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Items: 1 to 20 of 199

1.
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Towards high accuracy calibration of electron backscatter diffraction systems.

Mingard K, Day A, Maurice C, Quested P.

Ultramicroscopy. 2011 Apr;111(5):320-9. doi: 10.1016/j.ultramic.2011.01.012. Epub 2011 Jan 18.

PMID:
21396526
4.

High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.

Wilkinson AJ, Meaden G, Dingley DJ.

Ultramicroscopy. 2006 Mar;106(4-5):307-13. Epub 2005 Nov 15.

PMID:
16324788
5.

Ion beam polishing for three-dimensional electron backscattered diffraction.

Saowadee N, Agersted K, Ubhi HS, Bowen JR.

J Microsc. 2013 Jan;249(1):36-40. doi: 10.1111/j.1365-2818.2012.03677.x. Epub 2012 Nov 5.

6.

Electron backscatter diffraction of grain and subgrain structures - resolution considerations.

Humphreys FJ, Huang Y, Brough I I, Harris C.

J Microsc. 1999 Sep;195(3):212-216.

7.

Orientation effects on indexing of electron backscatter diffraction patterns.

Nowell MM, Wright SI.

Ultramicroscopy. 2005 Apr;103(1):41-58. Epub 2005 Jan 18.

PMID:
15777599
8.

A novel approach for site-specific atom probe specimen preparation by focused ion beam and transmission electron backscatter diffraction.

Babinsky K, De Kloe R, Clemens H, Primig S.

Ultramicroscopy. 2014 Sep;144:9-18. doi: 10.1016/j.ultramic.2014.04.003. Epub 2014 Apr 21.

PMID:
24815026
9.

A 3D Hough transform for indexing EBSD and Kossel patterns.

Maurice C, Fortunier R.

J Microsc. 2008 Jun;230(Pt 3):520-9. doi: 10.1111/j.1365-2818.2008.02045.x.

10.

Application of EBSD to the analysis of interface planes: evolution over the last two decades.

Randle V.

J Microsc. 2008 Jun;230(Pt 3):406-13. doi: 10.1111/j.1365-2818.2008.02000.x. Review.

11.

Energy-filtered electron backscatter diffraction.

Deal A, Hooghan T, Eades A.

Ultramicroscopy. 2008 Jan;108(2):116-25. Epub 2007 Mar 31. Erratum in: Ultramicroscopy. 2008 Jun;108(7):706.

PMID:
17509764
12.

The characterization of low-angle boundaries by EBSD.

Bate PS, Knutsen RD, Brough I, Humphreys FJ.

J Microsc. 2005 Oct;220(Pt 1):36-46.

13.

Optimizing electron backscatter diffraction of carbonate biominerals-resin type and carbon coating.

Pérez-Huerta A, Cusack M.

Microsc Microanal. 2009 Jun;15(3):197-203. doi: 10.1017/S1431927609090370.

PMID:
19460175
14.

Bragg's Law diffraction simulations for electron backscatter diffraction analysis.

Kacher J, Landon C, Adams BL, Fullwood D.

Ultramicroscopy. 2009 Aug;109(9):1148-56. doi: 10.1016/j.ultramic.2009.04.007. Epub 2009 May 27.

PMID:
19520512
15.

Determination of pattern centre in EBSD using the moving-screen technique.

Carpenter DA, Pugh JL, Richardson GD, Mooney LR.

J Microsc. 2007 Sep;227(Pt 3):246-7.

16.
17.

Improving the quality of electron backscatter diffraction (EBSD) patterns from nanoparticles.

Small JA, Michael JR, Bright DS.

J Microsc. 2002 May;206(Pt 2):170-8.

18.

The interpretation of indexing of high Sigma CSL grain boundaries from ceramics.

Shih SJ, Park MB, Cockayne DJ.

J Microsc. 2007 Sep;227(Pt 3):309-14.

19.

An open-source engine for the processing of electron backscatter patterns: EBSD-image.

Pinard PT, Lagacé M, Hovington P, Thibault D, Gauvin R.

Microsc Microanal. 2011 Jun;17(3):374-85. doi: 10.1017/S1431927611000456. Epub 2011 May 6.

PMID:
21554830
20.

Site-specific structural investigations of oxidized nickel samples modified by plasma erosion processes.

Holzapfel C, Soldera F, Faundez EA, Mücklich F.

J Microsc. 2007 Jul;227(Pt 1):42-50.

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