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Items: 17

1.

Self-consistent atom probe tomography reconstructions utilizing electron microscopy.

Diercks DR, Gorman BP.

Ultramicroscopy. 2018 Dec;195:32-46. doi: 10.1016/j.ultramic.2018.08.019. Epub 2018 Aug 27.

PMID:
30179773
2.

Understanding crystallization pathways leading to manganese oxide polymorph formation.

Chen BR, Sun W, Kitchaev DA, Mangum JS, Thampy V, Garten LM, Ginley DS, Gorman BP, Stone KH, Ceder G, Toney MF, Schelhas LT.

Nat Commun. 2018 Jun 29;9(1):2553. doi: 10.1038/s41467-018-04917-y.

3.

Electron diffraction and imaging for atom probe tomography.

Kirchhofer R, Diercks DR, Gorman BP.

Rev Sci Instrum. 2018 May;89(5):053706. doi: 10.1063/1.4999484.

PMID:
29864799
4.

Theory-Guided Synthesis of a Metastable Lead-Free Piezoelectric Polymorph.

Garten LM, Dwaraknath S, Walker J, Mangum JS, Ndione PF, Park Y, Beaton DA, Gopalan V, Gorman BP, Schelhas LT, Toney MF, Trolier-McKinstry S, Persson KA, Ginley DS.

Adv Mater. 2018 Jun;30(25):e1800559. doi: 10.1002/adma.201800559. Epub 2018 May 10.

5.

p-type doping efficiency in CdTe: Influence of second phase formation.

McCoy JJ, Swain SK, Sieber JR, Diercks DR, Gorman BP, Lynn KG.

J Appl Phys. 2018 Apr;123(16). pii: 161579. doi: 10.1063/1.5002144. Epub 2018 Jan 1.

6.

Correlative Raman spectroscopy and focused ion beam for targeted phase boundary analysis of titania polymorphs.

Mangum JS, Chan LH, Schmidt U, Garten LM, Ginley DS, Gorman BP.

Ultramicroscopy. 2018 May;188:48-51. doi: 10.1016/j.ultramic.2018.02.007. Epub 2018 Feb 23.

PMID:
29549789
7.

High-fraction brookite films from amorphous precursors.

Haggerty JES, Schelhas LT, Kitchaev DA, Mangum JS, Garten LM, Sun W, Stone KH, Perkins JD, Toney MF, Ceder G, Ginley DS, Gorman BP, Tate J.

Sci Rep. 2017 Nov 9;7(1):15232. doi: 10.1038/s41598-017-15364-y.

8.

Junction Quality of SnO2-Based Perovskite Solar Cells Investigated by Nanometer-Scale Electrical Potential Profiling.

Xiao C, Wang C, Ke W, Gorman BP, Ye J, Jiang CS, Yan Y, Al-Jassim MM.

ACS Appl Mater Interfaces. 2017 Nov 8;9(44):38373-38380. doi: 10.1021/acsami.7b08582. Epub 2017 Oct 24.

PMID:
29027466
9.

Novel phase diagram behavior and materials design in heterostructural semiconductor alloys.

Holder AM, Siol S, Ndione PF, Peng H, Deml AM, Matthews BE, Schelhas LT, Toney MF, Gordon RG, Tumas W, Perkins JD, Ginley DS, Gorman BP, Tate J, Zakutayev A, Lany S.

Sci Adv. 2017 Jun 7;3(6):e1700270. doi: 10.1126/sciadv.1700270. eCollection 2017 Jun.

10.

Electron Beam-Induced Deposition for Atom Probe Tomography Specimen Capping Layers.

Diercks DR, Gorman BP, Mulders JJL.

Microsc Microanal. 2017 Apr;23(2):321-328. doi: 10.1017/S1431927616011740. Epub 2016 Oct 17.

PMID:
27748214
11.

Probing Grain-Boundary Chemistry and Electronic Structure in Proton-Conducting Oxides by Atom Probe Tomography.

Clark DR, Zhu H, Diercks DR, Ricote S, Kee RJ, Almansoori A, Gorman BP, O'Hayre RP.

Nano Lett. 2016 Nov 9;16(11):6924-6930. Epub 2016 Oct 5.

PMID:
27696864
12.

Effect of Diels-Alder Reaction in C60-Tetracene Photovoltaic Devices.

Proudian AP, Jaskot MB, Lyiza C, Diercks DR, Gorman BP, Zimmerman JD.

Nano Lett. 2016 Oct 12;16(10):6086-6091. Epub 2016 Sep 7.

PMID:
27575667
13.

Bandgap Tuning of Silicon Quantum Dots by Surface Functionalization with Conjugated Organic Groups.

Zhou T, Anderson RT, Li H, Bell J, Yang Y, Gorman BP, Pylypenko S, Lusk MT, Sellinger A.

Nano Lett. 2015 Jun 10;15(6):3657-63. doi: 10.1021/nl504051x. Epub 2015 May 18.

PMID:
25971956
14.

Exploring the limits of N-type ultra-shallow junction formation.

Polley CM, Clarke WR, Miwa JA, Scappucci G, Wells JW, Jaeger DL, Bischof MR, Reidy RF, Gorman BP, Simmons M.

ACS Nano. 2013 Jun 25;7(6):5499-505. doi: 10.1021/nn4016407. Epub 2013 May 30.

PMID:
23721101
15.

Stacking of 2D electron gases in Ge probed at the atomic level and its correlation to low-temperature magnetotransport.

Scappucci G, Klesse WM, Hamilton AR, Capellini G, Jaeger DL, Bischof MR, Reidy RF, Gorman BP, Simmons MY.

Nano Lett. 2012 Sep 12;12(9):4953-9. doi: 10.1021/nl302558b. Epub 2012 Sep 4.

PMID:
22935029
16.

Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography.

Schmucker SW, Kumar N, Abelson JR, Daly SR, Girolami GS, Bischof MR, Jaeger DL, Reidy RF, Gorman BP, Alexander J, Ballard JB, Randall JN, Lyding JW.

Nat Commun. 2012 Jul 3;3:935. doi: 10.1038/ncomms1907.

PMID:
22760634
17.

Atom probe analysis of III-V and Si-based semiconductor photovoltaic structures.

Gorman BP, Norman AG, Yan Y.

Microsc Microanal. 2007 Dec;13(6):493-502.

PMID:
18001514

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