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Items: 1 to 20 of 109

1.

Quantitative nanoscale dielectric microscopy of single-layer supported biomembranes.

Fumagalli L, Ferrari G, Sampietro M, Gomila G.

Nano Lett. 2009 Apr;9(4):1604-8. doi: 10.1021/nl803851u.

PMID:
19271767
2.

Nanoscale measurement of the dielectric constant of supported lipid bilayers in aqueous solutions with electrostatic force microscopy.

Gramse G, Dols-Perez A, Edwards MA, Fumagalli L, Gomila G.

Biophys J. 2013 Mar 19;104(6):1257-62. doi: 10.1016/j.bpj.2013.02.011. Epub 2013 Mar 19.

3.

Calibrated nanoscale capacitance measurements using a scanning microwave microscope.

Huber HP, Moertelmaier M, Wallis TM, Chiang CJ, Hochleitner M, Imtiaz A, Oh YJ, Schilcher K, Dieudonne M, Smoliner J, Hinterdorfer P, Rosner SJ, Tanbakuchi H, Kabos P, Kienberger F.

Rev Sci Instrum. 2010 Nov;81(11):113701. doi: 10.1063/1.3491926.

PMID:
21133472
4.

Nanoscale capacitance imaging with attofarad resolution using ac current sensing atomic force microscopy.

Fumagalli L, Ferrari G, Sampietro M, Casuso I, Martínez E, Samitier J, Gomila G.

Nanotechnology. 2006 Sep 28;17(18):4581-7. doi: 10.1088/0957-4484/17/18/009. Epub 2006 Aug 22.

PMID:
21727580
5.

Dielectrophoretic force microscopy of aqueous interfaces.

Lynch BP, Hilton AM, Doerge CH, Simpson GJ.

Langmuir. 2005 Feb 15;21(4):1436-40.

PMID:
15697292
6.

Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopy.

Gramse G, Casuso I, Toset J, Fumagalli L, Gomila G.

Nanotechnology. 2009 Sep 30;20(39):395702. doi: 10.1088/0957-4484/20/39/395702. Epub 2009 Sep 2.

PMID:
19724109
7.

Four-dimensional dielectric property image obtained from electron spectroscopic imaging series.

Lo SC, Kai JJ, Chen FR, Chang L, Chen LC, Chiang CC, Ding P, Chin B, Zhang H, Chen F.

J Electron Microsc (Tokyo). 2001;50(6):497-507.

PMID:
11918416
8.

Nanoscale dielectric properties of insulating thin films: from single point measurements to quantitative images.

Riedel C, Schwartz GA, Arinero R, Tordjeman P, Lévêque G, Alegría A, Colmenero J.

Ultramicroscopy. 2010 May;110(6):634-8. doi: 10.1016/j.ultramic.2010.02.024. Epub 2010 Feb 23.

PMID:
20206448
9.

A plasmonic dimple lens for nanoscale focusing of light.

Vedantam S, Lee H, Tang J, Conway J, Staffaroni M, Yablonovitch E.

Nano Lett. 2009 Oct;9(10):3447-52. doi: 10.1021/nl9016368.

PMID:
19739648
10.

Enhanced dielectric constant resolution of thin insulating films by electrostatic force microscopy.

Castellano-Hernández E, Moreno-Llorena J, Sáenz JJ, Sacha GM.

J Phys Condens Matter. 2012 Apr 18;24(15):155303. doi: 10.1088/0953-8984/24/15/155303. Epub 2012 Mar 23.

11.

Single molecule microscopy of biomembranes (review).

Schütz GJ, Sonnleitner M, Hinterdorfer P, Schindler H.

Mol Membr Biol. 2000 Jan-Mar;17(1):17-29. Review.

PMID:
10824735
12.

In vivo imaging of S-layer nanoarrays on Corynebacterium glutamicum.

Dupres V, Alsteens D, Pauwels K, Dufrêne YF.

Langmuir. 2009 Sep 1;25(17):9653-5. doi: 10.1021/la902238q.

PMID:
19642621
13.

Scanning quantum decoherence microscopy.

Cole JH, Hollenberg LC.

Nanotechnology. 2009 Dec 9;20(49):495401. doi: 10.1088/0957-4484/20/49/495401. Epub 2009 Nov 11.

PMID:
19904024
14.

Electron transport through supported biomembranes at the nanoscale by conductive atomic force microscopy.

Casuso I, Fumagalli L, Samitier J, Padrós E, Reggiani L, Akimov V, Gomila G.

Nanotechnology. 2007 Nov 21;18(46):465503. doi: 10.1088/0957-4484/18/46/465503. Epub 2007 Oct 12.

PMID:
21730477
15.

Origin of the dielectric dead layer in nanoscale capacitors.

Stengel M, Spaldin NA.

Nature. 2006 Oct 12;443(7112):679-82.

PMID:
17036000
16.

Scanning electron microscopy of nanoscale chemical patterns.

Srinivasan C, Mullen TJ, Hohman JN, Anderson ME, Dameron AA, Andrews AM, Dickey EC, Horn MW, Weiss PS.

ACS Nano. 2007 Oct;1(3):191-201. doi: 10.1021/nn7000799.

PMID:
19206649
17.

Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement.

Karbassi A, Ruf D, Bettermann AD, Paulson CA, van der Weide DW, Tanbakuchi H, Stancliff R.

Rev Sci Instrum. 2008 Sep;79(9):094706. doi: 10.1063/1.2953095.

PMID:
19044445
18.

Automatic control of mechanical forces acting on cell biomembranes using a vision-guided microrobotic system in computer microscopy.

Zhang YL, Han ML, Vidyalakshmi J, Shee CY, Ang WT.

J Microsc. 2009 Oct;236(1):70-8. doi: 10.1111/j.1365-2818.2009.03209.x.

19.

High-resolution noncontact atomic force microscopy.

Pérez R, García R, Schwarz U.

Nanotechnology. 2009 Jul 1;20(26):260201. doi: 10.1088/0957-4484/20/26/260201. Epub 2009 Jun 10.

PMID:
19531843
20.

Fast three-dimensional nanoscale metrology in dual-beam FIB-SEM instrumentation.

Repetto L, Buzio R, Denurchis C, Firpo G, Piano E, Valbusa U.

Ultramicroscopy. 2009 Oct;109(11):1338-42. doi: 10.1016/j.ultramic.2009.06.009. Epub 2009 Jun 23.

PMID:
19608346

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