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Items: 6

1.

Grain boundary character distribution of nanocrystalline Cu thin films using stereological analysis of transmission electron microscope orientation maps.

Darbal AD, Ganesh KJ, Liu X, Lee SB, Ledonne J, Sun T, Yao B, Warren AP, Rohrer GS, Rollett AD, Ferreira PJ, Coffey KR, Barmak K.

Microsc Microanal. 2013 Feb;19(1):111-9. doi: 10.1017/S1431927612014055.

PMID:
23380005
2.

Effect of downscaling nano-copper interconnects on the microstructure revealed by high resolution TEM-orientation-mapping.

Ganesh KJ, Darbal AD, Rajasekhara S, Rohrer GS, Barmak K, Ferreira PJ.

Nanotechnology. 2012 Apr 6;23(13):135702. doi: 10.1088/0957-4484/23/13/135702. Epub 2012 Mar 14.

PMID:
22418052
3.

Carbon-based supercapacitors produced by activation of graphene.

Zhu Y, Murali S, Stoller MD, Ganesh KJ, Cai W, Ferreira PJ, Pirkle A, Wallace RM, Cychosz KA, Thommes M, Su D, Stach EA, Ruoff RS.

Science. 2011 Jun 24;332(6037):1537-41. doi: 10.1126/science.1200770. Epub 2011 May 12.

4.

Controlled assembly of silane-based polymers: chemically robust thin-films.

Velamakanni A, Torres JR, Ganesh KJ, Ferreira PJ, Major JS.

Langmuir. 2010 Oct 5;26(19):15295-301. doi: 10.1021/la102004c.

PMID:
20822109
5.

D-stem: a parallel electron diffraction technique applied to nanomaterials.

Ganesh KJ, Kawasaki M, Zhou JP, Ferreira PJ.

Microsc Microanal. 2010 Oct;16(5):614-21. doi: 10.1017/S1431927610000334. Epub 2010 Aug 31.

PMID:
20804634
6.

Site-specific deposition of Au nanoparticles in CNT films by chemical bonding.

Velamakanni A, Magnuson CW, Ganesh KJ, Zhu Y, An J, Ferreira PJ, Ruoff RS.

ACS Nano. 2010 Jan 26;4(1):540-6. doi: 10.1021/nn901278t. Erratum in: ACS Nano. 2010 Aug 24;4(8):4962.

PMID:
20055476

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