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Items: 1 to 20 of 296

1.

Quantification of sample thickness and in-concentration of InGaAs quantum wells by transmission measurements in a scanning electron microscope.

Volkenandt T, Müller E, Hu DZ, Schaadt DM, Gerthsen D.

Microsc Microanal. 2010 Oct;16(5):604-13. doi: 10.1017/S1431927610000292.

PMID:
20633317
2.

Low-energy electron scattering in carbon-based materials analyzed by scanning transmission electron microscopy and its application to sample thickness determination.

Pfaff M, Müller E, Klein MF, Colsmann A, Lemmer U, Krzyzanek V, Reichelt R, Gerthsen D.

J Microsc. 2011 Jul;243(1):31-9. doi: 10.1111/j.1365-2818.2010.03475.x.

3.

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G.

Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010.

PMID:
19525069
4.

Experimental quantification of annular dark-field images in scanning transmission electron microscopy.

Lebeau JM, Stemmer S.

Ultramicroscopy. 2008 Nov;108(12):1653-8. doi: 10.1016/j.ultramic.2008.07.001.

PMID:
18707809
5.

Simulation of atomic-scale high-angle annular dark field scanning transmission electron microscopy images.

Yamazaki T, Watanabe K, Recnik A, Ceh M, Kawasaki M, Shiojiri M.

J Electron Microsc (Tokyo). 2000;49(6):753-9.

PMID:
11270856
6.

Quantitative strain mapping applied to aberration--corrected HAADF images.

Sanchez AM, Galindo PL, Kret S, Falke M, Beanland R, Goodhew PJ.

Microsc Microanal. 2006 Aug;12(4):285-94.

PMID:
16842640
7.

Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy images.

Mehrtens T, Müller K, Schowalter M, Hu D, Schaadt DM, Rosenauer A.

Ultramicroscopy. 2013 Aug;131:1-9. doi: 10.1016/j.ultramic.2013.03.018.

PMID:
23666109
8.

Quantitative analysis of ultrathin doping layers in semiconductors using high-angle annular dark field images.

Liu CP, Preston AR, Boothroyd CB, Humphreys CJ.

J Microsc. 1999 Apr;194(1):171-182.

9.

Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopy.

Watanabe K, Kikuchi Y, Yamazaki T, Asano E, Nakanishi N, Kotaka Y, Okunishi E, Hashimoto I.

Acta Crystallogr A. 2004 Nov;60(Pt 6):591-7.

PMID:
15507742
10.

IMAGE-WARP: a real-space restoration method for high-resolution STEM images using quantitative HRTEM analysis.

Recnik A, Möbus G, Sturm S.

Ultramicroscopy. 2005 Jul;103(4):285-301.

PMID:
15885433
11.

Column ratio mapping: a processing technique for atomic resolution high-angle annular dark-field (HAADF) images.

Robb PD, Craven AJ.

Ultramicroscopy. 2008 Dec;109(1):61-9. doi: 10.1016/j.ultramic.2008.08.001.

PMID:
18814971
12.

Measurement of specimen thickness and composition in Al(x)Ga(1-x)N/GaN using high-angle annular dark field images.

Rosenauer A, Gries K, Müller K, Pretorius A, Schowalter M, Avramescu A, Engl K, Lutgen S.

Ultramicroscopy. 2009 Aug;109(9):1171-82. doi: 10.1016/j.ultramic.2009.05.003.

PMID:
19497670
13.

Contributions to the contrast in experimental high-angle annular dark-field images.

Klenov DO, Stemmer S.

Ultramicroscopy. 2006 Aug-Sep;106(10):889-901.

PMID:
16713091
14.

Effect of convergent beam semiangle on image intensity in HAADF STEM images.

Kuramochi K, Kotaka Y, Yamazaki T, Ohtsuka M, Hashimoto I, Watanabe K.

Acta Crystallogr A. 2010 Jan;66(Pt 1):10-6. doi: 10.1107/S0108767309039750.

PMID:
20029128
15.

Compositional analysis with atomic column spatial resolution by 5th-order aberration-corrected scanning transmission electron microscopy.

Hernández-Maldonado D, Herrera M, Alonso-González P, González Y, González L, Gazquez J, Varela M, Pennycook SJ, Guerrero-Lebrero Mde L, Pizarro J, Galindo PL, Molina SI.

Microsc Microanal. 2011 Aug;17(4):578-81. doi: 10.1017/S1431927611000213.

PMID:
21615979
17.

Sample thickness determination by scanning transmission electron microscopy at low electron energies.

Volkenandt T, Müller E, Gerthsen D.

Microsc Microanal. 2014 Feb;20(1):111-23. doi: 10.1017/S1431927613013913.

PMID:
24331292
18.

Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis.

Grieb T, Müller K, Fritz R, Schowalter M, Neugebohrn N, Knaub N, Volz K, Rosenauer A.

Ultramicroscopy. 2012 Jun;117:15-23. doi: 10.1016/j.ultramic.2012.03.014.

PMID:
22634136
20.

Diffraction imaging in a He+ ion beam scanning transmission microscope.

Notte J 4th, Hill R, McVey SM, Ramachandra R, Griffin B, Joy D.

Microsc Microanal. 2010 Oct;16(5):599-603. doi: 10.1017/S1431927610093682.

PMID:
20804638
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