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Items: 1 to 20 of 182

1.

Atomic resolution imaging and topography of boron nitride sheets produced by chemical exfoliation.

Warner JH, Rümmeli MH, Bachmatiuk A, Büchner B.

ACS Nano. 2010 Mar 23;4(3):1299-304. doi: 10.1021/nn901648q.

PMID:
20148574
2.

The influence of the number of graphene layers on the atomic resolution images obtained from aberration-corrected high resolution transmission electron microscopy.

Warner JH.

Nanotechnology. 2010 Jun 25;21(25):255707. doi: 10.1088/0957-4484/21/25/255707. Epub 2010 Jun 2.

PMID:
20516582
3.

Element discrimination in a hexagonal boron nitride nanosheet by aberration corrected transmission electron microscopy.

Mitome M, Sawada H, Kondo Y, Tanishiro Y, Takayanagi K.

Ultramicroscopy. 2012 Nov;122:6-11. doi: 10.1016/j.ultramic.2012.07.028. Epub 2012 Aug 2.

PMID:
22955324
4.

Utilizing boron nitride sheets as thin supports for high resolution imaging of nanocrystals.

Wu YA, Kirkland AI, Schäffel F, Porfyrakis K, Young NP, Briggs GA, Warner JH.

Nanotechnology. 2011 May 13;22(19):195603. doi: 10.1088/0957-4484/22/19/195603. Epub 2011 Mar 23.

PMID:
21430323
5.

Selective sputtering and atomic resolution imaging of atomically thin boron nitride membranes.

Meyer JC, Chuvilin A, Algara-Siller G, Biskupek J, Kaiser U.

Nano Lett. 2009 Jul;9(7):2683-9. doi: 10.1021/nl9011497.

PMID:
19480400
6.

Examining the stability of folded graphene edges against electron beam induced sputtering with atomic resolution.

Warner JH, Rümmeli MH, Bachmatiuk A, Büchner B.

Nanotechnology. 2010 Aug 13;21(32):325702. doi: 10.1088/0957-4484/21/32/325702. Epub 2010 Jul 19.

PMID:
20639589
7.

Examining co-based nanocrystals on graphene using low-voltage aberration-corrected transmission electron microscopy.

Warner JH, Rümmeli MH, Bachmatiuk A, Wilson M, Büchner B.

ACS Nano. 2010 Jan 26;4(1):470-6. doi: 10.1021/nn901371k.

PMID:
20020749
8.

Simulation study of aberration-corrected high-resolution transmission electron microscopy imaging of few-layer-graphene stacking.

Nelson F, Diebold AC, Hull R.

Microsc Microanal. 2010 Apr;16(2):194-9. doi: 10.1017/S1431927609991309. Epub 2010 Jan 26.

PMID:
20100382
9.

Direct imaging of rotational stacking faults in few layer graphene.

Warner JH, Rümmeli MH, Gemming T, Büchner B, Briggs GA.

Nano Lett. 2009 Jan;9(1):102-6. doi: 10.1021/nl8025949.

PMID:
19072722
10.

Catalyst-free growth of mono- and few-atomic-layer boron nitride sheets by chemical vapor deposition.

Qin L, Yu J, Li M, Liu F, Bai X.

Nanotechnology. 2011 May 27;22(21):215602. doi: 10.1088/0957-4484/22/21/215602. Epub 2011 Mar 30.

PMID:
21451227
11.

Thickness-dependent bending modulus of hexagonal boron nitride nanosheets.

Li C, Bando Y, Zhi C, Huang Y, Golberg D.

Nanotechnology. 2009 Sep 23;20(38):385707. doi: 10.1088/0957-4484/20/38/385707. Epub 2009 Aug 28.

PMID:
19713592
12.

Atomic structure of interconnected few-layer graphene domains.

Robertson AW, Bachmatiuk A, Wu YA, Schäffel F, Rellinghaus B, Büchner B, Rümmeli MH, Warner JH.

ACS Nano. 2011 Aug 23;5(8):6610-8. doi: 10.1021/nn202051g. Epub 2011 Aug 5.

PMID:
21819033
13.

Advantages of aberration correction for HRTEM investigation of complex layer compounds.

Spiecker E, Garbrecht M, Jäger W, Tillmann K.

J Microsc. 2010 Mar;237(3):341-6. doi: 10.1111/j.1365-2818.2009.03257.x.

14.

High-resolution scanning tunneling microscopy imaging of mesoscopic graphene sheets on an insulating surface.

Stolyarova E, Rim KT, Ryu S, Maultzsch J, Kim P, Brus LE, Heinz TF, Hybertsen MS, Flynn GW.

Proc Natl Acad Sci U S A. 2007 May 29;104(22):9209-12. Epub 2007 May 21.

16.

Controlled radiation damage and edge structures in boron nitride membranes.

Kim JS, Borisenko KB, Nicolosi V, Kirkland AI.

ACS Nano. 2011 May 24;5(5):3977-86. doi: 10.1021/nn2005443. Epub 2011 Apr 27.

PMID:
21510623
17.

Synthesis of few-layer hexagonal boron nitride thin film by chemical vapor deposition.

Shi Y, Hamsen C, Jia X, Kim KK, Reina A, Hofmann M, Hsu AL, Zhang K, Li H, Juang ZY, Dresselhaus MS, Li LJ, Kong J.

Nano Lett. 2010 Oct 13;10(10):4134-9. doi: 10.1021/nl1023707.

PMID:
20812716
18.

Atomic structures of multi-walled boron nitride nanohorns.

Nishiwaki A, Oku T.

J Electron Microsc (Tokyo). 2005;54 Suppl 1:i9-14.

PMID:
16157650
19.

Atomic imaging in aberration-corrected high-resolution transmission electron microscopy.

Chen JH, Zandbergen HW, Dyck DV.

Ultramicroscopy. 2004 Jan;98(2-4):81-97.

PMID:
15046789
20.

Thickness and rotational effects in simulated HRTEM images of graphene on hexagonal boron nitride.

Green AJ, Diebold AC.

Microsc Microanal. 2014 Dec;20(6):1753-63. doi: 10.1017/S1431927614013105. Epub 2014 Sep 15.

PMID:
25222467

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