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Items: 1 to 20 of 117

1.

Linear optical effects in z-scan measurements of thin films.

Patterson BM, White WR, Robbins TA, Knize RJ.

Appl Opt. 1998 Apr 1;37(10):1854-7.

PMID:
18273099
2.

Linear optical characterization of transparent thin films by the Z-scan technique.

Boudebs G, Fedus K.

Appl Opt. 2009 Jul 20;48(21):4124-9.

PMID:
19623226
3.

Influence of the photoinduced focal length of a thin nonlinear material in the Z-scan technique.

Reynoso Lara E, Navarrete Meza Z, Iturbe Castillo MD, Treviño Palacios CG, Martí Panameño E, Arroyo Carrasco ML.

Opt Express. 2007 Mar 5;15(5):2517-29.

PMID:
19532488
4.

Large nonlinear optical response of polycrystalline Bi3.25La0.75Ti3O12 ferroelectric thin films on quartz substrates.

Shin H, Chang HJ, Boyd RW, Choi MR, Jo W.

Opt Lett. 2007 Aug 15;32(16):2453-5.

PMID:
17700816
5.

Giant nonlinear optical properties of bismuth thin films grown by pulsed laser deposition.

Liu DR, Wu KS, Shih MF, Chern MY.

Opt Lett. 2002 Sep 1;27(17):1549-51.

PMID:
18026502
6.

Rh:BaTiO3 thin films with large nonlinear optical properties.

Yang G, Wang H, Tan G, Jiang A, Zhou Y, Chen Z.

Appl Opt. 2002 Mar 20;41(9):1729-32.

PMID:
11921804
7.

Spatial phase filtering based on the intensity-dependent refractive index of PbS nanocomposite film.

Kurian PA, Vijayan C.

Appl Opt. 2009 Oct 1;48(28):5259-65. doi: 10.1364/AO.48.005259.

PMID:
19798363
8.

Nonlinear response and optical limiting in SrBi(2)Ta(2)O(9) thin films.

Gu YZ, Zhang WF, Gu DH, Gan FX.

Opt Lett. 2001 Nov 15;26(22):1788-90.

PMID:
18059699
9.

Effects of multiple internal sample reflections on nonlinear refractive Z-scan measurements.

Sutherland RL.

Appl Opt. 1994 Aug 20;33(24):5576-84. doi: 10.1364/AO.33.005576.

PMID:
20935956
10.

Third-order optical nonlinearity of cadmium sulfide nanoparticles loaded in mesostructured silica materials.

Li J, Chen H, Chen Y, Jiang P, Wei C, Shi J.

J Nanosci Nanotechnol. 2011 Dec;11(12):10880-5.

PMID:
22409017
11.

Determination of the optical constants (n and k) of inhomogeneous thin films with linear index profiles.

Al-Kuhaili MF, Khawaja EE, Durrani SM.

Appl Opt. 2006 Jul 1;45(19):4591-7.

PMID:
16799670
12.

Sensitive measurement of optical nonlinearity in amorphous chalcogenide materials in nanosecond regime.

Rani S, Mohan D, Kishore N, Purnima.

Spectrochim Acta A Mol Biomol Spectrosc. 2012 Jul;93:135-9. doi: 10.1016/j.saa.2012.02.093. Epub 2012 Mar 3.

PMID:
22481171
13.

In situ third-order non-linear responses during laser reduction of graphene oxide thin films towards on-chip non-linear photonic devices.

Zheng X, Jia B, Chen X, Gu M.

Adv Mater. 2014 May;26(17):2699-703. doi: 10.1002/adma.201304681. Epub 2014 Mar 17.

PMID:
24639376
14.

Near-resonant high order nonlinear absorption of ZnO thin films.

Chan YP, Lin JH, Hsu CC, Hsieh WF.

Opt Express. 2008 Nov 24;16(24):19900-8.

PMID:
19030077
15.

Gold nanoparticles on the surface of soda-lime glass: morphological, linear and nonlinear optical characterization.

Romani EC, Vitoreti D, Gouvêa PM, Caldas PG, Prioli R, Paciornik S, Fokine M, Braga AM, Gomes AS, Carvalho IC.

Opt Express. 2012 Feb 27;20(5):5429-39. doi: 10.1364/OE.20.005429.

PMID:
22418350
16.

Eliminating thermal effects in z-scan measurements of thin PTCDA films.

Wickremasinghe N, Wang X, Schmitzer H, Wagner HP.

Opt Express. 2014 Oct 6;22(20):23955-64. doi: 10.1364/OE.22.023955.

PMID:
25321972
17.

Ultralow-refractive-index optical thin films through nanoscale etching of ordered mesoporous silica films.

Chi F, Yan L, Yan H, Jiang B, Lv H, Yuan X.

Opt Lett. 2012 May 1;37(9):1406-8. doi: 10.1364/OL.37.001406.

PMID:
22555686
18.

Effect of interfacial refractive index on optical molecular orientation measurements.

Ekhoff JA, Rowlen KL.

Anal Chem. 2002 Dec 1;74(23):5954-9.

PMID:
12498190
19.
20.

Third-order nonlinear optical properties of an ultrathin film containing a porphyrin derivative.

Jiang L, Lu F, Li H, Chang Q, Li Y, Liu H, Wang S, Song Y, Cui G, Wang N, He X, Zhu D.

J Phys Chem B. 2005 Apr 7;109(13):6311-5.

PMID:
16851702

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