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Items: 23

1.

Conversion of a Patterned Organic Resist into a High Performance Inorganic Hard Mask for High Resolution Pattern Transfer.

Marneffe JF, Chan BT, Spieser M, Vereecke G, Naumov S, Vanhaeren D, Wolf H, Knoll AW.

ACS Nano. 2018 Nov 27;12(11):11152-11160. doi: 10.1021/acsnano.8b05596. Epub 2018 Oct 16.

PMID:
30481961
2.

Fast turnaround fabrication of silicon point-contact quantum-dot transistors using combined thermal scanning probe lithography and laser writing.

Rawlings C, Ryu YK, Rüegg M, Lassaline N, Schwemmer C, Duerig U, Knoll AW, Durrani Z, Wang C, Liu D, Jones ME.

Nanotechnology. 2018 Dec 14;29(50):505302. doi: 10.1088/1361-6528/aae3df. Epub 2018 Sep 24.

PMID:
30248025
3.

Experimental Observation of Current Reversal in a Rocking Brownian Motor.

Schwemmer C, Fringes S, Duerig U, Ryu YK, Knoll AW.

Phys Rev Lett. 2018 Sep 7;121(10):104102. doi: 10.1103/PhysRevLett.121.104102.

PMID:
30240236
4.

Nanofluidic rocking Brownian motors.

Skaug MJ, Schwemmer C, Fringes S, Rawlings CD, Knoll AW.

Science. 2018 Mar 30;359(6383):1505-1508. doi: 10.1126/science.aal3271.

PMID:
29599239
5.

The nanofluidic confinement apparatus: studying confinement-dependent nanoparticle behavior and diffusion.

Fringes S, Holzner F, Knoll AW.

Beilstein J Nanotechnol. 2018 Jan 26;9:301-310. doi: 10.3762/bjnano.9.30. eCollection 2018.

6.

Explaining the Transition from Diffusion Limited to Reaction Limited Surface Assembly of Molecular Species through Spatial Variations.

Carroll KM, Knoll AW, Wolf H, Duerig U.

Langmuir. 2018 Jan 9;34(1):73-80. doi: 10.1021/acs.langmuir.7b03050. Epub 2017 Dec 29.

7.

Testing the Equivalence between Spatial Averaging and Temporal Averaging in Highly Dilute Solutions.

Carroll KM, Rawlings C, Zhang Y, Knoll AW, Marder SR, Wolf H, Duerig U.

Langmuir. 2017 Dec 26;33(51):14539-14547. doi: 10.1021/acs.langmuir.7b02730. Epub 2017 Dec 15.

PMID:
29206465
8.

Control of the interaction strength of photonic molecules by nanometer precise 3D fabrication.

Rawlings CD, Zientek M, Spieser M, Urbonas D, Stöferle T, Mahrt RF, Lisunova Y, Brugger J, Duerig U, Knoll AW.

Sci Rep. 2017 Nov 28;7(1):16502. doi: 10.1038/s41598-017-16496-x.

9.

Sub-10 Nanometer Feature Size in Silicon Using Thermal Scanning Probe Lithography.

Ryu Cho YK, Rawlings CD, Wolf H, Spieser M, Bisig S, Reidt S, Sousa M, Khanal SR, Jacobs TDB, Knoll AW.

ACS Nano. 2017 Dec 26;11(12):11890-11897. doi: 10.1021/acsnano.7b06307. Epub 2017 Nov 1.

10.

Thermal scanning probe lithography for the directed self-assembly of block copolymers.

Gottlieb S, Lorenzoni M, Evangelio L, Fernández-Regúlez M, Ryu YK, Rawlings C, Spieser M, Knoll AW, Perez-Murano F.

Nanotechnology. 2017 Apr 28;28(17):175301. doi: 10.1088/1361-6528/aa673c.

PMID:
28374684
11.

Accurate Location and Manipulation of Nanoscaled Objects Buried under Spin-Coated Films.

Rawlings C, Wolf H, Hedrick JL, Coady DJ, Duerig U, Knoll AW.

ACS Nano. 2015 Jun 23;9(6):6188-95. doi: 10.1021/acsnano.5b01485. Epub 2015 Jun 11.

PMID:
26046586
12.

Surface science. Adhesion and friction in mesoscopic graphite contacts.

Koren E, Lörtscher E, Rawlings C, Knoll AW, Duerig U.

Science. 2015 May 8;348(6235):679-83. doi: 10.1126/science.aaa4157.

13.

Direct experimental observation of stacking fault scattering in highly oriented pyrolytic graphite meso-structures.

Koren E, Knoll AW, Lörtscher E, Duerig U.

Nat Commun. 2014 Dec 16;5:5837. doi: 10.1038/ncomms6837.

PMID:
25510583
14.

Advanced scanning probe lithography.

Garcia R, Knoll AW, Riedo E.

Nat Nanotechnol. 2014 Aug;9(8):577-87. doi: 10.1038/nnano.2014.157.

PMID:
25091447
15.

Frictional dissipation in a polymer bilayer system.

Jansen L, Lantz MA, Knoll AW, Schirmeisen A, Gotsmann B.

Langmuir. 2014 Feb 18;30(6):1557-65. doi: 10.1021/la404537u. Epub 2014 Feb 3.

PMID:
24456524
16.

Nanoscale contact-radius determination by spectral analysis of polymer roughness images.

Knoll AW.

Langmuir. 2013 Nov 12;29(45):13958-66. doi: 10.1021/la403105q. Epub 2013 Oct 23.

PMID:
24151855
17.

Thermal probe maskless lithography for 27.5 nm half-pitch Si technology.

Cheong LL, Paul P, Holzner F, Despont M, Coady DJ, Hedrick JL, Allen R, Knoll AW, Duerig U.

Nano Lett. 2013 Sep 11;13(9):4485-91. doi: 10.1021/nl4024066. Epub 2013 Aug 23.

PMID:
23965001
18.

Nanoscale thermomechanics of wear-resilient polymeric bilayer systems.

Kaule T, Zhang Y, Emmerling S, Pihan S, Foerch R, Gutmann J, Butt HJ, Berger R, Duerig U, Knoll AW.

ACS Nano. 2013 Jan 22;7(1):748-59. doi: 10.1021/nn305047m. Epub 2012 Dec 21.

PMID:
23256440
19.

Field stitching in thermal probe lithography by means of surface roughness correlation.

Paul P, Knoll AW, Holzner F, Duerig U.

Nanotechnology. 2012 Sep 28;23(38):385307. doi: 10.1088/0957-4484/23/38/385307. Epub 2012 Sep 5.

PMID:
22948486
20.

Directed placement of gold nanorods using a removable template for guided assembly.

Holzner F, Kuemin C, Paul P, Hedrick JL, Wolf H, Spencer ND, Duerig U, Knoll AW.

Nano Lett. 2011 Sep 14;11(9):3957-62. doi: 10.1021/nl202276q. Epub 2011 Aug 25.

PMID:
21854023
21.

Rapid turnaround scanning probe nanolithography.

Paul PC, Knoll AW, Holzner F, Despont M, Duerig U.

Nanotechnology. 2011 Jul 8;22(27):275306. doi: 10.1088/0957-4484/22/27/275306. Epub 2011 May 23.

PMID:
21602616
22.

Probe-based 3-D nanolithography using self-amplified depolymerization polymers.

Knoll AW, Pires D, Coulembier O, Dubois P, Hedrick JL, Frommer J, Duerig U.

Adv Mater. 2010 Aug 17;22(31):3361-5. doi: 10.1002/adma.200904386. No abstract available.

PMID:
20419710
23.

Nanoscale three-dimensional patterning of molecular resists by scanning probes.

Pires D, Hedrick JL, De Silva A, Frommer J, Gotsmann B, Wolf H, Despont M, Duerig U, Knoll AW.

Science. 2010 May 7;328(5979):732-5. doi: 10.1126/science.1187851. Epub 2010 Apr 22.

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