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Items: 1 to 20 of 87

1.

Key parameters affecting quantitative analysis of STEM-EDS spectrum images.

Parish CM, Brewer LN.

Microsc Microanal. 2010 Jun;16(3):259-72. doi: 10.1017/S1431927610000267. Epub 2010 Apr 8.

PMID:
20374685
2.

Multivariate statistics applications in phase analysis of STEM-EDS spectrum images.

Parish CM, Brewer LN.

Ultramicroscopy. 2010 Jan;110(2):134-43. doi: 10.1016/j.ultramic.2009.10.011. Epub 2009 Oct 24.

PMID:
19897301
3.

A system for acquiring simultaneous electron energy-loss and X-ray spectrum-images.

Feng J, Somlyo AV, Somlyo AP.

J Microsc. 2004 Jul;215(Pt 1):92-9.

4.

35 years of EDS software.

Schamber FH.

Microsc Microanal. 2009 Dec;15(6):491-504. doi: 10.1017/S1431927609991085.

PMID:
19909560
5.

Artifacts in energy dispersive x-ray spectrometry in the scanning electron microscope (II).

Fiori CE, Newbury DE.

Scan Electron Microsc. 1980;(Pt 2):251-8, 250.

PMID:
7423119
6.

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G.

Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27.

PMID:
19525069
7.
8.

Two-dimensional quantitative mapping of arsenic in nanometer-scale silicon devices using STEM EELS-EDX spectroscopy.

Servanton G, Pantel R, Juhel M, Bertin F.

Micron. 2009 Jul-Aug;40(5-6):543-51. doi: 10.1016/j.micron.2009.04.003. Epub 2009 Apr 18.

PMID:
19414268
9.

Modeling atomic-resolution scanning transmission electron microscopy images.

Findlay SD, Oxley MP, Allen LJ.

Microsc Microanal. 2008 Feb;14(1):48-59. Epub 2007 Dec 21.

PMID:
18096101
10.
11.

Is scanning electron microscopy/energy dispersive X-ray spectrometry (SEM/EDS) quantitative?

Newbury DE, Ritchie NW.

Scanning. 2013 May-Jun;35(3):141-68. doi: 10.1002/sca.21041. Epub 2012 Aug 9.

PMID:
22886950
12.

Artifacts in aberration-corrected ADF-STEM imaging.

Yu Z, Batson PE, Silcox J.

Ultramicroscopy. 2003 Sep;96(3-4):275-84.

PMID:
12871794
13.

Quantitative water mapping of cryosectioned cells by electron energy-loss spectroscopy.

Sun SQ, Shi SL, Hunt JA, Leapman RD.

J Microsc. 1995 Jan;177(Pt 1):18-30.

PMID:
7897645
14.

Microcalorimeter-type energy dispersive X-ray spectrometer for a transmission electron microscope.

Hara T, Tanaka K, Maehata K, Mitsuda K, Yamasaki NY, Ohsaki M, Watanabe K, Yu X, Ito T, Yamanaka Y.

J Electron Microsc (Tokyo). 2010;59(1):17-26. doi: 10.1093/jmicro/dfp043. Epub 2009 Aug 27.

PMID:
19717388
15.

On the quantitativeness of EDS STEM.

Lugg NR, Kothleitner G, Shibata N, Ikuhara Y.

Ultramicroscopy. 2015 Apr;151:150-9. doi: 10.1016/j.ultramic.2014.11.029. Epub 2014 Dec 3.

PMID:
25535061
17.

Transmission electron microscopic x-ray quantitative analysis of human dentin at 200 kV accelerating voltage.

Yonehara K, Shinohara M, Kanaya K.

J Electron Microsc Tech. 1990 Nov;16(3):240-8.

PMID:
2243280
18.

Tilted angle CZT detector for photon counting/energy weighting x-ray and CT imaging.

Shikhaliev PM.

Phys Med Biol. 2006 Sep 7;51(17):4267-87. Epub 2006 Aug 15.

PMID:
16912381
19.
20.

Modelling high-resolution electron microscopy based on core-loss spectroscopy.

Allen LJ, Findlay SD, Oxley MP, Witte C, Zaluzec NJ.

Ultramicroscopy. 2006 Oct-Nov;106(11-12):1001-11. Epub 2006 Jun 30.

PMID:
16843600
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