec 5;22(25):10590-5.

PMID:
17129034
20.

Mobile setup for synchrotron based in situ characterization during thermal and plasma-enhanced atomic layer deposition.

Dendooven J, Solano E, Minjauw MM, Van de Kerckhove K, Coati A, Fonda E, Portale G, Garreau Y, Detavernier C.

Rev Sci Instrum. 2016 Nov;87(11):113905.

PMID:
27910568

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