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Items: 1 to 20 of 111

1.

Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components.

Duparré A, Ferre-Borrull J, Gliech S, Notni G, Steinert J, Bennett JM.

Appl Opt. 2002 Jan 1;41(1):154-71.

PMID:
11900432
2.

Effect of surface roughness and subsurface damage on grazing-incidence x-ray scattering and specular reflectance.

Lodha GS, Yamashita K, Kunieda H, Tawara Y, Yu J, Namba Y, Bennett JM.

Appl Opt. 1998 Aug 1;37(22):5239-52.

PMID:
18286003
3.
4.

Topographic measurements of precision-ground optical glasses.

Bennett JM, Namba Y, Guerra JM, Jahanmir J, Balter TL, Podlesny JC.

Appl Opt. 1997 Apr 1;36(10):2211-6.

PMID:
18253195
5.

Light scatter from polysilicon and aluminum surfaces and comparison with surface-roughness statistics by atomic force microscopy.

Bawolek EJ, Mohr JB, Hirleman ED, Majumdar A.

Appl Opt. 1993 Jul 1;32(19):3377-400. doi: 10.1364/AO.32.003377.

PMID:
20829956
6.

Combining TEM, AFM, and Profilometry for Quantitative Topography Characterization Across All Scales.

Gujrati A, Khanal SR, Pastewka L, Jacobs TDB.

ACS Appl Mater Interfaces. 2018 Aug 29;10(34):29169-29178. doi: 10.1021/acsami.8b09899. Epub 2018 Aug 14.

PMID:
30052425
7.

Wavelength and angular dependence of light scattering from beryllium: comparison of theory and experiment.

Elson JM, Bennett JM, Stover JC.

Appl Opt. 1993 Jul 1;32(19):3362-76. doi: 10.1364/AO.32.003362.

PMID:
20829955
8.

Evaluation of subsurface damage by light scattering techniques.

Trost M, Herffurth T, Schmitz D, Schröder S, Duparré A, Tünnermann A.

Appl Opt. 2013 Sep 10;52(26):6579-88. doi: 10.1364/AO.52.006579.

PMID:
24085136
9.

Light scattering from glossy coatings on paper.

Lettieri TR, Marx E, Song JF, Vorburger TV.

Appl Opt. 1991 Oct 20;30(30):4439-47. doi: 10.1364/AO.30.004439.

PMID:
20717222
10.

Residual surface roughness of diamond-turned optics.

Church EL, Zavada JM.

Appl Opt. 1975 Aug 1;14(8):1788-95. doi: 10.1364/AO.14.001788.

PMID:
20154921
11.

Effect of Two Polishing Systems on Surface Roughness, Topography, and Flexural Strength of a Monolithic Lithium Disilicate Ceramic.

Mohammadibassir M, Rezvani MB, Golzari H, Moravej Salehi E, Fahimi MA, Kharazi Fard MJ.

J Prosthodont. 2019 Jan;28(1):e172-e180. doi: 10.1111/jopr.12586. Epub 2017 Mar 8.

PMID:
28273681
12.

Role of relative size of asperities and adhering particles on the adhesion force.

Kumar A, Staedler T, Jiang X.

J Colloid Interface Sci. 2013 Nov 1;409:211-8. doi: 10.1016/j.jcis.2013.07.039. Epub 2013 Aug 6.

PMID:
23972501
13.

Influence of dental rotary instruments on the roughness and wettability of human dentin surfaces.

Ayad MF, Johnston WM, Rosenstiel SF.

J Prosthet Dent. 2009 Aug;102(2):81-8. doi: 10.1016/S0022-3913(09)60114-1.

PMID:
19643221
14.

Power spectral density analysis and photoconducting behavior in copper(II) phthalocyanine nanostructured thin films.

Karan S, Mallik B.

Phys Chem Chem Phys. 2008 Dec 7;10(45):6751-61. doi: 10.1039/b809648a. Epub 2008 Sep 30.

PMID:
19015778
15.

Influence of tooth preparation burs on the roughness and bond strength of adhesives to human dentin surfaces.

Ayad MF, Maghrabi AA, Saif RE, García-Godoy F.

Am J Dent. 2011 Jun;24(3):176-82.

PMID:
21874939
16.

Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals.

Bussière B, Sanner N, Sentis M, Utéza O.

Sci Rep. 2017 Apr 28;7(1):1249. doi: 10.1038/s41598-017-01192-7.

17.

Roughness characterization of smooth machined surfaces by light scattering.

Stover JC.

Appl Opt. 1975 Aug 1;14(8):1796-802. doi: 10.1364/AO.14.001796.

PMID:
20154922
18.

Power spectral density analysis of optical substrates for gravitational-wave interferometry.

Walsh CJ, Leistner AJ, Oreb BF.

Appl Opt. 1999 Aug 1;38(22):4790-801.

PMID:
18323968
19.

Roughness and Light Scattering of Ion-Beam-Sputtered Fluoride Coatings for 193 nm.

Ferré-Borrull J, Duparré A, Quesnel E.

Appl Opt. 2000 Nov 1;39(31):5854-64.

PMID:
18354589
20.

Regimes of surface roughness measurable with light scattering.

Vorburger TV, Marx E, Lettieri TR.

Appl Opt. 1993 Jul 1;32(19):3401-8. doi: 10.1364/AO.32.003401.

PMID:
20829957

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