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Items: 27

1.

Chemistry for electron-induced nanofabrication.

Swiderek P, Marbach H, Hagen CW.

Beilstein J Nanotechnol. 2018 Apr 30;9:1317-1320. doi: 10.3762/bjnano.9.124. eCollection 2018. No abstract available.

2.

Origami lattices with free-form surface ornaments.

Janbaz S, Noordzij N, Widyaratih DS, Hagen CW, Fratila-Apachitei LE, Zadpoor AA.

Sci Adv. 2017 Nov 29;3(11):eaao1595. doi: 10.1126/sciadv.aao1595. eCollection 2017 Nov.

3.

Electron beam induced deposition of silacyclohexane and dichlorosilacyclohexane: the role of dissociative ionization and dissociative electron attachment in the deposition process.

P RKT, Hari S, Damodaran KK, Ingólfsson O, Hagen CW.

Beilstein J Nanotechnol. 2017 Nov 10;8:2376-2388. doi: 10.3762/bjnano.8.237. eCollection 2017.

4.

Electron transport and room temperature single-electron charging in 10 nm scale PtC nanostructures formed by electron beam induced deposition.

Durrani ZAK, Jones ME, Wang C, Scotuzzi M, Hagen CW.

Nanotechnology. 2017 Nov 24;28(47):474002. doi: 10.1088/1361-6528/aa9356.

PMID:
29027905
5.

Nanofabrication of a gold fiducial array on specimen support for electron tomography.

Koning RI, Kutchoukov VG, Hagen CW, Koster AJ.

Ultramicroscopy. 2013 Dec;135:99-104. doi: 10.1016/j.ultramic.2013.06.015. Epub 2013 Jul 16.

PMID:
23954496
6.

Focused electron beam induced processing and the effect of substrate thickness revisited.

van Dorp WF, Beyer A, Mainka M, Gölzhäuser A, Hansen TW, Wagner JB, Hagen CW, De Hosson JT.

Nanotechnology. 2013 Aug 30;24(34):345301. doi: 10.1088/0957-4484/24/34/345301. Epub 2013 Jul 30.

PMID:
23899908
7.

Simulation of ion imaging: sputtering, contrast, noise.

Castaldo V, Hagen CW, Kruit P.

Ultramicroscopy. 2011 Jul;111(8):982-94. doi: 10.1016/j.ultramic.2011.03.019. Epub 2011 Apr 6.

PMID:
21740861
8.

Ultrahigh resolution focused electron beam induced processing: the effect of substrate thickness.

van Dorp WF, Lazić I, Beyer A, Gölzhäuser A, Wagner JB, Hansen TW, Hagen CW.

Nanotechnology. 2011 Mar 18;22(11):115303. doi: 10.1088/0957-4484/22/11/115303. Epub 2011 Feb 8.

PMID:
21301081
9.

Design of an aberration corrected low-voltage SEM.

van Aken RH, Maas DJ, Hagen CW, Barth JE, Kruit P.

Ultramicroscopy. 2010 Oct;110(11):1411-9. doi: 10.1016/j.ultramic.2010.07.012. Epub 2010 Aug 4.

PMID:
20728276
10.

Creating pure nanostructures from electron-beam-induced deposition using purification techniques: a technology perspective.

Botman A, Mulders JJ, Hagen CW.

Nanotechnology. 2009 Sep 16;20(37):372001. doi: 10.1088/0957-4484/20/37/372001. Epub 2009 Aug 26. Review.

PMID:
19706953
11.

Resists for sub-20-nm electron beam lithography with a focus on HSQ: state of the art.

Grigorescu AE, Hagen CW.

Nanotechnology. 2009 Jul 22;20(29):292001. doi: 10.1088/0957-4484/20/29/292001. Epub 2009 Jul 1. Review.

PMID:
19567961
12.

Focused electron-beam-induced deposition of 3 nm dots in a scanning electron microscope.

van Kouwen L, Botman A, Hagen CW.

Nano Lett. 2009 May;9(5):2149-52. doi: 10.1021/nl900717r.

PMID:
19374377
13.

Growth behavior near the ultimate resolution of nanometer-scale focused electron beam-induced deposition.

van Dorp WF, Hagen CW, Crozier PA, Kruit P.

Nanotechnology. 2008 Jun 4;19(22):225305. doi: 10.1088/0957-4484/19/22/225305. Epub 2008 Apr 25.

PMID:
21825760
14.

Resolution limit for electron beam-induced deposition on thick substrates.

Hagen CW, Silvis-Cividjian N, Kruit P.

Scanning. 2006 Jul-Aug;28(4):204-11.

PMID:
16898667
15.
16.

Approaching the resolution limit of nanometer-scale electron beam-induced deposition.

van Dorp WF, van Someren B, Hagen CW, Kruit P, Crozier PA.

Nano Lett. 2005 Jul;5(7):1303-7.

PMID:
16178228
17.

Resolution limit for EBID on thick substrates.

Hagen CW, Silvis-Cividjian N, Kruit P.

Scanning. 2005 May-Jun;27(3):159. No abstract available.

PMID:
15934510
18.

Low-energy foil aberration corrector.

van Aken RH, Hagen CW, Barth JE, Kruit P.

Ultramicroscopy. 2002 Dec;93(3-4):321-30.

PMID:
12492241
19.

Hagen and Griessen reply.

Hagen CW, Griessen R.

Phys Rev Lett. 1990 Sep 3;65(10):1284. No abstract available.

PMID:
10042222
20.

Distribution of activation energies for thermally activated flux motion in high-Tc superconductors: An inversion scheme.

Hagen CW, Griessen R.

Phys Rev Lett. 1989 Jun 12;62(24):2857-2860. No abstract available.

PMID:
10040109
22.

Anthocyanin production in detached petals of impatiens balsamina L.

Klein AO, Hagen CW.

Plant Physiol. 1961 Jan;36(1):1-9. No abstract available.

24.

Chemical Aspects of the Inheritance of Flower Color in Impatiens Balsamina L.

Alston RE, Hagen CW.

Genetics. 1958 Jan;43(1):35-47. No abstract available.

25.

Relation of leuco-anthocyanins to anthocyanin synthesis.

ALSTON RE, HAGEN CW Jr.

Nature. 1955 Jun 4;175(4466):990. No abstract available.

PMID:
14394081
26.

Effects of total body X-irradiation on rats; lethal action of single, paired, and periodic doses.

HAGEN CW Jr, SIMMONS EL.

At Energy Biophys Biol Med. 1948 Aug;1(5):197. No abstract available.

PMID:
18878781
27.

Effects of single doses of x-rays on rabbits.

HAGEN CW, JACOBSON LO, et al.

At Energy Biophys Biol Med. 1948 Jul;1(4):149. No abstract available.

PMID:
18875063

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