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Items: 1 to 20 of 238

1.

Deposition error compensation for optical multilayer coatings. I. Theoretical description.

Sullivan BT, Dobrowolski JA.

Appl Opt. 1992 Jul 1;31(19):3821-35. doi: 10.1364/AO.31.003821.

PMID:
20725359
2.

Deposition error compensation for optical multilayer coatings. II. Experimental results-sputtering system.

Sullivan BT, Dobrowolski JA.

Appl Opt. 1993 May 1;32(13):2351-60. doi: 10.1364/AO.32.002351.

PMID:
20820395
3.

Optical thin film production with continuous reoptimization of layer thicknesses.

Holm C.

Appl Opt. 1979 Jun 15;18(12):1978-82. doi: 10.1364/AO.18.001978.

PMID:
20212589
4.

Optical monitoring of nonquarterwave multilayer filters.

Vidal B, Fornier A, Pelletier E.

Appl Opt. 1978 Apr 1;17(7):1038-47. doi: 10.1364/AO.17.001038.

PMID:
20197929
5.

Inhomogeneity in films: limitation of the accuracy of optical monitoring of thin films.

Borgogno JP, Bousquet P, Flory F, Lazarides B, Pelletier E, Roche P.

Appl Opt. 1981 Jan 1;20(1):90-4. doi: 10.1364/AO.20.000090.

PMID:
20309071
6.

Ion-beam etching for the precise manufacture of optical coatings.

Poitras D, Dobrowolski JA, Cassidy T, Moisa S.

Appl Opt. 2003 Jul 1;42(19):4037-44. Erratum in: Appl Opt. 2003 Oct 1;42(28):5749.

PMID:
12868845
7.

Wideband optical monitoring of nonquarterwave multilayer filters.

Vidal B, Fornier A, Pelletier E.

Appl Opt. 1979 Nov 15;18(22):3851-6. doi: 10.1364/AO.18.003851.

PMID:
20216706
8.

Optical monitoring of nonquarterwave layers of dielectric multilayer filters using optical admittance.

Chun B, Hwangbo CK, Kim JS.

Opt Express. 2006 Mar 20;14(6):2473-80.

PMID:
19503586
9.
10.

Metal/dielectric transmission interference filters with low reflectance. 2. Experimental results.

Sullivan BT, Byrt KL.

Appl Opt. 1995 Sep 1;34(25):5684-94. doi: 10.1364/AO.34.005684.

PMID:
21060398
11.

Nonquarterwave multilayer filters: optical monitoring with a minicomputer allowing correction of thickness errors.

Vidal B, Pelletier E.

Appl Opt. 1979 Nov 15;18(22):3857-62. doi: 10.1364/AO.18.003857.

PMID:
20216707
12.

Practical magnetron sputtering system for the deposition of optical multilayer coatings.

Dobrowolski JA, Pekelsky JR, Pelletier R, Ranger M, Sullivan BT, Waldorf AJ.

Appl Opt. 1992 Jul 1;31(19):3784-9. doi: 10.1364/AO.31.003784.

PMID:
20725354
13.

Synthesis and research of the optimum conditions for the optical monitoring of non-quarter-wave multilayers.

Grèbzes-Besset C, Chazallet F, Albrand G, Pelletier E.

Appl Opt. 1993 Oct 1;32(28):5612-8. doi: 10.1364/AO.32.005612.

PMID:
20856377
14.

Relation between coupled-mode theory and equivalent layers for multilayer interference coatings.

Matuschek N, Steinmeyer G, Keller U.

Appl Opt. 2000 Apr 1;39(10):1626-32.

PMID:
18345061
15.

Modeling of LbL multilayers with controlled thickness, roughness, and specific surface area.

Batys P, Weroński P.

J Chem Phys. 2012 Dec 7;137(21):214706. doi: 10.1063/1.4769390.

PMID:
23231255
16.

Comparison of algorithms used for optical characterization of multilayer optical coatings.

Amotchkina TV, Trubetskov MK, Pervak V, Schlichting S, Ehlers H, Ristau D, Tikhonravov AV.

Appl Opt. 2011 Jul 10;50(20):3389-95. doi: 10.1364/AO.50.003389.

PMID:
21743545
17.

Reflective multilayer coatings for the far uv region.

Spiller E.

Appl Opt. 1976 Oct 1;15(10):2333-8. doi: 10.1364/AO.15.002333.

PMID:
20165395
18.

High performance EUV multilayer structures insensitive to capping layer optical parameters.

Pelizzo MG, Suman M, Monaco G, Nicolosi P, Windt DL.

Opt Express. 2008 Sep 15;16(19):15228-37.

PMID:
18795061
19.

Reliable deposition of induced transmission filters with a single metal layer.

Sytchkova A.

Appl Opt. 2011 Mar 20;50(9):C90-4. doi: 10.1364/AO.50.000C90.

PMID:
21460988
20.

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