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Items: 38

1.

ALPHABETA: a dedicated open-source tool for calculating TEM stage tilt angles.

Cautaerts N, Delville R, Schryvers D.

J Microsc. 2019 Mar;273(3):189-198. doi: 10.1111/jmi.12774. Epub 2018 Dec 24.

PMID:
30582629
2.

Dislocation driven nanosample plasticity: new insights from quantitative in-situ TEM tensile testing.

Samaee V, Gatti R, Devincre B, Pardoen T, Schryvers D, Idrissi H.

Sci Rep. 2018 Aug 13;8(1):12012. doi: 10.1038/s41598-018-30639-8.

3.

Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp.

Guzzinati G, Altantzis T, Batuk M, De Backer A, Lumbeeck G, Samaee V, Batuk D, Idrissi H, Hadermann J, Van Aert S, Schryvers D, Verbeeck J, Bals S.

Materials (Basel). 2018 Jul 28;11(8). pii: E1304. doi: 10.3390/ma11081304. Review.

4.

Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations.

Schryvers D, Salje EKH, Nishida M, De Backer A, Idrissi H, Van Aert S.

Ultramicroscopy. 2017 May;176:194-199. doi: 10.1016/j.ultramic.2016.12.022. Epub 2017 Jan 9.

PMID:
28162832
5.

Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach.

Samaeeaghmiyoni V, Idrissi H, Groten J, Schwaiger R, Schryvers D.

Micron. 2017 Mar;94:66-73. doi: 10.1016/j.micron.2016.12.005. Epub 2016 Dec 21.

PMID:
28076759
6.

Electronically decoupled stacking fault tetrahedra embedded in Au(111) films.

Schouteden K, Amin-Ahmadi B, Li Z, Muzychenko D, Schryvers D, Van Haesendonck C.

Nat Commun. 2016 Dec 23;7:14001. doi: 10.1038/ncomms14001.

7.

Melamine-Formaldehyde Microcapsules: Micro- and Nanostructural Characterization with Electron Microscopy.

Heidari H, Rivero G, Idrissi H, Ramachandran D, Cakir S, Egoavil R, Kurttepeli M, Crabbé AC, Hauffman T, Terryn H, Du Prez F, Schryvers D.

Microsc Microanal. 2016 Dec;22(6):1222-1232. doi: 10.1017/S1431927616012484.

PMID:
27998368
8.

Internal architecture of coffin-shaped ZSM-5 zeolite crystals with hourglass contrast unravelled by focused ion beam-assisted transmission electron microscopy.

Lu J, Bartholomeeusen E, Sels BF, Schryvers D.

J Microsc. 2017 Jan;265(1):27-33. doi: 10.1111/jmi.12459. Epub 2016 Aug 19.

PMID:
27542152
9.

TEM and AES investigations of the natural surface nano-oxide layer of an AISI 316L stainless steel microfibre.

Ramachandran D, Egoavil R, Crabbe A, Hauffman T, Abakumov A, Verbeeck J, Vandendael I, Terryn H, Schryvers D.

J Microsc. 2016 Nov;264(2):207-214. doi: 10.1111/jmi.12434. Epub 2016 Jun 17.

PMID:
27313097
10.

Low-temperature plasticity of olivine revisited with in situ TEM nanomechanical testing.

Idrissi H, Bollinger C, Boioli F, Schryvers D, Cordier P.

Sci Adv. 2016 Mar 11;2(3):e1501671. doi: 10.1126/sciadv.1501671. eCollection 2016 Mar.

11.

Dislocation-mediated relaxation in nanograined columnar palladium films revealed by on-chip time-resolved HRTEM testing.

Colla MS, Amin-Ahmadi B, Idrissi H, Malet L, Godet S, Raskin JP, Schryvers D, Pardoen T.

Nat Commun. 2015 Jan 5;6:5922. doi: 10.1038/ncomms6922.

12.

Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM.

Grieten E, Caen J, Schryvers D.

Microsc Microanal. 2014 Oct;20(5):1585-90. doi: 10.1017/S1431927614012860.

PMID:
25256650
13.

Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy.

Lu J, Roeffaers MB, Bartholomeeusen E, Sels BF, Schryvers D.

Microsc Microanal. 2014 Feb;20(1):42-9. doi: 10.1017/S1431927613013731. Epub 2013 Nov 5.

PMID:
24188095
14.

Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials.

Schryvers D, Cao S, Tirry W, Idrissi H, Van Aert S.

Sci Technol Adv Mater. 2013 Mar 13;14(1):014206. eCollection 2013 Feb. Review.

15.

Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy.

Van Aert S, Turner S, Delville R, Schryvers D, Van Tendeloo G, Salje EK.

Adv Mater. 2012 Jan 24;24(4):523-7. doi: 10.1002/adma.201103717. Epub 2011 Dec 23.

PMID:
22223264
16.

Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films: an electron tomography and aberration-corrected high-resolution ADF-STEM study.

Idrissi H, Turner S, Mitsuhara M, Wang B, Hata S, Coulombier M, Raskin JP, Pardoen T, Van Tendeloo G, Schryvers D.

Microsc Microanal. 2011 Dec;17(6):983-90. doi: 10.1017/S143192761101213X. Epub 2011 Oct 27.

PMID:
22030303
17.

Ultrahigh strain hardening in thin palladium films with nanoscale twins.

Idrissi H, Wang B, Colla MS, Raskin JP, Schryvers D, Pardoen T.

Adv Mater. 2011 May 10;23(18):2119-22. doi: 10.1002/adma.201004160. Epub 2011 Apr 4. No abstract available.

PMID:
21462371
18.

Reducing the formation of FIB-induced FCC layers on Cu-Zn-Al austenite.

Zelaya E, Schryvers D.

Microsc Res Tech. 2011 Jan;74(1):84-91. doi: 10.1002/jemt.20877.

PMID:
21181714
19.

Nanodiamonds do not provide unique evidence for a Younger Dryas impact.

Tian H, Schryvers D, Claeys P.

Proc Natl Acad Sci U S A. 2011 Jan 4;108(1):40-4. doi: 10.1073/pnas.1007695108. Epub 2010 Dec 20.

20.

Characterization of nickel silicides using EELS-based methods.

Verleysen E, Bender H, Richard O, Schryvers D, Vandervorst W.

J Microsc. 2010 Oct;240(1):75-82. doi: 10.1111/j.1365-2818.2010.03391.x.

21.

Stability of Ni in nitinol oxide surfaces.

Tian H, Schryvers D, Liu D, Jiang Q, Van Humbeeck J.

Acta Biomater. 2011 Feb;7(2):892-9. doi: 10.1016/j.actbio.2010.09.009. Epub 2010 Sep 16.

PMID:
20849983
22.

Linking a completely three-dimensional nanostrain to a structural transformation eigenstrain.

Tirry W, Schryvers D.

Nat Mater. 2009 Sep;8(9):752-7. doi: 10.1038/nmat2488. Epub 2009 Jun 21.

PMID:
19543276
23.

Optimization of a FIB/SEM slice-and-view study of the 3D distribution of Ni4Ti3 precipitates in Ni-Ti.

Cao S, Tirry W, Van Den Broek W, Schryvers D.

J Microsc. 2009 Jan;233(1):61-8. doi: 10.1111/j.1365-2818.2008.03095.x.

24.

Tomographic spectroscopic imaging; an experimental proof of concept.

Van den Broek W, Verbeeck J, Schryvers D, De Backer S, Scheunders P.

Ultramicroscopy. 2009 Mar;109(4):296-303. doi: 10.1016/j.ultramic.2008.11.022. Epub 2008 Dec 9.

PMID:
19150751
25.

Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire.

Tian H, Schryvers D, Shabalovskaya S, Van Humbeeck J.

Microsc Microanal. 2009 Feb;15(1):62-70. doi: 10.1017/S1431927609090059.

PMID:
19144259
26.

Hepatocellular transport and gastrointestinal absorption of lanthanum in chronic renal failure.

Bervoets AR, Behets GJ, Schryvers D, Roels F, Yang Z, Verberckmoes SC, Damment SJ, Dauwe S, Mubiana VK, Blust R, De Broe ME, D'Haese PC.

Kidney Int. 2009 Feb;75(4):389-98. doi: 10.1038/ki.2008.571. Epub 2008 Dec 3.

27.

The influence of surface oxides on the distribution and release of nickel from Nitinol wires.

Shabalovskaya SA, Tian H, Anderegg JW, Schryvers DU, Carroll WU, Van Humbeeck J.

Biomaterials. 2009 Feb;30(4):468-77. doi: 10.1016/j.biomaterials.2008.10.014. Epub 2008 Nov 8.

PMID:
18996586
28.

Evaluation of top, angle, and side cleaned FIB samples for TEM analysis.

Montoya E, Bals S, Rossell MD, Schryvers D, Van Tendeloo G.

Microsc Res Tech. 2007 Dec;70(12):1060-71.

PMID:
17722055
29.

High-quality sample preparation by low kV FIB thinning for analytical TEM measurements.

Bals S, Tirry W, Geurts R, Yang Z, Schryvers D.

Microsc Microanal. 2007 Apr;13(2):80-6.

PMID:
17367547
30.

Cross-section transmission electron microscopy characterization of the near-surface structure of medical Nitinol superelastic tubing.

Potapov PL, Tirry W, Schryvers D, Sivel VG, Wu MY, Aslanidis D, Zandbergen H.

J Mater Sci Mater Med. 2007 Mar;18(3):483-92.

PMID:
17334699
31.

Electron-diffraction structure refinement of Ni4Ti3 precipitates in Ni52Ti48.

Tirry W, Schryvers D, Jorissen K, Lamoen D.

Acta Crystallogr B. 2006 Dec;62(Pt 6):966-71. Epub 2006 Nov 14.

PMID:
17108648
33.

Study of changes in composition and EELS ionization edges upon Ni4Ti3 precipitation in a NiTi alloy.

Yang Z, Schryvers D.

Micron. 2006;37(5):503-7. Epub 2005 Sep 7.

PMID:
16182550
34.

Measuring the absolute position of EELS ionisation edges in a TEM.

Potapov PL, Schryvers D.

Ultramicroscopy. 2004 Feb;99(1):73-85.

PMID:
15013515
35.

Study of changes in L32 EELS ionization edges upon formation of Ni-based intermetallic compounds.

Potapov PL, Kulkova SE, Schryvers D.

J Microsc. 2003 Apr;210(Pt 1):102-9.

36.

Transmission electron microscopy studies of (111) twinned silver halide microcrystals.

Goessens C, Schryvers D, Van Landuyt J.

Microsc Res Tech. 1998 Jul 15;42(2):85-99.

PMID:
9728880
37.

Internal calibration technique for HREM studies of nanoscale particles.

Schryvers D, Goessens C, Safran G, Toth L.

Microsc Res Tech. 1993 Jun 1;25(2):185-6. No abstract available.

PMID:
8518490
38.

Neutron-scattering and electron-microscopy studies of the premartensitic phenomena in NixAl100-x alloys.

Shapiro SM, Yang BX, Noda Y, Tanner LE, Schryvers D.

Phys Rev B Condens Matter. 1991 Nov 1;44(17):9301-9313. No abstract available.

PMID:
9998910

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