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Items: 1 to 20 of 56

1.

Microdeflectometry--a novel tool to acquire three-dimensional microtopography with nanometer height resolution.

Häusler G, Richter C, Leitz KH, Knauer MC.

Opt Lett. 2008 Feb 15;33(4):396-8.

PMID:
18278122
2.

Structured illumination assisted microdeflectometry with optical depth scanning capability.

Lu SH, Hua H.

Opt Lett. 2016 Sep 1;41(17):4114-7. doi: 10.1364/OL.41.004114.

PMID:
27607986
3.

Inspection of commercial optical devices for data storage using a three Gaussian beam microscope interferometer.

Flores JM, Cywiak M, Servín M, Juárez L.

Appl Opt. 2008 Sep 20;47(27):4974-80.

PMID:
18806860
4.

Monte Carlo simulation of scanning electron microscope image of sidewall shape for linewidth measurement.

Xiao SM, Zhang ZM, Li HM, Ding ZJ.

J Nanosci Nanotechnol. 2009 Feb;9(2):1655-8.

PMID:
19441593
5.

Dual-wavelength vertical scanning low-coherence interferometric microscope.

Niehues J, Lehmann P, Bobey K.

Appl Opt. 2007 Oct 10;46(29):7141-8.

PMID:
17932521
6.

Interference microscopy for three-dimensional imaging with wavelength-to-depth encoding.

Li G, Sun PC, Lin PC, Fainman Y.

Opt Lett. 2000 Oct 15;25(20):1505-7.

PMID:
18066260
7.

Invited Review Article: Microwave spectroscopy based on scanning thermal microscopy: resolution in the nanometer range.

Meckenstock R.

Rev Sci Instrum. 2008 Apr;79(4):041101. doi: 10.1063/1.2908445.

PMID:
18447516
8.

A method for observing silver-stained osteocytes in situ in 3-microm sections using ultra-high voltage electron microscopy tomography.

Kamioka H, Murshid SA, Ishihara Y, Kajimura N, Hasegawa T, Ando R, Sugawara Y, Yamashiro T, Takaoka A, Takano-Yamamoto T.

Microsc Microanal. 2009 Oct;15(5):377-83. doi: 10.1017/S1431927609990420. Epub 2009 Aug 27.

PMID:
19709463
9.

A hard x-ray nanoprobe for scanning and projection nanotomography.

Bleuet P, Cloetens P, Gergaud P, Mariolle D, Chevalier N, Tucoulou R, Susini J, Chabli A.

Rev Sci Instrum. 2009 May;80(5):056101. doi: 10.1063/1.3117489. Erratum in: Rev Sci Instrum. 2009 Jun;80(6):069902.

PMID:
19485538
10.

Three-dimensional laser imaging as a valuable tool for specifying changes in breast shape after augmentation mammaplasty.

Esme DL, Bucksch A, Beekman WH.

Aesthetic Plast Surg. 2009 Mar;33(2):191-5. doi: 10.1007/s00266-008-9259-y. Epub 2008 Nov 4.

PMID:
18982384
11.

Three-dimensional magnetic resonance observation of cartilage repair tissue (MOCART) score assessed with an isotropic three-dimensional true fast imaging with steady-state precession sequence at 3.0 Tesla.

Welsch GH, Zak L, Mamisch TC, Resinger C, Marlovits S, Trattnig S.

Invest Radiol. 2009 Sep;44(9):603-12. doi: 10.1097/RLI.0b013e3181b5333c.

PMID:
19692843
12.
13.

Three-dimensional ADF imaging of individual atoms by through-focal series scanning transmission electron microscopy.

van Benthem K, Lupini AR, Oxley MP, Findlay SD, Allen LJ, Pennycook SJ.

Ultramicroscopy. 2006 Oct-Nov;106(11-12):1062-8. Epub 2006 Jul 5.

PMID:
16875782
14.

Absolute profile measurement of large moderately flat optical surfaces with high dynamic range.

Wiegmann A, Schulz M, Elster C.

Opt Express. 2008 Aug 4;16(16):11975-86.

PMID:
18679470
15.

Three-Dimensional Shape Measurements of Specular Objects Using Phase-Measuring Deflectometry.

Zhang Z, Wang Y, Huang S, Liu Y, Chang C, Gao F, Jiang X.

Sensors (Basel). 2017 Dec 7;17(12). pii: E2835. doi: 10.3390/s17122835. Review.

16.

Focused ion beam (FIB) combined with high resolution scanning electron microscopy: a promising tool for 3D analysis of chromosome architecture.

Schroeder-Reiter E, Pérez-Willard F, Zeile U, Wanner G.

J Struct Biol. 2009 Feb;165(2):97-106. doi: 10.1016/j.jsb.2008.10.002. Epub 2008 Nov 5.

PMID:
19059341
17.

Imaging and 3D elemental characterization of intact bacterial spores by high-resolution secondary ion mass spectrometry.

Ghosal S, Fallon SJ, Leighton TJ, Wheeler KE, Kristo MJ, Hutcheon ID, Weber PK.

Anal Chem. 2008 Aug 1;80(15):5986-92. doi: 10.1021/ac8006279. Epub 2008 Jun 26.

PMID:
18578543
18.

High-resolution noncontact atomic force microscopy.

Pérez R, García R, Schwarz U.

Nanotechnology. 2009 Jul 1;20(26):260201. doi: 10.1088/0957-4484/20/26/260201. Epub 2009 Jun 10.

PMID:
19531843
19.

Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis.

Attota R, Germer TA, Silver RM.

Opt Lett. 2008 Sep 1;33(17):1990-2.

PMID:
18758588
20.

Direct volume editing.

Bürger K, Krüger J, Westermann R.

IEEE Trans Vis Comput Graph. 2008 Nov-Dec;14(6):1388-95. doi: 10.1109/TVCG.2008.120.

PMID:
18988988

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