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Items: 41

1.

Non-equilibrium lattice dynamics of one-dimensional In chains on Si(111) upon ultrafast optical excitation.

Frigge T, Hafke B, Witte T, Krenzer B, Horn-von Hoegen M.

Struct Dyn. 2018 Mar 26;5(2):025101. doi: 10.1063/1.5016619. eCollection 2018 Mar.

2.

Short-range surface plasmonics: Localized electron emission dynamics from a 60-nm spot on an atomically flat single-crystalline gold surface.

Frank B, Kahl P, Podbiel D, Spektor G, Orenstein M, Fu L, Weiss T, Horn-von Hoegen M, Davis TJ, Meyer Zu Heringdorf FJ, Giessen H.

Sci Adv. 2017 Jul 12;3(7):e1700721. doi: 10.1126/sciadv.1700721. eCollection 2017 Jul.

3.

Optically excited structural transition in atomic wires on surfaces at the quantum limit.

Frigge T, Hafke B, Witte T, Krenzer B, Streubühr C, Samad Syed A, Mikšić Trontl V, Avigo I, Zhou P, Ligges M, von der Linde D, Bovensiepen U, Horn-von Hoegen M, Wippermann S, Lücke A, Sanna S, Gerstmann U, Schmidt WG.

Nature. 2017 Apr 13;544(7649):207-211. doi: 10.1038/nature21432. Epub 2017 Mar 29.

PMID:
28355177
4.

Spot profile analysis and lifetime mapping in ultrafast electron diffraction: Lattice excitation of self-organized Ge nanostructures on Si(001).

Frigge T, Hafke B, Tinnemann V, Witte T, Horn-von Hoegen M.

Struct Dyn. 2015 Jun 5;2(3):035101. doi: 10.1063/1.4922023. eCollection 2015 May.

5.

Frigge et al. reply.

Frigge T, Wall S, Krenzer B, Wippermann S, Sanna S, Klasing F, Hanisch-Blicharski A, Kammler M, Schmidt WG, Horn-von Hoegen M.

Phys Rev Lett. 2013 Oct 4;111(14):149602. Epub 2013 Oct 1. No abstract available.

PMID:
24138278
6.

To tilt or not to tilt: correction of the distortion caused by inclined sample surfaces in low-energy electron diffraction.

Sojka F, Meissner M, Zwick C, Forker R, Vyshnepolsky M, Klein C, Horn-von Hoegen M, Fritz T.

Ultramicroscopy. 2013 Oct;133:35-40. doi: 10.1016/j.ultramic.2013.04.005. Epub 2013 Apr 29.

PMID:
23770540
7.

Atomistic picture of charge density wave formation at surfaces.

Wall S, Krenzer B, Wippermann S, Sanna S, Klasing F, Hanisch-Blicharski A, Kammler M, Schmidt WG, Horn-von Hoegen M.

Phys Rev Lett. 2012 Nov 2;109(18):186101. Epub 2012 Nov 2.

PMID:
23215299
8.

Manipulation of electronic transport in the Bi(111) surface state.

Jnawali G, Klein C, Wagner T, Hattab H, Zahl P, Acharya DP, Sutter P, Lorke A, Horn-von Hoegen M.

Phys Rev Lett. 2012 Jun 29;108(26):266804. Epub 2012 Jun 28.

PMID:
23005004
9.

Ultra-fast electron diffraction at surfaces: from nanoscale heat transport to driven phase transitions.

Hanisch-Blicharski A, Janzen A, Krenzer B, Wall S, Klasing F, Kalus A, Frigge T, Kammler M, Horn-von Hoegen M.

Ultramicroscopy. 2013 Apr;127:2-8. doi: 10.1016/j.ultramic.2012.07.017. Epub 2012 Jul 28.

PMID:
22975358
10.

Epitaxial Ag wires with a single grain boundary for electromigration.

Sindermann S, Witt C, Spoddig D, Horn-von Hoegen M, Dumpich G, Meyer zu Heringdorf FJ.

Rev Sci Instrum. 2011 Dec;82(12):123907. doi: 10.1063/1.3671802.

PMID:
22225231
11.

Interplay of wrinkles, strain, and lattice parameter in graphene on iridium.

Hattab H, N'Diaye AT, Wall D, Klein C, Jnawali G, Coraux J, Busse C, van Gastel R, Poelsema B, Michely T, zu Heringdorf FJ, Horn-von Hoegen M.

Nano Lett. 2012 Feb 8;12(2):678-82. doi: 10.1021/nl203530t. Epub 2012 Jan 9.

PMID:
22175792
12.

Lost in reciprocal space? Determination of the scattering condition in spot profile analysis low-energy electron diffraction.

Klein C, Nabbefeld T, Hattab H, Meyer D, Jnawali G, Kammler M, Meyer zu Heringdorf FJ, Golla-Franz A, Müller BH, Schmidt T, Henzler M, Horn-von Hoegen M.

Rev Sci Instrum. 2011 Mar;82(3):035111. doi: 10.1063/1.3554305.

PMID:
21456793
13.

Atomically smooth p-doped silicon nanowires catalyzed by aluminum at low temperature.

Moutanabbir O, Senz S, Scholz R, Alexe M, Kim Y, Pippel E, Wang Y, Wiethoff C, Nabbefeld T, Meyer zu Heringdorf F, Horn-von Hoegen M.

ACS Nano. 2011 Feb 22;5(2):1313-20. doi: 10.1021/nn1030274. Epub 2011 Jan 6.

PMID:
21210666
14.

The influence of anisotropic diffusion on Ag nanowire formation.

Wall D, Sindermann S, Roos KR, Horn-von Hoegen M, Meyer Zu Heringdorf FJ.

J Phys Condens Matter. 2009 Aug 5;21(31):314023. doi: 10.1088/0953-8984/21/31/314023. Epub 2009 Jul 7.

PMID:
21828584
15.

Space charge effects in photoemission electron microscopy using amplified femtosecond laser pulses.

Buckanie NM, Göhre J, Zhou P, von der Linde D, Horn-von Hoegen M, Meyer Zu Heringdorf FJ.

J Phys Condens Matter. 2009 Aug 5;21(31):314003. doi: 10.1088/0953-8984/21/31/314003. Epub 2009 Jul 7.

PMID:
21828564
16.

Electronic acceleration of atomic motions and disordering in bismuth.

Sciaini G, Harb M, Kruglik SG, Payer T, Hebeisen CT, zu Heringdorf FJ, Yamaguchi M, Horn-von Hoegen M, Ernstorfer R, Miller RJ.

Nature. 2009 Mar 5;458(7234):56-9. doi: 10.1038/nature07788.

PMID:
19262668
17.

Au stabilization and coverage of sawtooth facets on Si nanowires grown by vapor-liquid-solid epitaxy.

Wiethoff C, Ross FM, Copel M, Horn-von Hoegen M, Meyer Zu Heringdorf FJ.

Nano Lett. 2008 Sep;8(9):3065-8. doi: 10.1021/nl801146q. Epub 2008 Aug 19.

PMID:
18710295
18.

Domain sensitive contrast in photoelectron emission microscopy.

Thien D, Kury P, Horn-von Hoegen M, Meyer Zu Heringdorf FJ, van Heys J, Lindenblatt M, Pehlke E.

Phys Rev Lett. 2007 Nov 9;99(19):196102. Epub 2007 Nov 7.

PMID:
18233086
19.

Real-time view of mesoscopic surface diffusion.

Roos KR, Roos KL, Lohmar I, Wall D, Krug J, Horn-von Hoegen M, Meyer zu Heringdorf FJ.

Phys Rev Lett. 2008 Jan 11;100(1):016103. Epub 2008 Jan 8.

PMID:
18232789
20.

A pulsed electron gun for ultrafast electron diffraction at surfaces.

Janzen A, Krenzer B, Heinz O, Zhou P, Thien D, Hanisch A, Meyer Zu Heringdorf FJ, von der Linde D, Horn von Hoegen M.

Rev Sci Instrum. 2007 Jan;78(1):013906.

PMID:
17503932
21.

Ultrafast bond softening in bismuth: mapping a solid's interatomic potential with X-rays.

Fritz DM, Reis DA, Adams B, Akre RA, Arthur J, Blome C, Bucksbaum PH, Cavalieri AL, Engemann S, Fahy S, Falcone RW, Fuoss PH, Gaffney KJ, George MJ, Hajdu J, Hertlein MP, Hillyard PB, Horn-von Hoegen M, Kammler M, Kaspar J, Kienberger R, Krejcik P, Lee SH, Lindenberg AM, McFarland B, Meyer D, Montagne T, Murray ED, Nelson AJ, Nicoul M, Pahl R, Rudati J, Schlarb H, Siddons DP, Sokolowski-Tinten K, Tschentscher T, von der Linde D, Hastings JB.

Science. 2007 Feb 2;315(5812):633-6. Erratum in: Science. 2007 Feb 16;315(5814):940.

22.

Less strain energy despite fewer misfit dislocations: the impact of ordering.

Schmidt T, Kröger R, Flege JI, Clausen T, Falta J, Janzen A, Zahl P, Kury P, Kammler M, Horn-von Hoegen M.

Phys Rev Lett. 2006 Feb 17;96(6):066101. Epub 2006 Feb 13.

PMID:
16606012
23.

Dynamics of an Ising chain under local excitation: a scanning tunneling microscopy study of Si(100) dimer rows at 5 K.

Pennec Y, Horn von Hoegen M, Zhu X, Fortin DC, Freeman MR.

Phys Rev Lett. 2006 Jan 20;96(2):026102. Epub 2006 Jan 20.

PMID:
16486601
24.

Characterizing single crystal surfaces using high resolution electron diffraction.

Thien D, Meyer zu Heringdorf FJ, Kury P, Horn-von Hoegen M.

Anal Bioanal Chem. 2004 Jun;379(4):588-93. Epub 2004 Mar 3.

PMID:
14997266
25.

Direct observation of reconstruction induced changes of surface stress for Sb on Si(111).

Kury P, Zahl P, Horn-von Hoegen M.

Anal Bioanal Chem. 2004 Jun;379(4):582-7. Epub 2004 Jan 22.

PMID:
14740143
26.

Femtosecond X-ray measurement of coherent lattice vibrations near the Lindemann stability limit.

Sokolowski-Tinten K, Blome C, Blums J, Cavalleri A, Dietrich C, Tarasevitch A, Uschmann I, Förster E, Kammler M, Horn-von-Hoegen M, von der Linde D.

Nature. 2003 Mar 20;422(6929):287-9.

PMID:
12646915
27.

Femtosecond x-ray measurement of ultrafast melting and large acoustic transients.

Sokolowski-Tinten K, Blome C, Dietrich C, Tarasevitch A, Horn von Hoegen M, von der Linde D, Cavalleri A, Squier J, Kammler M.

Phys Rev Lett. 2001 Nov 26;87(22):225701. Epub 2001 Nov 7.

PMID:
11736408
28.

Spatial variation of au coverage as the driving force for nanoscopic pattern formation.

Meyer zu Heringdorf FJ, Schmidt T, Heun S, Hild R, Zahl P, Ressel B, Bauer E, Horn-von Hoegen M.

Phys Rev Lett. 2001 May 28;86(22):5088-91.

PMID:
11384428
29.

Anharmonic lattice dynamics in germanium measured with ultrafast x-ray diffraction.

Cavalleri A, Siders CW, Brown FL, Leitner DM, Tóth C, Squier JA, Barty CP, Wilson KR, Sokolowski-Tinten K, Horn Von Hoegen M, von der Linde D, Kammler M.

Phys Rev Lett. 2000 Jul 17;85(3):586-9.

PMID:
10991346
30.

Detection of nonthermal melting by ultrafast X-ray diffraction.

Siders CW, Cavalleri A, Sokolowski-Tinten K, Tóth C, Guo T, Kammler M, Horn von Hoegen M, Wilson KR, von der Linde D, Barty CP.

Science. 1999 Nov 12;286(5443):1340-2.

31.

Adsorbate induced change of equilibrium surface during crystal growth: Si on Si(111)/H.

Horn-von Hoegen M, Golla A.

Phys Rev Lett. 1996 Apr 15;76(16):2953-2956. No abstract available.

PMID:
10060833
32.

Reconstruction-dependent orientation of Ag(111) films on Si(001).

Fölsch S, Meyer G, Winau D, Rieder KH, Horn-von Hoegen M, Schmidt T, Henzler M.

Phys Rev B Condens Matter. 1995 Nov 15;52(19):13745-13748. No abstract available.

PMID:
9980579
33.

Lattice accommodation of low-index planes: Ag(111) on Si(001).

Horn-von Hoegen M, Schmidt T, Meyer G, Winau D, Rieder KH.

Phys Rev B Condens Matter. 1995 Oct 15;52(15):10764-10767. No abstract available.

PMID:
9980164
34.

Interface roughening of Ge delta layers on Si(111).

Falta J, Gog T, Materlik G, Müller BH, Horn-von Hoegen M.

Phys Rev B Condens Matter. 1995 Mar 15;51(12):7598-7602. No abstract available.

PMID:
9977342
35.

Strain relief by microroughness in surfactant-mediated growth of Ge on Si(001).

Horn-von Hoegen M, Müller BH, Al-Falou A.

Phys Rev B Condens Matter. 1994 Oct 15;50(16):11640-11652. No abstract available.

PMID:
9975297
36.

Surfactant-mediated growth of Ge on Si(111).

Horn-von Hoegen M, Copel M, Tsang JC, Reuter MC, Tromp RM.

Phys Rev B Condens Matter. 1994 Oct 15;50(15):10811-10822. No abstract available.

PMID:
9975182
37.

Surfactant-stabilized strained Ge cones on Si(001).

Horn-von Hoegen M, Al Falou A, Müller BH, Köhler U, Andersohn L, Dahlheimer B, Henzler M.

Phys Rev B Condens Matter. 1994 Jan 15;49(4):2637-2650. No abstract available.

PMID:
10011097
38.

Surfactant induced reversible changes of surface morphology.

Horn-von Hoegen M, Müller BH, Al-Falou A, Henzler M.

Phys Rev Lett. 1993 Nov 8;71(19):3170-3173. No abstract available.

PMID:
10054875
39.

Strain-relief mechanism in surfactant-grown epitaxial germanium films on Si(111).

LeGoues FK, Horn-Von Hoegen M, Copel M, Tromp RM.

Phys Rev B Condens Matter. 1991 Dec 15;44(23):12894-12902. No abstract available.

PMID:
9999469
40.

Defect self-annihilation in surfactant-mediated epitaxial growth.

Horn-von Hoegen M, LeGoues FK, Copel M, Reuter MC, Tromp RM.

Phys Rev Lett. 1991 Aug 26;67(9):1130-1133. No abstract available.

PMID:
10045083
41.

Influence of surfactants in Ge and Si epitaxy on Si(001).

Copel M, Reuter MC, Horn von Hoegen M, Tromp RM.

Phys Rev B Condens Matter. 1990 Dec 15;42(18):11682-11689. No abstract available.

PMID:
9995472

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