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Items: 1 to 20 of 140

1.

Analysis of defects in microcrystalline islands in amorphous silicon films with a Scanning Charge-Transient Microscope.

Lányi S, Nádazdy V.

Ultramicroscopy. 2007 Oct;107(10-11):963-8. Epub 2007 May 1.

PMID:
17574341
2.

Scanning probe microscope based Deep-Level Spectroscopy of semiconductor films.

Lányi S, Nádazdy V.

Ultramicroscopy. 2010 May;110(6):655-8. doi: 10.1016/j.ultramic.2010.02.027. Epub 2010 Feb 24.

PMID:
20202758
3.

Nanoscale ferroelectric field-effect writing and reading using scanning tunnelling spectroscopy.

Kuffer O, Maggio-Aprile I, Fischer Ø.

Nat Mater. 2005 May;4(5):378-82. Epub 2005 Apr 17.

PMID:
15834416
4.

Silicon nanowire transistors with a channel width of 4 nm fabricated by atomic force microscope nanolithography.

Martinez J, Martínez RV, Garcia R.

Nano Lett. 2008 Nov;8(11):3636-9. doi: 10.1021/nl801599k. Epub 2008 Oct 1.

PMID:
18826289
5.

Scanning photoinduced impedance microscopy using amorphous silicon photodiode structures.

Zhou Y, Chen L, Krause S, Chazalviel JN.

Anal Chem. 2007 Aug 15;79(16):6208-14. Epub 2007 Jul 13.

PMID:
17628116
6.

High-resolution mapping of the electrostatic potential in organic thin-film transistors by phase electrostatic force microscopy.

Annibale P, Albonetti C, Stoliar P, Biscarini F.

J Phys Chem A. 2007 Dec 13;111(49):12854-8.

PMID:
18052312
7.

Detection of DNA and proteins using amorphous silicon ion-sensitive thin-film field effect transistors.

Gonçalves D, Prazeres DM, Chu V, Conde JP.

Biosens Bioelectron. 2008 Dec 1;24(4):545-51. doi: 10.1016/j.bios.2008.05.006. Epub 2008 May 27.

PMID:
18599283
8.

Photoconductive imaging in a photon scanning tunnelling microscope capable of point-contact current sensing using a conductive fibre probe.

Iwata F, Someya D, Sakaguchi H, Igasaki Y, Kitao M, Kubo T, Sasaki A.

J Microsc. 2001 Apr;202(Pt 1):188-92.

9.

Local inhomogeneity in gate hysteresis of carbon nanotube field-effect transistors investigated by scanning gate microscopy.

Lee JS, Ryu S, Yoo K, Kim J, Choi IS, Yun WS.

Ultramicroscopy. 2008 Sep;108(10):1045-9. doi: 10.1016/j.ultramic.2008.04.067. Epub 2008 May 14.

PMID:
18573615
10.

A high-performance organic field-effect transistor based on platinum(II) porphyrin: peripheral substituents on porphyrin ligand significantly affect film structure and charge mobility.

Che CM, Xiang HF, Chui SS, Xu ZX, Roy VA, Yan JJ, Fu WF, Lai PT, Williams ID.

Chem Asian J. 2008 Jul 7;3(7):1092-103. doi: 10.1002/asia.200800011.

PMID:
18528916
11.

Fabrication of one-transistor-capacitor structure of nonvolatile TFT ferroelectric RAM devices using Ba(Zr0.1Ti0.9)O3 gated oxide film.

Yang CF, Chen KH, Chen YC, Chang TC.

IEEE Trans Ultrason Ferroelectr Freq Control. 2007 Sep;54(9):1726-30.

PMID:
17941379
12.

Novel electrical properties of nanoscale thin films of a semiconducting polymer: quantitative current-sensing AFM analysis.

Kim J, Cho S, Choi S, Baek S, Lee D, Kim O, Park SM, Ree M.

Langmuir. 2007 Aug 14;23(17):9024-30. Epub 2007 Jul 13.

PMID:
17629311
13.

Thin film structure of tetraceno[2,3-b]thiophene characterized by grazing incidence X-ray scattering and near-edge X-ray absorption fine structure analysis.

Yuan Q, Mannsfeld SC, Tang ML, Toney MF, Lüning J, Bao Z.

J Am Chem Soc. 2008 Mar 19;130(11):3502-8. doi: 10.1021/ja0773002. Epub 2008 Feb 23.

PMID:
18293975
14.

Control of single-electron charging of metallic nanoparticles onto amorphous silicon surface.

Weis M, Gmucová K, Nádazdy V, Capek I, Satka A, Kopáni M, Cirák J, Majková E.

J Nanosci Nanotechnol. 2008 Nov;8(11):5684-9.

PMID:
19198289
15.

Highly disordered polymer field effect transistors: N-alkyl dithieno[3,2-b:2',3'-d]pyrrole-based copolymers with surprisingly high charge carrier mobilities.

Liu J, Zhang R, Sauvé G, Kowalewski T, McCullough RD.

J Am Chem Soc. 2008 Oct 1;130(39):13167-76. doi: 10.1021/ja803077v. Epub 2008 Sep 4.

PMID:
18767846
16.

Identification of color centers on MgO(001) thin films with scanning tunneling microscopy.

Sterrer M, Heyde M, Novicki M, Nilius N, Risse T, Rust HP, Pacchioni G, Freund HJ.

J Phys Chem B. 2006 Jan 12;110(1):46-9.

PMID:
16471496
17.

Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement.

Karbassi A, Ruf D, Bettermann AD, Paulson CA, van der Weide DW, Tanbakuchi H, Stancliff R.

Rev Sci Instrum. 2008 Sep;79(9):094706. doi: 10.1063/1.2953095.

PMID:
19044445
18.

A scanning Kelvin probe study of charge trapping in zone-cast pentacene thin film transistors.

Hallam T, Duffy CM, Minakata T, Ando M, Sirringhaus H.

Nanotechnology. 2009 Jan 14;20(2):025203. doi: 10.1088/0957-4484/20/2/025203. Epub 2008 Dec 9.

PMID:
19417265
19.

Charge driven, electrohydrodynamic patterning of thin films.

Pease LF 3rd, Russel WB.

J Chem Phys. 2006 Nov 14;125(18):184716.

PMID:
17115788
20.

Submicron fabrication by local anodic oxidation of germanium thin films.

Oliveira AB, Medeiros-Ribeiro G, Azevedo A.

Nanotechnology. 2009 Aug 26;20(34):345301. doi: 10.1088/0957-4484/20/34/345301. Epub 2009 Aug 4.

PMID:
19652274

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