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Items: 1 to 20 of 160

1.

Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components.

Duparré A, Ferre-Borrull J, Gliech S, Notni G, Steinert J, Bennett JM.

Appl Opt. 2002 Jan 1;41(1):154-71.

PMID:
11900432
2.

Effect of surface roughness and subsurface damage on grazing-incidence x-ray scattering and specular reflectance.

Lodha GS, Yamashita K, Kunieda H, Tawara Y, Yu J, Namba Y, Bennett JM.

Appl Opt. 1998 Aug 1;37(22):5239-52.

PMID:
18286003
3.
4.
5.

Power spectral density analysis and photoconducting behavior in copper(II) phthalocyanine nanostructured thin films.

Karan S, Mallik B.

Phys Chem Chem Phys. 2008 Dec 7;10(45):6751-61. doi: 10.1039/b809648a. Epub 2008 Sep 30.

PMID:
19015778
6.

Wavelength and angular dependence of light scattering from beryllium: comparison of theory and experiment.

Elson JM, Bennett JM, Stover JC.

Appl Opt. 1993 Jul 1;32(19):3362-76. doi: 10.1364/AO.32.003362.

PMID:
20829955
7.

Influence of dental rotary instruments on the roughness and wettability of human dentin surfaces.

Ayad MF, Johnston WM, Rosenstiel SF.

J Prosthet Dent. 2009 Aug;102(2):81-8. doi: 10.1016/S0022-3913(09)60114-1.

PMID:
19643221
8.

Power spectral density analysis of optical substrates for gravitational-wave interferometry.

Walsh CJ, Leistner AJ, Oreb BF.

Appl Opt. 1999 Aug 1;38(22):4790-801.

PMID:
18323968
9.

Light scatter from polysilicon and aluminum surfaces and comparison with surface-roughness statistics by atomic force microscopy.

Bawolek EJ, Mohr JB, Hirleman ED, Majumdar A.

Appl Opt. 1993 Jul 1;32(19):3377-400. doi: 10.1364/AO.32.003377.

PMID:
20829956
10.

Topographic measurements of precision-ground optical glasses.

Bennett JM, Namba Y, Guerra JM, Jahanmir J, Balter TL, Podlesny JC.

Appl Opt. 1997 Apr 1;36(10):2211-6.

PMID:
18253195
11.

The role of few-asperity contacts in adhesion.

Thoreson EJ, Martin J, Burnham NA.

J Colloid Interface Sci. 2006 Jun 1;298(1):94-101. Epub 2006 Jan 9.

PMID:
16376923
12.

Scanning white-light interferometry as a novel technique to quantify the surface roughness of micron-sized particles for inhalation.

Adi S, Adi H, Chan HK, Young PM, Traini D, Yang R, Yu A.

Langmuir. 2008 Oct 7;24(19):11307-12. doi: 10.1021/la8016062. Epub 2008 Aug 28.

PMID:
18759384
13.

Light scattering from glossy coatings on paper.

Lettieri TR, Marx E, Song JF, Vorburger TV.

Appl Opt. 1991 Oct 20;30(30):4439-47. doi: 10.1364/AO.30.004439.

PMID:
20717222
14.

White light scanning interferometry adapted for large-area optical analysis of thick and rough hydroxyapatite layers.

Pecheva E, Montgomery P, Montaner D, Pramatarova L.

Langmuir. 2007 Mar 27;23(7):3912-8. Epub 2007 Feb 13.

PMID:
17295521
15.

Residual surface roughness of diamond-turned optics.

Church EL, Zavada JM.

Appl Opt. 1975 Aug 1;14(8):1788-95. doi: 10.1364/AO.14.001788.

PMID:
20154921
16.

Looking at the micro-topography of polished and blasted Ti-based biomaterials using atomic force microscopy and contact angle goniometry.

Méndez-Vilas A, Donoso MG, González-Carrasco JL, González-Martín ML.

Colloids Surf B Biointerfaces. 2006 Oct 1;52(2):157-66. Epub 2006 May 12.

PMID:
16782313
17.

Roughness of excimer laser ablated corneas with and without smoothing measured with atomic force microscopy.

Lombardo M, De Santo MP, Lombardo G, Barberi R, Serrao S.

J Refract Surg. 2005 Sep-Oct;21(5):469-75.

PMID:
16209444
18.

Effects of polishing techniques on the surface roughness of acrylic denture base resins.

Kuhar M, Funduk N.

J Prosthet Dent. 2005 Jan;93(1):76-85.

PMID:
15624002
19.

Comparative study of the roughness of optical surfaces and thin films by use of X-ray scattering and atomic force microscopy.

Asadchikov VE, Duparré A, Jakobs S, Karabekov AY, Kozhevnikov IV, Krivonosov YS.

Appl Opt. 1999 Feb 1;38(4):684-91.

PMID:
18305664
20.

Evaluation of subsurface damage by light scattering techniques.

Trost M, Herffurth T, Schmitz D, Schröder S, Duparré A, Tünnermann A.

Appl Opt. 2013 Sep 10;52(26):6579-88. doi: 10.1364/AO.52.006579.

PMID:
24085136

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