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Items: 46

1.

Anti-scattering effect analyzed with an exact theory of light scattering from rough multilayers.

Soriano G, Zerrad M, Amra C.

Opt Lett. 2019 Sep 15;44(18):4455-4458. doi: 10.1364/OL.44.004455.

PMID:
31517905
2.

International round-robin experiment for angle-resolved light scattering measurement.

von Finck A, Herffurth T, Duparré A, Schröder S, Lequime M, Zerrad M, Liukaityte S, Amra C, Achour S, Chalony M, Kuperman Q, Cornil Y, Bialek A, Goodman T, Greenwell C, Gur B, Brinkers S, Otter G, Vosteen A, Stover J, Vink R, Deep A, Doyle D.

Appl Opt. 2019 Aug 20;58(24):6638-6654. doi: 10.1364/AO.58.006638.

PMID:
31503596
3.

Breakthrough spectrophotometric instrument for the ultra-fine characterization of the spectral transmittance of thin-film optical filters.

Lequime M, Zerrad M, Amra C.

Opt Express. 2018 Dec 24;26(26):34236-34249. doi: 10.1364/OE.26.034236.

PMID:
30650849
4.

Terahertz transmission imaging of inhomogeneous polymer multilayers: theory and experiment.

Poulin C, Zerrad M, Triki M, Guille A, Antonini T, Amra C.

Appl Opt. 2018 Dec 20;57(36):10380-10389. doi: 10.1364/AO.57.010380.

PMID:
30645381
5.

Broadband loss-less optical thin-film depolarizing devices.

Ailloud Q, Zerrad M, Amra C.

Opt Express. 2018 May 14;26(10):13264-13288. doi: 10.1364/OE.26.013264.

PMID:
29801353
6.

Instantaneous one-angle white-light scatterometer.

Amra C, Zerrad M, Liukaityte S, Lequime M.

Opt Express. 2018 Jan 8;26(1):204-219. doi: 10.1364/OE.26.000204.

PMID:
29328298
7.

Development of Transcription Factor-Based Designer Macrolide Biosensors for Metabolic Engineering and Synthetic Biology.

Kasey CM, Zerrad M, Li Y, Cropp TA, Williams GJ.

ACS Synth Biol. 2018 Jan 19;7(1):227-239. doi: 10.1021/acssynbio.7b00287. Epub 2017 Oct 12.

8.

Transformational fluctuation electrodynamics: application to thermal radiation illusion.

Alwakil A, Zerrad M, Bellieud M, Veynante D, Enguehard F, Rolland N, Volz S, Amra C.

Opt Express. 2017 Jul 24;25(15):17343-17355. doi: 10.1364/OE.25.017343.

PMID:
28789226
9.

Bandwidths limitations of giant optical field enhancements in dielectric multi-layers.

Zerrad M, Lereu AL, N'diaye C, Lemarchand F, Amra C.

Opt Express. 2017 Jun 26;25(13):14883-14891. doi: 10.1364/OE.25.014883.

PMID:
28789070
10.

Backside absorbing layer microscopy: Watching graphene chemistry.

Campidelli S, Abou Khachfe R, Jaouen K, Monteiller J, Amra C, Zerrad M, Cornut R, Derycke V, Ausserré D.

Sci Adv. 2017 May 12;3(5):e1601724. doi: 10.1126/sciadv.1601724. eCollection 2017 May.

11.

Inverse heat mimicking of given objects.

Alwakil A, Zerrad M, Bellieud M, Amra C.

Sci Rep. 2017 Mar 2;7:43288. doi: 10.1038/srep43288.

12.

Light scattered by optical coatings: numerical predictions and comparison to experiment for a global analysis.

Zerrad M, Liukaityte S, Lequime M, Amra C.

Appl Opt. 2016 Dec 1;55(34):9680-9687. doi: 10.1364/AO.55.009680.

PMID:
27958463
13.

Analogies between optical propagation and heat diffusion: applications to microcavities, gratings and cloaks.

Amra C, Petiteau D, Zerrad M, Guenneau S, Soriano G, Gralak B, Bellieud M, Veynante D, Rolland N.

Proc Math Phys Eng Sci. 2015 Nov 8;471(2183):20150143.

14.

Ultra-wide-range measurements of thin-film filter optical density over the visible and near-infrared spectrum.

Lequime M, Liukaityte S, Zerrad M, Amra C.

Opt Express. 2015 Oct 5;23(20):26863-78. doi: 10.1364/OE.23.026863.

PMID:
26480197
15.

Speckle intensity statistics for chromatic scattering media under partially polarized illumination.

Soriano G, Zerrad M, Amra C.

Opt Express. 2015 Aug 10;23(16):20796-803. doi: 10.1364/OE.23.020796.

PMID:
26367932
16.

Phase retrieval of reflection and transmission coefficients from Kramers-Kronig relations.

Gralak B, Lequime M, Zerrad M, Amra C.

J Opt Soc Am A Opt Image Sci Vis. 2015 Mar 1;32(3):456-62. doi: 10.1364/JOSAA.32.000456.

PMID:
26366657
17.

Broadband spectral transmittance measurements of complex thin-film filters with optical densities of up to 12.

Liukaityte S, Lequime M, Zerrad M, Begou T, Amra C.

Opt Lett. 2015 Jul 15;40(14):3225-8. doi: 10.1364/OL.40.003225.

PMID:
26176435
18.

Spatial depolarization of light from the bulks: electromagnetic prediction.

Zerrad M, Tortel H, Soriano G, Ghabbach A, Amra C.

Opt Express. 2015 Apr 6;23(7):8246-60. doi: 10.1364/OE.23.008246.

PMID:
25968663
19.

Optical systems for controlled specular depolarization.

Zerrad M, Luitot C, Berthon J, Amra C.

Opt Lett. 2014 Dec 15;39(24):6919-22. doi: 10.1364/OL.39.006919.

PMID:
25503030
20.

Spectral effectiveness of engineered thermal cloaks in the frequency regime.

Petiteau D, Guenneau S, Bellieud M, Zerrad M, Amra C.

Sci Rep. 2014 Dec 9;4:7386. doi: 10.1038/srep07386.

21.

Polarization analysis of speckle field below its transverse correlation width : application to surface and bulk scattering.

Dupont J, Orlik X, Ghabbach A, Zerrad M, Soriano G, Amra C.

Opt Express. 2014 Oct 6;22(20):24133-41. doi: 10.1364/OE.22.024133.

PMID:
25321988
22.

Bicephalous transformed media: concentrator versus rotator and cloak versus superscatterer.

Guenneau S, Petiteau D, Zerrad M, Amra C.

Opt Express. 2014 Sep 22;22(19):23614-9. doi: 10.1364/OE.22.023614.

PMID:
25321827
23.

Depolarization and enpolarization dop histograms measured for surface and bulk speckle patterns.

Ghabbach A, Zerrad M, Soriano G, Liukaityte S, Amra C.

Opt Express. 2014 Sep 8;22(18):21427-40. doi: 10.1364/OE.22.021427.

PMID:
25321521
24.

Accurate metrology of polarization curves measured at the speckle size of visible light scattering.

Ghabbach A, Zerrad M, Soriano G, Amra C.

Opt Express. 2014 Jun 16;22(12):14594-609. doi: 10.1364/OE.22.014594.

PMID:
24977555
25.

Enpolarization and depolarization of light scattered from chromatic complex media.

Soriano G, Zerrad M, Amra C.

Opt Express. 2014 May 19;22(10):12603-13. doi: 10.1364/OE.22.012603.

PMID:
24921377
26.

Negative-index materials: a key to "white" multilayer Fabry-Perot.

Lequime M, Gralak B, Guenneau S, Zerrad M, Amra C.

Opt Lett. 2014 Apr 1;39(7):1729-32. doi: 10.1364/OL.39.001729.

PMID:
24686590
27.

Scattering losses in multidielectric structures designed for giant optical field enhancement.

Lereu AL, Zerrad M, Ndiaye C, Lemarchand F, Amra C.

Appl Opt. 2014 Feb 1;53(4):A412-6. doi: 10.1364/AO.53.00A412.

PMID:
24514246
28.

Spatially resolved surface topography retrieved from far-field intensity scattering measurements.

Zerrad M, Lequime M, Amra C.

Appl Opt. 2014 Feb 1;53(4):A297-304. doi: 10.1364/AO.53.00A297.

PMID:
24514231
29.

Mapping the coherence time of far-field speckle scattered by disordered media.

Soriano G, Zerrad M, Amra C.

Opt Express. 2013 Oct 7;21(20):24191-200. doi: 10.1364/OE.21.024191.

PMID:
24104329
30.

Light enpolarization by disordered media under partial polarized illumination: the role of cross-scattering coefficients.

Zerrad M, Soriano G, Ghabbach A, Amra C.

Opt Express. 2013 Feb 11;21(3):2787-94. doi: 10.1364/OE.21.002787.

PMID:
23481735
31.

Coherence and polarization properties in speckle of totally depolarized light scattered by totally depolarizing media.

Réfrégier P, Zerrad M, Amra C.

Opt Lett. 2012 Jun 1;37(11):2055-7. doi: 10.1364/OL.37.002055.

PMID:
22660119
32.

A high accuracy femto-/picosecond laser damage test facility dedicated to the study of optical thin films.

Mangote B, Gallais L, Zerrad M, Lemarchand F, Gao LH, Commandré M, Lequime M.

Rev Sci Instrum. 2012 Jan;83(1):013109. doi: 10.1063/1.3677324.

PMID:
22299931
33.

Enpolarization of light by scattering media.

Sorrentini J, Zerrad M, Soriano G, Amra C.

Opt Express. 2011 Oct 24;19(22):21313-20. doi: 10.1364/OE.19.021313.

PMID:
22108982
34.

Optimal design for 100% absorption and maximum field enhancement in thin-film multilayers at resonances under total reflection.

Ndiaye C, Lemarchand F, Zerrad M, Ausserré D, Amra C.

Appl Opt. 2011 Mar 20;50(9):C382-7. doi: 10.1364/AO.50.00C382.

PMID:
21460968
35.

Instantaneous spatially resolved acquisition of polarimetric and angular scattering properties in optical coatings.

Zerrad M, Lequime M.

Appl Opt. 2011 Mar 20;50(9):C217-21. doi: 10.1364/AO.50.00C217.

PMID:
21460941
36.

Characterization of zirconia- and niobia-silica mixture coatings produced by ion-beam sputtering.

Melninkaitis A, Tolenis T, Mažulė L, Mirauskas J, Sirutkaitis V, Mangote B, Fu X, Zerrad M, Gallais L, Commandré M, Kičas S, Drazdys R.

Appl Opt. 2011 Mar 20;50(9):C188-96. doi: 10.1364/AO.50.00C188.

PMID:
21460936
37.

Laser-induced damage of hafnia coatings as a function of pulse duration in the femtosecond to nanosecond range.

Gallais L, Mangote B, Zerrad M, Commandré M, Melninkaitis A, Mirauskas J, Jeskevic M, Sirutkaitis V.

Appl Opt. 2011 Mar 20;50(9):C178-87. doi: 10.1364/AO.50.00C178.

PMID:
21460935
38.

Gradual loss of polarization in light scattered from rough surfaces: electromagnetic prediction.

Zerrad M, Sorrentini J, Soriano G, Amra C.

Opt Express. 2010 Jul 19;18(15):15832-43. doi: 10.1364/OE.18.015832.

PMID:
20720965
39.

Statistical signatures of random media and their correlation to polarization properties.

Sorrentini J, Zerrad M, Amra C.

Opt Lett. 2009 Aug 15;34(16):2429-31.

PMID:
19684805
40.

An enhanced contrast to detect bulk objects under arbitrary rough surfaces.

Arnaud L, Georges G, Sorrentini J, Zerrad M, Deumié C, Amra C.

Opt Express. 2009 Mar 30;17(7):5758-73.

PMID:
19333345
41.

Partial polarization of light induced by random defects at surfaces or bulks.

Amra C, Zerrad M, Siozade L, Georges G, Deumié C.

Opt Express. 2008 Jul 7;16(14):10372-83.

PMID:
18607448
42.

From angle-resolved ellipsometry of light scattering to imaging in random media.

Georges G, Arnaud L, Siozade L, Le Neindre N, Chazallet F, Zerrad M, Deumié C, Amra C.

Appl Opt. 2008 May 1;47(13):C257-65.

PMID:
18449255
43.

An alternative scattering method to characterize surface roughness from transparent substrates.

Zerrad M, Deumié C, Lequime M, Amra C.

Opt Express. 2007 Jul 23;15(15):9222-31.

PMID:
19547263
44.

Multidielectric quarter-wave coatings on microspheres: a study in colorimetric space.

Voarino P, Zerrad M, Deumié C, Amra C.

Appl Opt. 2006 Mar 1;45(7):1469-77.

PMID:
16544428
45.

Light-scattering characterization of transparent substrates.

Zerrad M, Deumié C, Lequime M, Amra C, Ewart M.

Appl Opt. 2006 Mar 1;45(7):1402-9.

PMID:
16539243
46.

Optical characterization of an unknown single layer: Institut Fresnel contribution to the Optical Interference Coatings 2004 Topical Meeting Measurement Problem.

Lemarchand F, Deumié C, Zerrad M, Abel-Tiberini L, Bertussi B, Georges G, Lazaridès B, Cathelinaud M, Lequime M, Amra C.

Appl Opt. 2006 Mar 1;45(7):1312-8.

PMID:
16539226

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