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Items: 1 to 20 of 174

1.
2.

Microstructure and optical dispersion characterization of nanocomposite sol-gel TiO₂-SiO₂ thin films with different compositions.

Kermadi S, Agoudjil N, Sali S, Zougar L, Boumaour M, Broch L, En Naciri A, Placido F.

Spectrochim Acta A Mol Biomol Spectrosc. 2015 Jun 15;145:145-54. doi: 10.1016/j.saa.2015.02.110.

PMID:
25770938
3.

Determination of Optical Constants of Solgel-Derived Inhomogeneous TiO(2) Thin Films by Spectroscopic Ellipsometry and Transmission Spectroscopy.

Mosaddeq-Ur-Rahman M, Yu G, Krishna KM, Soga T, Watanabe J, Jimbo T, Umeno M.

Appl Opt. 1998 Feb 1;37(4):691-7.

PMID:
18268642
4.

Investigation of the dielectric function of solution-processed InGaZnO films using ellipsometry.

Kim TJ, Yoon JJ, Hwang SM, Choi JH, Hwang SY, Ghong TH, Barange N, Kim JY, Kim YD, Joo J.

J Nanosci Nanotechnol. 2012 Jul;12(7):5804-7.

PMID:
22966658
5.

Optical study of Mn-doped Bi4Ti3O,12 thin films by spectroscopic ellipsometry.

Hwang SY, Kim TJ, Yoon JJ, Cha YH, Kim YD, Seong TG, Kang LS, Nahm S.

J Nanosci Nanotechnol. 2011 Jan;11(1):884-8.

PMID:
21446567
6.

Optical and physical properties of solgel-derived GeO2:SiO2 films in photonic applications.

Ho CK, Pal R, Djie HS, Pita K, Ngo NQ, Osipowicz T.

Appl Opt. 2007 Jul 10;46(20):4397-406.

PMID:
17579694
7.

Determination of the optical function n(λ) of vitreous silica by spectroscopic ellipsometry with an achromatic compensator.

Chindaudom P, Vedam K.

Appl Opt. 1993 Nov 1;32(31):6391-8. doi: 10.1364/AO.32.006391.

PMID:
20856477
8.

[Spectroscopic ellipsometry investigations of amorphous diamond films deposited with filtered arc].

Zhu JQ, Han JC, Tao YC, Jiang CZ.

Guang Pu Xue Yu Guang Pu Fen Xi. 2006 Feb;26(2):203-7. Chinese.

PMID:
16826887
9.

Optical functions of transparent thin films of SrTiO(3), BaTiO(3), and SiO(x) determined by spectroscopic ellipsometry.

Jellison GE Jr, Boatner LA, Lowndes DH, McKee RA, Godbole M.

Appl Opt. 1994 Sep 1;33(25):6053-8. doi: 10.1364/AO.33.006053.

PMID:
20936019
10.

Elastic and plastic relaxation of densified SiO2 films.

Wang J, Maier RL, Schreiber H.

Appl Opt. 2008 May 1;47(13):C131-4.

PMID:
18449234
11.

Vacuum ultra-violet spectroscopic ellipsometry study of single- and multi-phase nitride protective films.

Aouadi SM, Bohnhoff A, Amriou T, Williams M, Hilfiker JN, Singh N, Woollam JA.

J Phys Condens Matter. 2006 Aug 16;18(32):S1691-701. doi: 10.1088/0953-8984/18/32/S01.

PMID:
21690857
12.

Optical and interfacial layer properties of SiO2 films deposited on different substrates.

Jiang Y, Liu H, Wang L, Liu D, Jiang C, Cheng X, Yang Y, Ji Y.

Appl Opt. 2014 Feb 1;53(4):A83-7. doi: 10.1364/AO.53.000A83.

PMID:
24514254
13.

Preparation of silica thin films by novel wet process and study of their optical properties.

Im SH, Kim NJ, Kim DH, Hwang CW, Yoon DK, Ryu BK.

J Nanosci Nanotechnol. 2012 Feb;12(2):1453-6.

PMID:
22629977
14.

Optical properties of poly(ferrocenylsilane) multilayer thin films.

Kooij ES, Ma Y, Hempenius MA, Vancso GJ, Poelsema B.

Langmuir. 2010 Sep 7;26(17):14177-81. doi: 10.1021/la101583t.

PMID:
20684555
15.

Spectroscopic and electrical properties of SiO2 films prepared by simple and cost effective sol-gel process.

Vishwas M, Rao KN, Phani AR, Arjuna Gowda KV, Chakradhar RP.

Spectrochim Acta A Mol Biomol Spectrosc. 2011 Feb;78(2):695-9. doi: 10.1016/j.saa.2010.11.051.

PMID:
21208823
16.

Nonlinear optical absorption and switching properties of gold nanoparticle doped SiO2-TiO2 sol-gel films.

Venkatram N, Kumar RS, Rao DN, Medda SK, De S, De G.

J Nanosci Nanotechnol. 2006 Jul;6(7):1990-4.

PMID:
17025114
17.

Refractive index of thin films of SiO2, ZrO2, and HfO2 as a function of the films' mass density.

Jerman M, Qiao Z, Mergel D.

Appl Opt. 2005 May 20;44(15):3006-12.

PMID:
15929291
18.

Synthesis and characterization of polyimide/monodispersed colloidal silica hybrid thin films.

Yu YY, Chien WC, Lai CL.

J Nanosci Nanotechnol. 2009 Jul;9(7):4135-42.

PMID:
19916420
19.

Dielectric functions of solution-processed GdAlO(x)/Si films measured with vacuum ultra-violet spectroscopic ellipsometry.

Kim TJ, Park HG, Lee SH, Hwang SM, Hwang SY, Kim JY, Choi J, Kang YR, Kim YD, Joo J.

J Nanosci Nanotechnol. 2014 Nov;14(11):8715-8.

PMID:
25958590
20.

Optical, dielectric and morphological studies of sol-gel derived nanocrystalline TiO2 films.

Vishwas M, Sharma SK, Narasimha Rao K, Mohan S, Gowda KV, Chakradhar RP.

Spectrochim Acta A Mol Biomol Spectrosc. 2009 Oct 15;74(3):839-42. doi: 10.1016/j.saa.2009.07.018.

PMID:
19717333
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