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Items: 11


Structure and Stability of Partial Dislocation Complexes in 3C-SiC by Molecular Dynamics Simulations.

Sarikov A, Marzegalli A, Barbisan L, Montalenti F, Miglio L.

Materials (Basel). 2019 Sep 18;12(18). pii: E3027. doi: 10.3390/ma12183027.


Anisotropic extended misfit dislocations in overcritical SiGe films by local substrate patterning.

Bollani M, Chrastina D, Ruggeri R, Nicotra G, Gagliano L, Bonera E, Mondiali V, Marzegalli A, Montalenti F, Spinella C, Miglio L.

Nanotechnology. 2016 Oct 21;27(42):425301. doi: 10.1088/0957-4484/27/42/425301. Epub 2016 Sep 8.


Photodetection in Hybrid Single-Layer Graphene/Fully Coherent Germanium Island Nanostructures Selectively Grown on Silicon Nanotip Patterns.

Niu G, Capellini G, Lupina G, Niermann T, Salvalaglio M, Marzegalli A, Schubert MA, Zaumseil P, Krause HM, Skibitzki O, Lehmann M, Montalenti F, Xie YH, Schroeder T.

ACS Appl Mater Interfaces. 2016 Jan 27;8(3):2017-26. doi: 10.1021/acsami.5b10336. Epub 2016 Jan 13.


InAs/GaAs Sharply Defined Axial Heterostructures in Self-Assisted Nanowires.

Scarpellini D, Somaschini C, Fedorov A, Bietti S, Frigeri C, Grillo V, Esposito L, Salvalaglio M, Marzegalli A, Montalenti F, Bonera E, Medaglia PG, Sanguinetti S.

Nano Lett. 2015 Jun 10;15(6):3677-83. doi: 10.1021/nl504690r. Epub 2015 May 7.


Burgers Vector Analysis of Vertical Dislocations in Ge Crystals by Large-Angle Convergent Beam Electron Diffraction.

Groiss H, Glaser M, Marzegalli A, Isa F, Isella G, Miglio L, Schäffler F.

Microsc Microanal. 2015 Jun;21(3):637-45. doi: 10.1017/S1431927615000537. Epub 2015 May 5.


Imaging Structure and Composition Homogeneity of 300 mm SiGe Virtual Substrates for Advanced CMOS Applications by Scanning X-ray Diffraction Microscopy.

Zoellner MH, Richard MI, Chahine GA, Zaumseil P, Reich C, Capellini G, Montalenti F, Marzegalli A, Xie YH, Schülli TU, Häberlen M, Storck P, Schroeder T.

ACS Appl Mater Interfaces. 2015 May 6;7(17):9031-7. doi: 10.1021/am508968b. Epub 2015 Apr 28.


Perfect crystals grown from imperfect interfaces.

Falub CV, Meduňa M, Chrastina D, Isa F, Marzegalli A, Kreiliger T, Taboada AG, Isella G, Miglio L, Dommann A, von Känel H.

Sci Rep. 2013;3:2276. doi: 10.1038/srep02276.


Unexpected dominance of vertical dislocations in high-misfit ge/si(001) films and their elimination by deep substrate patterning.

Marzegalli A, Isa F, Groiss H, Müller E, Falub CV, Taboada AG, Niedermann P, Isella G, Schäffler F, Montalenti F, von Känel H, Miglio L.

Adv Mater. 2013 Aug 27;25(32):4408-12. doi: 10.1002/adma.201300550. Epub 2013 Jun 21.


Scaling hetero-epitaxy from layers to three-dimensional crystals.

Falub CV, von Känel H, Isa F, Bergamaschini R, Marzegalli A, Chrastina D, Isella G, Müller E, Niedermann P, Miglio L.

Science. 2012 Mar 16;335(6074):1330-4. doi: 10.1126/science.1217666.


Strained MOSFETs on ordered SiGe dots.

Cervenka J, Kosina H, Selberherr S, Zhang J, Hrauda N, Stangl J, Bauer G, Vastola G, Marzegalli A, Montalenti F, Miglio L.

Solid State Electron. 2011 Nov;65-66(6-3):81-87.


Critical shape and size for dislocation nucleation in Si1-xGex islands on Si(001).

Marzegalli A, Zinovyev VA, Montalenti F, Rastelli A, Stoffel M, Merdzhanova T, Schmidt OG, Miglio L.

Phys Rev Lett. 2007 Dec 7;99(23):235505. Epub 2007 Dec 7.


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